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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 陳士元 | zh_TW |
| dc.contributor.advisor | Shih-Yuan Chen | en |
| dc.contributor.author | 陳士允 | zh_TW |
| dc.contributor.author | Shih-Yun Chen | en |
| dc.date.accessioned | 2024-07-30T16:08:32Z | - |
| dc.date.available | 2024-10-10 | - |
| dc.date.copyright | 2024-07-30 | - |
| dc.date.issued | 2024 | - |
| dc.date.submitted | 2024-07-26 | - |
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Williams, "On-wafer vector-network-analyzer measurements at mK temperatures," IEEE Journal of Microwaves, vol. 3, no. 2, pp. 587-598, 2023, doi: 10.1109/jmw.2022.3232076. [108] P. Bryndza, "VNA measurement calibration in cryogenic environment," 2022 24th International Microwave and Radar Conference (MIKON), Gdansk, Poland, 2022, pp. 1-6, doi: 10.23919/mikon54314.2022.9924695. | - |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/93363 | - |
| dc.description.abstract | 量子計算被視為是顛覆人類生活與科技的重要技術之一。除了核心的量子元件，其用於控制和讀取量子位元之傳統半導體積體電路也是量子計算系統發展中不可或缺的基石。本論文中，我們將探究射頻/微波技術在數個與量子計算相關的應用。
本論文的第一部分聚焦於設計並實現一應用於固態自旋量子位元讀取系統中之低溫互補式金屬氧化物半導體低雜訊放大器。此次設計提出之創新電路架構，有效緩解在傳統雜訊消除技術中各參數間之拮抗，實現了在增益、雜訊指數、頻寬和功耗方面的綜合性高性能指標。 論文的第二部分則著墨於低溫樣品測量系統之建立，開發、設計與測試樣品量測載板套件，並討論了多種低溫微波量測相關之應用與其所需之考量。為了在低溫環境中進行微波量測與校正，我們規劃並開發了與樣品載板套件相容之校正系統。作為校正系統中的重要元件之一，我們透過提出的系統化設計程序，並應用LC梯形低通濾波器理論，實現了一顆低溫寬頻單極四擲（SP4T）切換器。在將此固態切換器與校正量測載板整合後，我們驗證了此校正與量測系統之效能，並顯示其可有效提升在極低溫量測設備中之校正準確度，能為未來相關之量子元件提供更可靠的微波測量環境，加速量子計算領域之發展。 | zh_TW |
| dc.description.abstract | Quantum computing has recently become one of the most captivating keywords in the field of science and technology. In addition to the core quantum devices, control and readout circuitries developed based on conventional solid-state and electronic technologies are also indispensable cornerstones in system integration and scaling up. In this thesis, we explored and investigated the application of RF/microwave technologies in several quantum computing-related areas.
The first part of this thesis focuses on a cryo-CMOS low-noise amplifier designed specifically for use in readout circuitries for solid-state spin qubit systems. A novel topology is proposed to alleviate the trade-offs in the noise-canceling technique, achieving a superior figure of merit in terms of gain, noise figure, bandwidth, and power consumption. In the establishment of a cryogenic measurement system based on a dilution fridge, a prototype of sample holder kits is presented. Various considerations regarding several different applications are discussed. For performing calibration in a cryogenic environment, we designed a calibration system integrated with the sample holder kits. A cryogenic broadband single-pole-four-throw (SP4T) switch is developed with a proposed systematic design procedure utilizing LC-ladder low-pass filter theory. The implemented calibration system, incorporating the solid-state switch, achieves enhanced calibration accuracy within cryogenic microwave measurements, paving the way for advanced research in quantum-computing-relevant microwave devices. | en |
| dc.description.provenance | Submitted by admin ntu (admin@lib.ntu.edu.tw) on 2024-07-30T16:08:32Z No. of bitstreams: 0 | en |
