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http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/19317完整後設資料紀錄
| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 廖洺漢(Ming-Han Liao) | |
| dc.contributor.author | Hsiang-Pu Ni | en |
| dc.contributor.author | 倪祥圃 | zh_TW |
| dc.date.accessioned | 2021-06-08T01:53:26Z | - |
| dc.date.copyright | 2016-08-03 | |
| dc.date.issued | 2016 | |
| dc.date.submitted | 2016-07-19 | |
| dc.identifier.citation | [1] Chang-Yi Liu, “Development of Bismuth Telluride Alloy Thin Film Thermoelectric Devices”, Department of Mechanical Engineering College of Engineering National Taiwan University(2015)
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| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/19317 | - |
| dc.description.abstract | 本論文為了辨別熱電材料的好壞以選用最佳的熱電材料(thermoelectric material)和進一步量測實驗室所做出熱電元件的效率積極探討如何量測熱電優值ZT值，ZT值與席貝克係數(Seebeck coefficient)、導電率(electric conductivity)、熱傳導係數(thermal conductivity)、溫度(temperature)等等參數相關，為評斷熱電材料好壞的一個重要依據，目前實驗室已經可以使用直流電源供應器(DC power supply)與Agilent 34972A 機台量測出席貝克係數(Seebeck coefficient)等等重要參數，所缺少的熱傳導率k 值正參考Maciej Haras 等人[90]的量測手法積極量測中，使用實驗室目前所擁有的真空濺鍍機(sputter)、曝光機(exposing machine)、顯微鏡(microscope)、光阻塗佈機(photoresist spinner)、光罩(mask)、烤盤(hot plate)、E-gun等等半導體先進設備以及新竹國家奈米實驗室(NAR Labs)的先進技術設備支援利用先進半導體製程製作出量測所需的懸空樑結構元件，在合適的環境條件下進行精密量測，預計不久後能夠讓實驗室擁有獨立自主量測熱電優值ZT值的能力與方法。 | zh_TW |
| dc.description.provenance | Made available in DSpace on 2021-06-08T01:53:26Z (GMT). No. of bitstreams: 1 ntu-105-R03522623-1.pdf: 5946062 bytes, checksum: 1c102fddc610785090c80fa25e2f14b1 (MD5) Previous issue date: 2016 | en |
| dc.description.tableofcontents | 口試委員審定書 i
致謝 ii 中文摘要 iii ABSTRACT iv 總目錄 v 圖目錄 vii 表目錄 ix 第一章 緒論 1 1.1 前言 1 1.2 研究背景與動機 2 第二章 文獻回顧與理論基礎 3 2.1 熱電原理 3 2.1.1 Seebeck效應 3 2.1.2 Peltier效應 5 2.1.3 Thomson效應 7 2.2 熱電優值(Figure of Merit) 8 2.2.1 Seebeck係數和導電率之間的矛盾 10 2.2.2 熱傳導係數與導電率之間的矛盾 11 2.3 熱電轉換效率 12 2.3.1 熱電發元件(Thermoelectric generator) 13 2.3.2 熱電致冷元件(Thermoelectric Cooler) 14 2.4 熱電發展與現況 16 2.4.1 熱電歷史 16 2.4.2 1996年~2011年熱電材料的發展 18 2.4.3 近年熱電材料發展 26 2.4.4 熱傳導係數k值量測方法發展 28 第三章 實驗方法與步驟 33 第四章 實驗結果與討論 62 REFERENCES 63 | |
| dc.language.iso | zh-TW | |
| dc.title | 熱電優值 ZT 量測方法之研究與實作 | zh_TW |
| dc.title | Investigation and Implementation of
Measurement Method about Figure of Merit ZT | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 104-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 陳旻政(MIN-CHENG CHEN),李愷信(Kai-Shin Li),李敏鴻(Min-Hung Lee) | |
| dc.subject.keyword | 熱電優值,ZT,熱傳導係數k, | zh_TW |
| dc.subject.keyword | Figure of merit ZT,Thermal conductivity k, | en |
| dc.relation.page | 75 | |
| dc.identifier.doi | 10.6342/NTU201601043 | |
| dc.rights.note | 未授權 | |
| dc.date.accepted | 2016-07-19 | |
| dc.contributor.author-college | 工學院 | zh_TW |
| dc.contributor.author-dept | 機械工程學研究所 | zh_TW |
| 顯示於系所單位： | 機械工程學系 | |
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