IEEE 1500標準測試封套產生和驗證及功率預估自動化工具之實現

Abstract

本論文實作了可以將核心電路自動包覆IEEE 1500標準封套與自動驗證之測試樣板產生器。透過此工具自動產生之測試樣板可支援單一測試圖樣(one-pattern test)與雙測試圖樣(two-pattern test)兩種測試方式，並提供了位移與強迫等測試圖樣輸入方式。在雙測試圖樣測試方面，我們提出了一種雙暫存器封套單元設計以及相對的測試程序，WBRTest。透過此測試程序，可使封套達成100%之錯誤涵蓋率。我們也對前版之封套編譯器作了相關之修正。除了驗證之外，自動化產生的測試樣板也能估算核心在不同測試模式測試圖樣輸入方式以及封套單元設計之下之模擬功率消耗。

In this thesis, an automatic testbench generator for testing IEEE 1500 wrapped cores is implemented. The generated testbench is flexible for testing wrapped cores in either one-pattern or two-pattern test applications. A two-register wrapper cell is also proposed for two-pattern test. Corresponding test sequence, WBRTest, guarantees 100% fault coverage for wrapper cells. Modification of original wrapper compiler is completed for the dedicated wrapper cell architecture and test sequence. Additional function of the testbench generator to calculate power consumption of a wrapped core is also added.