| dc.description.provenance | Made available in DSpace on 2024-07-30T16:08:32Z (GMT). No. of bitstreams: 0 | en |
| dc.description.tableofcontents | 口試委員會審定書 ii
致謝 iii 中文摘要 v ABSTRACT vi CONTENTS vii LIST OF FIGURES x LIST OF TABLES xvii Chapter 1 Introduction 1 Chapter 2 A Cryo-CMOS LNA for Spin Qubit Reflectometry Readout Applications 6 2.1 Introduction 6 2.1.1 Literature Review of CMOS Noise Canceling LNAs in VHF and UHF Bands 6 2.1.2 Design Considerations for Cryogenic Operation 10 2.1.3 Literature Review of Cryogenic LNAs 14 2.2 Circuit Design 17 2.2.1 Single Inverter Design 21 2.2.2 Inverter Pair and Mutual Noise-Canceling 28 2.2.3 Input Stage Design 35 2.2.4 Combining Stage 37 2.2.5 Output Driver 38 2.2.6 On-Chip Bypass Networks and Circuit Stability 41 2.3 Experimental Results 43 2.4 Summary 49 Chapter 3 Design of a Broadband SP4T Switch for Cryogenic Measurement and Calibration 51 3.1 Introduction 51 3.1.1 Literature Review of Broadband RF Switches 51 3.1.2 Literature Review of Cryogenic RF Switches 54 3.2 Circuit Design 55 3.2.1 Transistor Configuration 55 3.2.2 Circuit Schematics 57 3.2.3 Design Procedure 57 3.2.3.1 RHS Output Series-First LC LPF 58 3.2.3.2 Series Transistors 62 3.2.3.3 LHS Input Shunt-First LC LPF 64 3.3 Experimental Results 65 3.3.1 Room Temperature Measurement Results 66 3.3.2 4 K Temperature Measurement Results 68 3.4 Summary 70 Chapter 4 Sample Holder Design and RF Characterization within Dilution Fridge 73 4.1 Introduction 73 4.2 Design of First-Phase Testing Boards 75 4.2.1 Material Selection 75 4.2.2 Considerations of Testing Scenarios 78 4.2.3 RF Routing Design 84 4.2.4 Wire Bonding Issues 90 4.3 RF Characterization within Sample Puck 94 4.3.1 Raw Data Measurement 94 4.3.2 TRL Calibration at Room Temperature 101 4.4 RF Characterization within Dilution Fridge 108 4.5 Summary 120 Chapter 5 S-parameter Calibration in mK System 122 5.1 Introduction 122 5.2 Design of Second-Phase Testing Boards 125 5.2.1 Multiple Board Structure 125 5.2.2 Sample Holder Design for Superconducting Devices 128 5.2.3 Calibration Scheme Proposal 136 5.3 Room Temperature Validation Results 141 5.4 Summary 151 Chapter 6 Conclusion 153 6.1 Summary 153 6.2 Future Work 154 References 156 | - |
| dc.language.iso | en | - |
| dc.title | 應用於量子計算之低溫微波電路及量測系統 | zh_TW |
| dc.title | Cryogenic Microwave Electronics and Measurement Systems for Quantum Computing Applications | en |
| dc.type | Thesis | - |
| dc.date.schoolyear | 112-2 | - |
| dc.description.degree | 碩士 | - |
| dc.contributor.oralexamcommittee | 林坤佑;李峻霣;梁啟德 | zh_TW |
| dc.contributor.oralexamcommittee | Kun-You Lin;Jiun-Yun Li;Chi-Te Liang | en |
| dc.subject.keyword | 低溫互補式金屬氧化物半導體低雜訊放大器,低溫射頻切換器,低溫微波量測系統,低溫S參數校正技術, | zh_TW |
| dc.subject.keyword | cryo-CMOS low noise amplifiers (LNAs),cryogenic RF switches,cryogenic microwave measurement,cryogenic S-parameter calibration, | en |
| dc.relation.page | 171 | - |
| dc.identifier.doi | 10.6342/NTU202402277 | - |
| dc.rights.note | 同意授權(全球公開) | - |
| dc.date.accepted | 2024-07-29 | - |
| dc.contributor.author-college | 電機資訊學院 | - |
| dc.contributor.author-dept | 電信工程學研究所 | - |
| 顯示於系所單位： | 電信工程學研究所 | |
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