Please use this identifier to cite or link to this item:
http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/95629Full metadata record
| ???org.dspace.app.webui.jsptag.ItemTag.dcfield??? | Value | Language |
|---|---|---|
| dc.contributor.advisor | 林致廷 | zh_TW |
| dc.contributor.advisor | Chih-Ting Lin | en |
| dc.contributor.author | 孫培源 | zh_TW |
| dc.contributor.author | Pei-Yuan Sun | en |
| dc.date.accessioned | 2024-09-15T16:12:01Z | - |
| dc.date.available | 2024-09-16 | - |
| dc.date.copyright | 2024-09-14 | - |
| dc.date.issued | 2024 | - |
| dc.date.submitted | 2024-08-09 | - |
| dc.identifier.citation | [1] Impedance measurement handbook a guide to measurement technology and techniques. Technical report, Keysight Technology, 2000.
[2] Ieee international roadmap for devices and systems,“yield enhancement.". Technical report, Institute of Electrical and Electronics Engineers, 2023. [3] C. Chang and S. Sze. ULSI Technology. Electrical engineering series. McGraw-Hill,1996. [4] R. Donovan. Contamination-Free Manufacturing for Semiconductors and Other Precision Products(1st ed.). CRC Press, New York, 2001. [5] G. Grandi, M. Kazimierczuk, A. Massarini, and U. Reggiani. Stray capacitances of single-layer solenoid air-core inductors. IEEE Transactions on Industry Applications, 35(5):1162–1168, 1999. [6] M. James B. Callis, Deborah L. Illman, and Bruce R. Kowalski. Process analytical chemistry. Analytical Chemistry, 59(9):624A–637A, 1987. [7] D. M. Knotter. The Chemistry of Wet Etching, chapter 3, pages 95–141. John Wiley Sons, Ltd, 2010. [8] K. Kondo. Measurement and control of liquid-borne particles in the semiconductor manufacturing Process. Cleaning Technology, 22(12):37, 2012. [9] J. Kuipers, H. Bruning, D. Yntema, S. Bakker, and H. Rijnaarts. Self-capacitance and resistive losses of saline-water-filled inductors. IEEE Transactions on Industrial Electronics, 61(5):2356–2361, 2014. [10] T. S. M. C. Limited. Logic technology. [11] M. V. Markle R.J., Dance D. Role of Equipment in Silicon Defect and Impurity Issues, Proceedings of Microcontamination '91. V. B., San Jose, CA, 1991. [12] J.-G. Park, S.-H. Lee, J.-S. Ryu, Y.-K. Hong, T.-G. Kim, and A. A. Busnaina. Interfacial and electrokinetic characterization of ipa solutions related to semiconductor wafer drying and cleaning. Journal of The Electrochemical Society, 153(9):G811,jun 2006. [13] J. Tan, R. Shick, J. Peri, I.-f. Wang, A. Singh, and R. Beera. Nano filtration using polysulfone membrane : Cfm: Contamination free manufacturing. In 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), pages 1–4, 2022. [14] TSK DENKO CO.,LTD. American wire gauge table(awg). [15] X. Wang, M. Kearney, B. Mehdizadeh, and B. Chenny. Particle monitoring in liquids: Liquid particle counter | - |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/95629 | - |
| dc.description.abstract | 本研究旨在探討基於線圈自共振效應的濾心測量方法,並評估其在不同介電溶液中的應用。研究中使用去離子水和異丙醇的混合溶液,驗證了介電常數與共振頻率之間的線性關係。實驗方法包括製備不同濃度的異丙醇與去離子水混合溶液,並利用線圈自共振效應進行頻率測量。結果顯示,隨著異丙醇濃度的增加,溶液的介電常數降低,導致線圈共振頻率上升,符合理論預測。此外,實驗還對比了不同設計的線圈測量結果,證實測量方法的穩定性和重現性。
在濾心測量中,發現使用過的濾心共振頻率低於新濾心,表明吸附粒子的存在增加了濾心的介電常數。這表明該方法能有效辨別濾心使用狀態,並檢測其吸附的粒子量。討論中指出,該技術有機會能夠應用於半導體製程中的濾心監控,以助於提高製程良率和產品品質。 結論部分強調,基於線圈自共振效應的濾心測量方法具有可行性與有效性,為未來在半導體製程及其他相關領域的應用奠定了基礎。未來研究方向包括提升測量精度、開發自動化測量系統以及結合其他檢測技術,以進一步提升檢測效率和準確性。 | zh_TW |
| dc.description.abstract | This study aims to explore the method of filter measurement based on the coil self-resonance effect and evaluate its application in different dielectric solutions. The research utilized mixtures of deionized water and isopropanol to verify the linear relationship between dielectric constant and resonance frequency. The experimental methods included preparing mixtures of varying concentrations of isopropanol and deionized water and measuring frequencies using the coil self-resonance effect. Results indicated that as the concentration of isopropanol increased, the dielectric constant of the solution decreased, causing the coil resonance frequency to rise, which aligned with theoretical predictions. Additionally, the study compared measurement results from coils of different designs, confirming the stability and reproducibility of the measurement method.
