釋氟貼片對人類牙釉質表面產物之定性以及定量分析

Abstract

本實驗為提升牙科臨床塗氟效果，自製釋氟貼片，並使用X 射線 光電子能譜儀、二次離子質譜儀、電子掃描顯微鏡分析釋氟貼片貼附 不同時間後對牙釉質表面帶來的影響，對其產物做定性與定量分析。 此外， 配合離子層析儀分析，以了解釋氟貼片能否幫助牙釉質抵抗 去礦化環境，並增強再礦化能力，對臨床有實質幫助。 經由X 射線光電子能譜儀，二次離子質譜儀，以及離子層析儀的 分析，本實驗發現約經過8 小時的釋氟貼片貼附後，牙釉質表面的氟 濃度可達飽和，在最表面形成的產物為氟化鈣 CaF2。氟膠塗佈24 小 時後，影響深度在健全牙釉值約為7.2μm，而在經過去礦化程序的牙 釉質較深，約為17.6μm。經過釋氟貼片處理過後的牙釉質其抑制酸 性環境去礦化作用的能力隨著釋氟貼片貼附時間的增加有顯著提升， 成正向關係; 釋氟貼片也能增加牙釉質再礦化的能力，但效果和貼片 貼附時間並無明顯關係。

Objectives: The aim of this study was to develop a fluoride releasing strip for dental clinicians to increase the effectiveness of topical fluoridation. Moreover, this study tried to establish a molecular- based model to analyze the product on teeth enamel after fluoridation. Methods: This multi method study used XPS, SIMS, SEM measurements in order to analyze qualitative and quantitative change of teeth enamel after use of fluoride releasing strip. And used Ion Chromatography to determine demineralization/ remineralization rate change of enamel after fluoride strip fluoridation. Results: The reaction reached saturation point after 8 hours use of strip. The main product was calcium fluoride. Fluoride strip effect deeper on enamel samples witch pretreated with demineralization solution then sound enamel samples. Using XPS depth profile survey, we found that the depth of fluoride infiltration is about 7.2μm on sound enamel sample and 17.6μm in demineralized enamel sample. It seems that topical fluoridation inhibited enamel demineralization more effectively then increased enamel remineralization. Key Word: topical fluoride, dental enamel, surface