請用此 Handle URI 來引用此文件：
http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/96150完整後設資料紀錄
| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 謝馬利歐 | zh_TW |
| dc.contributor.advisor | Mario Hofmann | en |
| dc.contributor.author | 周家榮 | zh_TW |
| dc.contributor.author | Ian Daniell Santos | en |
| dc.date.accessioned | 2024-11-15T16:11:09Z | - |
| dc.date.available | 2024-11-16 | - |
| dc.date.copyright | 2024-11-15 | - |
| dc.date.issued | 2024 | - |
| dc.date.submitted | 2024-10-24 | - |
| dc.identifier.citation | [1] Xi Yang, Xiang Yu, and Xin Liu. Obtaining a sustainable competitive advantage from patent information: A patent analysis of the graphene industry. Sustainability, 10(12), 2018.
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[144] Alexander Arsenovic, Julien Hillairet, Jackson Anderson, Henrik Forstén, Vincent Rieß, Michael Eller, Noah Sauber, Robert Weikle, William Barnhart, and Franz Forstmayr. scikit-rf: An open source python package for microwave network cre- ation, analysis, and calibration [speaker＇s corner]. IEEE Microwave Magazine, 23(1):98–105, 2021. | - |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/96150 | - |
| dc.description.abstract | 石墨烯衍生材料因其在多種應用中的潛力而備受關注，包括功能性塗層、電子設備和膜分離。這些材料的質量和性能取決於組裝技術，該技術需能精確控制層數及薄膜的密度，並能夠在大面積上保持均勻性。雖然化學氣相沉積（CVD）技術能夠有效生產單層石墨烯，但其受限於高昂的能源成本、有限的基材選擇以及困難的轉移過程。傳統的實驗室方法如滴鑄、旋塗和過濾等，難以在大面積上實現納米尺度的薄膜厚度控制和均勻性。我們主張，在界面上組裝二維材料提供了一個有效的媒介，能夠製備並研究這些薄膜的形成，以應對新興應用需求。
我們觀察到，通過 Langmuir-Blodgett（LB）技術在氣-水界面上側向限制石墨烯片，懸浮片中的納米尺度皺褶在超過臨界表面壓力後導致了意想不到的折疊轉變，從而展示了薄膜增強的效果。折疊的出現通過原位布儒斯特角反射法和非原位顯微技術得到證實，並形成了獨特的“z-層壓＂納米結構。我們將這一知識擴展到液-液界面中二維異質結薄膜的形成，因為 z-層壓石墨烯適合作為其他剪切剝離材料的基礎。為了展示我們 z-層壓薄膜的特性，我們引入了一種新穎的探測技術，稱為接觸電阻斷層成像（cRT）。該技術為表徵具有納米尺度不均勻性的材料的導電性和接觸性質提供了一種全新的方法。我們展示了 z-層壓方法在基於石墨烯的結構材料、摩擦層和功能性電化學塗層應用中的潛力。z-層壓石墨烯的完全可回收性為可持續納米結構材料開辟了新的途徑。我們還展示了在液-液界面組裝的石墨烯-W S2 異質結薄膜的可行性，並展示了其作為光電探測器的應用。 最後，我們開發了一種新的方法來表徵我們的界面組裝薄膜。該方法專注於具有納米尺度不均勻性的薄膜，如折疊和皺紋，表徵其導電性和接觸性質。傳統方法通常需要多個樣品和複雜的程序，對於基礎研究構成挑戰。我們利用一種新開發的雙微探針系統，引入了微波阻抗斷層成像（MIT）技術。與傳統方法不同，MIT 利用微波信號來測試樣品，允許非侵入性且高解析度地表徵導電性和接觸性質。這種技術可以測量表面電導率，同時映射納米材料內部的空間電阻變化，這在該領域是前所未有的。與傳統的微波阻抗顯微鏡（MIM）技術相比，MIT 提供了若干優勢：單次測量即可評估接觸質量、與納米電極兼容、更簡單的製造過程以及在環境條件下進行測量。通過模擬技術，我們提取了關鍵的材料參數，如電容映射和局部載流子濃度，從而闡明了納米尺度接觸行為。這一進展對於理解和優化界面薄膜及其他材料的性質具有深遠的影響。 | zh_TW |
| dc.description.abstract | Materials derived from graphene have gained significant attention for applications in functional coatings, electronic devices, and membrane separations. Their quality depends on precise assembly techniques to control layer numbers and film density over large areas. While Chemical Vapor Deposition (CVD) effectively produces single-layer graphene, it is limited by high energy costs and difficult transfer processes. Laboratory methods like drop-casting and spin-coating also fall short in controlling film thickness and uniformity on a nanometer scale. We propose that assembling 2D materials at interfaces offers an effective medium for fabricating and studying films for emerging applications.
