qATG:量子電路測試產生技術

Abstract

現在的研究人員使用隨機基準或量子量在實驗室中測試量子電路，但是這些測試方式很耗時且無法確定錯誤涵蓋率，在這篇論文中我們基於量子閘的功能提出了行為錯誤模型，因為這些錯誤模型的錯誤數量與量子電路的關係式是多項式而不是指數，所以這些錯誤模型是可應用於大型電路的，此外我們提出了一種新穎的量子電路測試生成方式，這種方式使用梯度下降法來產生較短的測試組態，我們還修改了卡方統計方法，以確定在指定的測試遺漏及誤宰下所需要的重複測試次數，在IBM Q系統上的實驗結果證明我們生成的測試組態是有效的，且我們的測試長度比起傳統測試方法短了1000多倍。

Researchers now use randomized benchmarking or quantum volume to test quantum circuits (QC) in the laboratory. However, these tests are long and their fault coverage is unclear. In this thesis, we propose behavior fault models based on the function of quantum gates. These fault models are scalable because the number of faults is polynomial, not exponential, to the size of QC. We propose a novel test generation that uses gradient descent to generate test configuration with short length. We revise the chi-square statistical method to decide the number of test repetitions under the specified test escape and overkill. Experimental results on IBM Q systems show that our generated test configurations are effective, and our test lengths are 1,000X shorter than traditional test methods.