使用TRL校準方法進行單一轉接量測

Abstract

本論文主要分為兩個部分，第一部為介紹廣義TRL並推導廣義TRL在單一模態情況下式子，利用T與L電路的特徵值矩陣及R的校準器計算出待測物與誤差盒子的轉移矩陣且正確的判斷待測物轉移矩陣與誤差盒子轉移矩陣的正負號的問題，並利用不對稱的誤差盒子TRL電路情況下驗證演算法的準確性。第二部分設計出GCPW的穿層轉接電路與end launch轉接頭電路，使用廣義TRL演算法求出單一轉接端電路特性並與模擬結果做比較，得到不錯的結果。

This thesis is divided into two parts. The first part of this thesis introduces the generalized TRL and deduces the generalized TRL to the case of single mode propagation. The eigenvalue matrix of the T and L circuits and R calibrator are used to calculate the transfer matrices of the DUT and the error boxes. We can correctly determine the sign of the DUT and the error box transfer matrices. We also verify the accuracy of the algorithm by using asymmetric error boxes in TRL circuit. In the second part of this thesis, we use the GCPW through-layer transition and the end launch connector as a single transition. Then we use the developed algorithm to extract of S-matrix of a single transition and compared with simulation. Good agreement is obtained.