In filter measurement, it was found that used filters had lower resonance frequencies compared to new filters, indicating that the presence of adsorbed particles increased the dielectric constant of the filters. This demonstrated that the method could effectively distinguish the usage status of the filters and detect the amount of particles adsorbed. The discussion pointed out that this technique has the potential to be applied in filter monitoring in semiconductor processes, which can help improve yield and product quality. The conclusion emphasized that the filter measurement method based on the coil self-resonance effect is feasible and effective, laying the foundation for future applications in semiconductor manufacturing and other related fields. Future research directions include improving measurement accuracy, developing automated measurement systems, and integrating other detection technologies to further enhance detection efficiency and accuracy. | en |
| dc.description.provenance | Submitted by admin ntu (admin@lib.ntu.edu.tw) on 2024-09-15T16:12:01Z No. of bitstreams: 0 | en |
| dc.description.provenance | Made available in DSpace on 2024-09-15T16:12:01Z (GMT). No. of bitstreams: 0 | en |
| dc.description.tableofcontents | 致謝 i
摘要 ii Abstract iii 目次 v 圖次 vii 表次 viii 第一章 緒論 1 1.1 前言 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1.2 研究動機 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 第二章 理論與文獻回顧 3 2.1 無污染製造簡介 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 2.2 液體化學品汙染問題 . . . . . . . . . . . . . . . . . . . . . . . . . . 3 2.3 化學品測量方法 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 2.4 線圈自共振檢測方法 . . . . . . . . . . . . . . . . . . . . . . . . . . 6 第三章 研究方法與實驗設置 8 3.1 量測系統 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 3.2 儀器原理介紹 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 3.3 線圈規格 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 3.4 實驗流程與樣品 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 3.4.1 去離子水及異丙醇混合溶液 . . . . . . . . . . . . . . . . . . . . 14 3.4.2 商業用濾心 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 3.5 數據分析方法 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 第四章 結果與討論 19 4.1 不同介電常數溶液之測量結果 . . . . . . . . . . . . . . . . . . . . . 20 4.1.1 Tube Coil . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 4.1.2 Housing Coil . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 4.2 已使用過濾心和未使用過濾心之結果 . . . . . . . . . . . . . . . . . 22 第五章 結論與未來展望 27 參考文獻 29 | - |
| dc.language.iso | zh_TW | - |
| dc.subject | 非侵入式檢測 | zh_TW |
| dc.subject | 介電質 | zh_TW |
| dc.subject | 濾芯汙染檢測 | zh_TW |
| dc.subject | 螺線管線圈 | zh_TW |
| dc.subject | 自共振 | zh_TW |
| dc.subject | Dielectric | en |
| dc.subject | Self-Resonance | en |
| dc.subject | Solenoid Coil | en |
| dc.subject | Filter Contaminant Measurement | en |
| dc.subject | Non-invasive Measurement | en |
| dc.title | 基於線圈自共振效應之測量方法研發 | zh_TW |
| dc.title | Research and development of measurement method based on coil self-resonance | en |
| dc.type | Thesis | - |
| dc.date.schoolyear | 112-2 | - |
| dc.description.degree | 碩士 | - |
| dc.contributor.oralexamcommittee | 張子璿;林駿璿 | zh_TW |
| dc.contributor.oralexamcommittee | Tzu-Hsuan Chang;Chun-Hsuan Lin | en |
| dc.subject.keyword | 自共振,螺線管線圈,濾芯汙染檢測,非侵入式檢測,介電質, | zh_TW |
| dc.subject.keyword | Self-Resonance,Solenoid Coil,Filter Contaminant Measurement,Non-invasive Measurement,Dielectric, | en |
| dc.relation.page | 30 | - |
| dc.identifier.doi | 10.6342/NTU202403083 | - |
| dc.rights.note | 未授權 | - |
| dc.date.accepted | 2024-08-12 | - |
| dc.contributor.author-college | 電機資訊學院 | - |
| dc.contributor.author-dept | 電子工程學研究所 | - |
| Appears in Collections: | 電子工程學研究所 | |
Files in This Item:
| File | Size | Format | |
|---|---|---|---|
| ntu-112-2.pdf Restricted Access | 7.61 MB | Adobe PDF |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
