短脈衝背面雷射驗證平台開發與 FPGA BRAM 錯誤率量化分析

Abstract

本研究建立了一個短脈衝背面雷射驗證平台，用於分析雷射照射下現場可程 式化邏輯閘陣列(FPGA, Field Programmable Gate Array)中區塊式隨機存取記憶 體(BRAM, Block Random-Access Memory)錯誤率與相關參數之間的關係。該平 台包含三大核心模組:光學模組、移動平台模組和相機模組。光學模組主要提供 精確的雷射源，並將雷射光束準確引導至待測物(DUT, Device Under Test)，以 激發單事件效應(SEE, Single Event Effect);相機模組則能即時監測待測物的影 像和照射位置，確保照射過程的準確性;移動平台模組支援待測物的高精度移動 與掃描功能，實現對多區域的全面測試。這些模組經過整合後，形成了一個高效 且可靠的雷射輻射效應測試系統，可精確模擬並分析輻射對電路的影響。 研究中以 FPGA 作為測試對象，透過多次雷射實驗，詳細探討了雷射能量、 掃描次數等測試參數與 BRAM 錯誤率之間的相關性。結果顯示，雷射平台不僅 具有穩定的測試能力，還能揭示 FPGA 記憶體在不同輻射條件下的行為特徵。本 研究的成果為抗輻射電子元件的設計與優化提供了重要的實驗依據和理論參考， 有助於未來電子元件在輻射環境下的可靠性與穩定性提升，同時為相關測試技術 的發展奠定了基礎。

This study establishes a short-pulse backside laser verification platform to analyze the relationship between error rates and related parameters in the Block Random-Access Memory (BRAM) of Field Programmable Gate Arrays (FPGA). The platform consists of three core modules: the optical module, motion platform module, and camera module. The optical module provides a precise laser source and directs the laser beam to the Device Under Test (DUT) to induce Single Event Effects (SEE). The camera module monitors the DUT’s images and irradiation position in real-time, ensuring accuracy during the process. The motion platform module enables precise movement and scanning of the DUT for comprehensive multi-region testing. These integrated modules form an efficient and reliable system for testing laser-induced radiation effects, simulating and analyzing radiation impact on circuits. Using FPGA as the test object, multiple laser experiments systematically investigated the correlation between test parameters, such as laser energy and scanning frequency, and BRAM error rates. The results demonstrate that the laser platform provides stable testing capabilities and reveals FPGA memory behavior under various radiation conditions. This study offers experimental evidence and theoretical references for designing and optimizing radiation-tolerant electronic components, contributing to enhanced reliability and stability of electronic devices in radiation environments and advancing related testing technologies.