Using the Langmuir-Blodgett (LB) technique, we confined graphene flakes at the air-water interface, inducing nanoscale buckling and folding transitions beyond critical surface pressure. This process strengthened the film, resulting in a unique “z-laminated＂ nanostructure, confirmed through in-situ Brewster-angle reflectivity and ex-situ microscopy. The z-laminated graphene structure serves as a robust platform for depositing other materials, such as shear-exfoliated films. We then demonstrate the formation of graphene-W S2 heterojunction films at the liquid-liquid interface, showing their potential as photodetectors. Finally, we developed a method for characterizing interface-assembled films. This technique relies on measuring contact properties in materials with nanoscale inhomogeneities. This approach allows for non-invasive, high-resolution characterization of surface conductance and spatial resistance variations, presenting a significant advancement in understanding and optimizing material properties in graphene-based films. These film assemblies present promising applications in graphene-based structural materials, tribo-logical layers, and functional electrochemical coatings, with the added benefit of complete recyclability. | en |
| dc.description.provenance | Submitted by admin ntu (admin@lib.ntu.edu.tw) on 2024-11-15T16:11:09Z No. of bitstreams: 0 | en |
| dc.description.provenance | Made available in DSpace on 2024-11-15T16:11:09Z (GMT). No. of bitstreams: 0 | en |
| dc.description.tableofcontents | Verification Letter from the Oral Examination Committee i
Acknowledgements iii 摘要 v Abstract vii Contents ix List of Figures xiii List of Tables xvii Denotation xix Chapter 1 Introduction 1 Chapter 2 Background 5 2.1 Brief History of 2D materials . . . . . . . . . . . . . . . . . . . . . 5 2.2 Synthesis Methods of 2-D Materials . . . . . . . . . . . . . . . . . . 7 2.2.1 Bottom-up Synthesis . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.2.2 Top-down Synthesis . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.2.2.1 Mechanical Exfoliation . . . . . . . . . . . . . . . . . 10 2.2.2.2 Electrochemical Exfoliation . . . . . . . . . . . . . . . 10 2.2.2.3 Shear-Exfoliation . . . . . . . . . . . . . . . . . . . . 11 2.2.3 Graphene Thin-film Assembly . . . . . . . . . . . . . . . . . . . . 11 2.2.3.1 Langmuir-Blodgett Deposition . . . . . . . . . . . . . 12 Chapter 3 Characterization and Analysis of Z-laminated Films 21 3.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 3.2 Methods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 3.2.1 Shear Exfoliation of Graphite . . . . . . . . . . . . . . . . . . . . . 23 3.2.2 Brewster Angle Microscopy . . . . . . . . . . . . . . . . . . . . . 23 3.2.2.1 Theory behind BAM . . . . . . . . . . . . . . . . . . . 24 3.2.2.2 Brewster Angle Microscopy Analysis . . . . . . . . . . 25 3.2.3 Liquid-Interface-Directed-Assembly of Graphene . . . . . . . . . . 25 3.2.4 Morphology Analysis of SE Graphene Film . . . . . . . . . . . . . 25 3.2.4.1 Atomic Force Microscopy . . . . . . . . . . . . . . . . 26 3.2.4.2 Scanning and Transmission Electron Microscopy . . . 26 3.2.5 Molecular Dynamic Simulation . . . . . . . . . . . . . . . . . . . . 27 3.2.6 Finite Element Method Simulation . . . . . . . . . . . . . . . . . . 27 3.3 Results and Discussion . . . . . . . . . . . . . . . . . . . . . . . . . 