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Title: | 使用外接空腔共振器與覆晶技術設計18.5 GHz CMOS壓控振盪器 Design of 18.5 GHz CMOS Voltage Controlled Oscillator Using Off-chip Cavity Resonator and Flip-chip Technology |
Authors: | Tzu-Ming Fang 方子銘 |
Advisor: | 盧信嘉(Hsin-Chia Lu) |
Keyword: | 壓控振盪器,低溫共燒陶瓷,共振器,覆晶,相位雜訊, VCO,LTCC,resonator,flip-chip,phase noise, |
Publication Year : | 2006 |
Degree: | 碩士 |
Abstract: | 隨著通訊系統的日益發展,高效能通訊電路的需求使得通訊電路面臨設計上和製程上的挑戰。本地振盪器正是通訊電路中一個重要的組成電路。在振盪器的數個主要特性之中,相位雜訊是一個很重要的效能評估。因為相位雜訊直接影響接收器的靈敏度和傳送器的訊號純度。所以,使用外接空腔共振器和覆晶技術來設計低相位雜訊的電壓控制振盪器將是本論文的重點。
本論文的章節安排如下。第一章主要為介紹背景、研究動機和一些文獻探討。第二章將說明電壓控制振盪器的基本理論和一些架構,被動元件的重要特性和相位雜訊也將會被討論。第三章將會先介紹空腔共振器和使用單埠量測品質因素的方法,接下來將會提出使用低溫共燒陶瓷所設計的空腔共振器和另一種使用覆晶技術所設計的空氣空腔共振器。第四章我們將以台灣積體電路製造公司CMOS 0.18 μm製程實現使用低溫共燒陶瓷空腔共振器的電壓控制振盪器和使用空氣空腔共振器的電壓控制振盪器。最後,我們會呈現電路模擬結果和量測方法。 The rapid growth of communication markets has motivated the development of high performance transceivers. The local oscillator (LO) is an important building block of the transceiver. Among the several key figures of oscillator, phase noise is the most important criterion in oscillator because it directly determines the sensitivity of the receiver and the purity of the transmitter. Thus, the thesis will focus on the design of low phase noise voltage controlled oscillator (VCO) using off-chip cavity resonator and flip-chip technology. The details of the thesis are organized as followed. In chapter 1, the background, research motivation and some literature review are introduced. In chapter 2, the basic principles of VCOs and several VCO architectures are illustrated. Also, the characteristics of some passive elements and phase noise will be discussed in this chapter. In chapter 3, we will introduce cavity resonator and one port reflection technique for Q measurement at first. Next, low-temperature co-fired ceramic (LTCC) cavity resonator and air cavity resonator will be proposed and flip-chip technology will be introduced. In chapter 4, two VCOs using LTCC cavity resonator and air cavity resonator are realized in TSMC CMOS 0.18 μm technology. Finally, the simulation result and measurement setup will be presented. |
URI: | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/31971 |
Fulltext Rights: | 有償授權 |
Appears in Collections: | 電子工程學研究所 |
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File | Size | Format | |
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ntu-95-1.pdf Restricted Access | 2.38 MB | Adobe PDF |
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