Browsing by Author Min-Hsin Liu
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| Publication Year | Title | Author(s) | Department |
|---|---|---|---|
| 2025 | 於邏輯掃描測試培養中除錯及預防異常高的最小工作電壓 Debugging and Preventing Abnormally High Vmin during Logic Scan Test Bring-up | 劉旻鑫; Min-Hsin Liu | 電子工程學研究所 |