28 Chapter 4 Rheology of Z-laminated Graphene Flakes at the Air-Water Interface 41 4.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 4.1.1 Equations in Interfacial Rheology . . . . . . . . . . . . . . . . . . 42 4.2 Barrier Oscillation Study of Langmuir-Blodgett Assembled 2D materials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 4.3 Heterojunction films at Interfaces . . . . . . . . . . . . . . . . . . . 50 4.3.1 Interaction between Particles at the Liquid-liquid interface . . . . . 50 4.3.2 Hexane-NMP Interface Preparation . . . . . . . . . . . . . . . . . . 51 4.3.2.1 Results and Discussion . . . . . . . . . . . . . . . . . 51 Chapter 5 Nanoscale Characterization of 2D Materials 55 5.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 5.2 Electrical Characterization with Resonant Feedback Loop Integration 56 5.3 Application of Impedance Spectroscopy to 2D Materials . . . . . . . 59 5.3.1 Maxwell’s Equations . . . . . . . . . . . . . . . . . . . . . . . . . 60 5.3.2 2-port networks . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64 5.3.2.1 Scattering matrix, [S] . . . . . . . . . . . . . . . . . . 65 5.3.3 Network Analyzer . . . . . . . . . . . . . . . . . . . . . . . . . . . 65 5.3.3.1 Error sources . . . . . . . . . . . . . . . . . . . . . . . 66 5.3.3.2 De-embedding using Time-Domain Substitution . . . . 67 Chapter 6 Applications and Future Work 75 6.1 Applications of Z-laminated films . . . . . . . . . . . . . . . . . . . 75 6.1.1 Z-laminated graphene films extended to rheological studies . . . . . 79 6.2 Integrating VNA measurement to Smaract probe set-up . . . . . . . . 80 References 83 Appendix A — Supplementary Infomation for z-laminated films 103 A.1 Raman Spectroscopy of Langmuir films . . . . . . . . . . . . . . . . 103 A.2 Indentation Experiment . . . . . . . . . . . . . . . . . . . . . . . . . 105 Appendix B — Supplementary Information for Scripts 107 B.1 Smaract Probe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107 B.2 VNA Scripts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117 | - |
| dc.language.iso | en | - |
| dc.subject | 複合材料 | zh_TW |
| dc.subject | 可回收 | zh_TW |
| dc.subject | 複合材料 | zh_TW |
| dc.subject | 膜 | zh_TW |
| dc.subject | 層壓石墨烯 | zh_TW |
| dc.subject | 可回收二維材料 | zh_TW |
| dc.subject | 二維材料 | zh_TW |
| dc.subject | 層壓石墨烯 | zh_TW |
| dc.subject | 膜 | zh_TW |
| dc.subject | 2D materials | en |
| dc.subject | membranes | en |
| dc.subject | laminated graphene | en |
| dc.subject | composites | en |
| dc.subject | recyclable | en |
| dc.title | 石墨烯納米片薄膜的組裝與表徵：高強度膜和功能性塗層 | zh_TW |
| dc.title | Assembly and Characterization of Graphene Nanoflake Films for Strong Membranes and Functional Coatings | en |
| dc.type | Thesis | - |
| dc.date.schoolyear | 113-1 | - |
| dc.description.degree | 博士 | - |
| dc.contributor.oralexamcommittee | 謝雅萍;林靖衛;陳永芳;梁啟德 | zh_TW |
| dc.contributor.oralexamcommittee | Ya-Ping Hsieh;Ching-Wei Lin;Yang-Fang Chen;Chi-Te Liang | en |
| dc.subject.keyword | 二維材料,層壓石墨烯,膜,複合材料,可回收二維材料,層壓石墨烯,膜,複合材料,可回收, | zh_TW |
| dc.subject.keyword | 2D materials,laminated graphene,membranes,composites,recyclable, | en |
| dc.relation.page | 129 | - |
| dc.identifier.doi | 10.6342/NTU202404503 | - |
| dc.rights.note | 同意授權(全球公開) | - |
| dc.date.accepted | 2024-10-24 | - |
| dc.contributor.author-college | 理學院 | - |
| dc.contributor.author-dept | 物理學系 | - |
| 顯示於系所單位： | 物理學系 | |
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