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標題: | 一個具有單粒子事件加固比較器與數位電路之設計與實作 Design and Implementation of a Single Event Effects Hardening Comparator and Digital Circuit |
作者: | 陳昱霖 Yu-Lin Chen |
指導教授: | 陳信樹 Hsin-Shu Chen |
關鍵字: | 比較器,數位電路,電阻加固,三倍冗餘模組,單次事件翻轉,脈衝雷射, Comparator,Digital circuit,Radiation tolerance,Resistor hardening,Triple modular redundancy,Single event upset,Pulse laser, |
出版年 : | 2022 |
學位: | 碩士 |
摘要: | 隨著通訊科技演進,低軌道衛星通訊蓬勃發展,然而低軌道衛星需要低成本、低功耗、小體積並且需要在外太空惡劣的輻射環境下還能正常運作。在傳統積體電路設計中,並未考量輻射效應對於積體電路的影響,所以如何設計具有抗輻射干擾的晶片,用於衛星通訊中是一大挑戰。 類比數位轉換器在電子系統中扮演極重要的角色,它是自然界類比信號與數位信號中間的橋梁,在通訊系統中也扮演很重要的角色。在各種不同的架構中,連續漸進式式類比數位轉換器為廣泛應用的其中一種,而比較器為其中最重要的一個部分,此外連續漸進式式類比數位轉換器大部分都是數位電路,因此,比較器和數位電路如何達到具有輻射加固或是輻射容忍,是一項值得研究的題目。本論文提出一個具有電阻加固比較器以及使用三倍冗餘模組架構,來達到輻射容忍,工作電壓為1.4伏特,在短脈衝雷射的測試下,所提出電阻加固比較器以及使用三倍冗餘模組架構沒有觀察到錯誤發生;傳統的比較器,在脈衝雷射測試下,出現單次事件翻轉,經過統計錯誤率為0.0017,脈衝雷射功率為98.9毫瓦。因此,所提出電阻加固比較器與傳統的比較器相比更為堅固。 With the evolution of communication technology, low-orbit satellite communications have flourished. However, low-orbit satellites require low cost, low power consumption, small size, and they need to operate normally in the harsh radiation environment of outer space. In the traditional integrated circuit design, the influence of radiation on the integrated circuit is not considered, so designing a chip with radiation tolerance for satellite communication is a big challenge. Analog-to-digital converters (ADCs) play a vital role in electronic systems. They bridge analog and digital signals and play a critical role in communication systems. Among various architectures, the successive approximation registers analog-to-digital converter (SAR ADC) is one of the widely used ones, and the comparator is one of the essential parts. In addition, most of the advanced ADCs are digital circuits, so achieving radiation hardening or radiation tolerance of comparators and digital circuits is a topic worthy of study. This thesis proposes a resistor hardening comparator and uses a triple modular redundancy (TMR) architecture to achieve radiation tolerance with an operating voltage of 1.4 volts. Under the test of pulse laser, the proposed resistor hardening comparator, and the use of TMR, do not observe the errors. Under the pulse laser testing, the traditional comparator has a single event upset (SEU). The statistical error rate is 0.0017, and the pulse laser power is 98.9mW. Therefore, the proposed resistor hardening comparator is more robust than conventional comparators. |
URI: | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/84012 |
DOI: | 10.6342/NTU202200736 |
全文授權: | 未授權 |
顯示於系所單位: | 電子工程學研究所 |
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