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  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 光電工程學研究所
請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/104491
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dc.contributor.advisor黃建璋zh_TW
dc.contributor.advisorJian-Jang Huangen
dc.contributor.author袁紓涵zh_TW
dc.contributor.authorSHU-HAN YUANen
dc.date.accessioned2026-08-26T16:54:54Z-
dc.date.available2026-08-27-
dc.date.copyright2026-08-26-
dc.date.issued2026-
dc.date.submitted2026-08-13 20:51:22-
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[28] Y.-C. Wang, C.-J. Yu, and J.-J. Huang, "Efficiency improvement of AlGaInP-based red micron-scale light-emitting diodes using sidewall steam oxidation," Discover Nano, vol. 20, no. 1, p. 57, 2025.
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[52] K. A. Bulashevich and S. Y. Karpov, "Impact of surface recombination on efficiency of III‐nitride light‐emitting diodes," physica status solidi (RRL)–Rapid Research Letters, vol. 10, no. 6, pp. 480-484, 2016.
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dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/104491-
dc.description.abstract本論文研究了側壁蒸汽氧化對不同尺寸(100 × 100 μm2 到 5 × 5 μm2)的 AlGaInP 紅光微型發光二極體之性能影響。透過室溫與低溫變溫量測,我們證實了適當的側壁氧化能同時優化光萃取效率(LEE)與內部量子效率(IQE),並有效抑制非輻射複合。針對氧化所引起的效應,本研究修正了 ABC 模型中的載子密度(n),並利用差分進化演算法更精準的提取出複合係數,成功實現了僅 11,061 cm/s 的極低表面複合速度。此外,變溫分析更進一步說明了低溫下的載子複合機制。這些研究成果可作為未來高解析度AlGaInP µLED顯示器製程優化之參考依據。zh_TW
dc.description.abstractThis thesis investigates the influence of sidewall steam oxidation on the performance of AlGaInP red micro-light-emitting diodes (μLEDs) with varying sizes ranging from 100 × 100 μm2 to 5 × 5 μm2. Through characterizations conducted under both room and cryogenic temperatures, we demonstrate that appropriate sidewall oxidation effectively upgrades both light extraction efficiency (LEE) and internal quantum efficiency (IQE) while successfully suppressing non-radiative recombination. Accounting for the effects induced by oxidation, this work critically rectifies the carrier density (n) within the ABC modeling framework. By employing a Differential Evolution algorithm, the recombination coefficients were precisely extracted, achieving a record-low surface recombination velocity (vs) of 11,061 cm/s. Furthermore, temperature-dependent analysis further elucidates the carrier recombination mechanisms at low temperatures. These findings serve as an important basis for process optimization in future high-resolution AlGaInP μLED displays.en
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dc.description.tableofcontents致謝 II
中文摘要 III
英文摘要 IV
CONTENTS V
LIST OF FIGURES VII
LIST OF TABLE X
Chapter 1 Introduction 1
1.1 Overview of micro-LED technology 1
1.2 Research motivation 2
1.3 Thesis outline 5
Chapter 2 Wet Oxidation Treatment of Red Micro-LEDs 7
2.1 Introduction to wet oxidation 7
2.1.1 Background of wet oxidation 7
2.1.2 Setup of sidewall oxidation 9
2.2 Fabrication of micro-LEDs with sidewall oxidation 10
2.2.1 Process flow of red micro-LEDs 10
2.2.2 Photolithography 14
2.2.3 Wet etching 15
2.2.4 Metal evaporation 16
Chapter 3 ABC Modeling and Parameter Extraction 18
3.1 Extraction of internal quantum efficiency and light extraction efficiency 18
3.2 Determination of recombination parameters using DE algorithm 20
3.3 Effective active area correction 22
Chapter 4 Results and Discussion at Room Temperature 24
4.1 Electrical and Optical Characteristics 24
4.2 Analysis of IQE and LEE 32
4.3 Analysis of recombination coefficients 35
Chapter 5 Temperature-Dependent Characteristics 42
5.1 Impact of cryogenic temperature on EQE 42
5.2 Temperature dependence of recombination coefficients 47
Chapter 6 Conclusion 54
Reference 56
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dc.language.isoen-
dc.subjectABC模型-
dc.subject側壁氧化-
dc.subject磷化鋁銦鎵-
dc.subject紅光微發光二極體-
dc.subject表面複合速度-
dc.subjectABC model-
dc.subjectSidewall Oxidation-
dc.subjectAlGaInP-
dc.subjectRed micro-LED-
dc.subjectSurface Recombination Velocity-
dc.titleAlGaInP紅光µLED透過側壁水蒸氣氧化緩解尺寸相關的效率衰退行為之分析zh_TW
dc.titleCharacterization of Size-Dependent Efficiency Loss Mitigation in AlGaInP Red Micro-LEDs via Sidewall Steam Oxidationen
dc.typeThesis-
dc.date.schoolyear114-2-
dc.description.degree碩士-
dc.contributor.oralexamcommittee賴韋志;吳肇欣;洪瑞華zh_TW
dc.contributor.oralexamcommitteeWei-Chih Lai;Chao-Hsin Wu;Ray-Hua Horngen
dc.subject.keywordABC模型; 側壁氧化; 磷化鋁銦鎵; 紅光微發光二極體; 表面複合速度zh_TW
dc.subject.keywordABC model; Sidewall Oxidation; AlGaInP; Red micro-LED; Surface Recombination Velocityen
dc.relation.page60-
dc.identifier.doi10.6342/NTU202604115-
dc.rights.note同意授權(全球公開)-
dc.date.accepted2026-08-18-
dc.contributor.author-college電機資訊學院-
dc.contributor.author-dept光電工程學研究所-
dc.date.embargo-lift2026-08-27-
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