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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 廖先順 | zh_TW |
| dc.contributor.advisor | Hsien-Shun Liao | en |
| dc.contributor.author | 鄭守程 | zh_TW |
| dc.contributor.author | Shou-Cheng Jheng | en |
| dc.date.accessioned | 2023-08-16T16:46:51Z | - |
| dc.date.available | 2023-11-09 | - |
| dc.date.copyright | 2023-08-16 | - |
| dc.date.issued | 2023 | - |
| dc.date.submitted | 2023-08-03 | - |
| dc.identifier.citation | 參考文獻
[1] G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, "Surface Studies by Scanning Tunneling Microscopy," Phys. Rev. Lett., vol. 49, no. 1, pp. 57-61, 7 1982. [2] G. Binnig, C. F. Quate, and Ch. Gerber, "Atomic Force Microscope," Phys. Rev. Lett., vol. 56, no. 9, pp. 990-993, 5 1986. [3] R. C. Barrett, C. F. Quate, "High‐speed, large‐scale imaging with the atomic force microscope," Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 9, no. 2, pp. 302-306, 3 1991. [4] S. R. Manalis, S. C. Minne, C. F. Quate, "Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor," Appl. Phys. Lett., vol. 68, no. 6, pp. 871-873, 5 1996. [5] M. B. Viani, T. E. Schäffer, G. T. Paloczi, L. I. Pietrasanta, B. L. Smith, J. B. Thompson, M. Richter, M. Rief, H. E. Gaub, K. W. Plaxco, A. N. Cleland, H. G. Hansma, P. K. Hansma, "Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers," Rev Sci Instrum, vol. 70, no. 11, pp. 4300-4303, 11 1999. [6] T. Ando, N. Kodera, D. Maruyama, E. Takai, K. Saito and A. Toda, "A High-Speed Atomic Force Microscope for Studying Biological Macromolecules in Action," Japanese Journal of Applied Physics, vol. 41, no. 1, pp. 4851-4856, 7 2002. [7] Y. Suzuki, N. Sakai, A. Yoshida, Y. Uekusa, A. Yagi, Y. Imaoka, S. Ito, K. Karaki & K. Takeyasu, "High-speed atomic force microscopy combined with inverted optical microscopy for studying cellular events," Scientific Reports, vol. 3, p. 2131, 2013. [8] S. Fukuda, T. Uchihashi, R. Iino, Y. Okazaki, M. Yoshida, K. Igarashi, T. Ando, "High-speed atomic force microscope combined with single-molecule fluorescence microscope," Review of Scientific Instruments, vol. 84, no. 7, p. 073706, 7 2013. [9] T. Uchihashi, H. Watanabe, S. Fukuda, M. Shibata, T. Ando, "Functional extension of high-speed AFM for wider biological applications," Ultramicroscopy, vol. 160, pp. 182-196, 1 2016. [10] H.-S. Liao, Y.-H. Chen, R.-F. Ding, H.-F. Huang, W.-M. Wang, E.-T. Hwu, K.-Y. Huang, C.-S. Chang, I.-S. Hwang, "High-speed atomic force microscope based on an astigmatic detection system," Review of Scientific Instruments, vol. 85, no. 10, p. 103710, 10 2014. [11] 許逸誠, “具小光點之微懸臂感測系統之設計與開發,” 國立台灣大學機械工程學研究所碩士論文, 2019. [12] 吳艾庭, “提升超小型微懸臂感應系統靈敏度之研究,” 國立台灣大學機械工程學研究所碩士論文, 2021. [13] 陳式新, “基於氦氖雷射之超小型微懸臂感測系統之設計與開發,” 國立台灣大學機械工程學研究所碩士論文, 2022. [14] 黃英碩, "掃描探針顯微術的原理及應用," 科儀新知, vol. 26, no. 4, 2005. [15] G. A. Matei, E. J. Thoreson, J. R. Pratt, D. B. Newell, N. A. Burnham, "Precision and accuracy of thermal calibration of atomic force microscopy cantilevers," Review of Scientific Instruments, vol. 70, no. 8, p. 083703, 8 2006. [16] T. Fukuma, S. P. Jarvis, "Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions," Review of Scientific Instruments, vol. 77, no. 4, p. 043710, 4 2006. [17] A. D. L. Humphris, M. J. Miles, J. K. Hobbs, "A mechanical microscope: High-speed atomic force microscopy," Applied Physics Letters, vol. 86, no. 3, 1 2005. | - |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/89016 | - |
| dc.description.abstract | 原子力顯微鏡(Atomic Force Microscope, AFM)具有奈米級解析度、不受真空環境限制等優點,因此經常被應用於生醫領域。高速原子力顯微鏡(High-Speed AFM, HS-AFM)為了對動態生物樣品進行成像,必須具備可量測高共振頻率之超小型微懸臂探針的微懸臂感測系統。商用像散式光學讀取頭因具有光點小、頻寬高等優點,可用於高速原子力顯微鏡量測超小型微懸臂。由於微懸臂感測系統之量測靈敏度對成像解析度至關重要,本研究透過改變藍光讀取頭內部之準直鏡位置、以及替換紅光讀取頭光源為穩定的氦氖雷射等不同方式進行靈敏度性能比較。其中在使用氦氖雷射替換紅光讀取頭光源,並使用鍍金微懸臂探針FMAuD時可得到較佳之靈敏度0.65 mV/nm,系統雜訊峰對峰值2.7 mV,雜訊對應位移量4.2 nm,其位移解析度可高於原商用紅光讀取頭。 | zh_TW |
| dc.description.abstract | Atomic Force Microscope (AFM) has nanoscale resolution and can be operated in ambient, liquid and vacuum environments. These advantages make AFM widely used in the field of biomedicine. In order to image dynamic biomedical phenomena, high-speed AFM (HS-AFM) requires a cantilever detection system which can measure ultra-small cantilever with high resonance frequency. Commercial astigmatic optical pickup head has advantages of small laser spot size and high bandwidth, which is suitable for measuring ultra-small cantilever in HS-AFM. The sensitivity of the cantilever detection system is crucial for achieving high imaging resolution. In this study, different optical configurations including changing the position of the collimator inside the blue-ray pickup head and replacing the light source of the red-light pickup head with a stable He-Ne laser were tested for optimizing the sensitivity. The experimental results show that using the red-light pickup head with the He-Ne laser to measure a gold-coated cantilever tip FMAuD had a highest sensitivity of 0.65 mV/nm. The peak-to-peak noise of the system was 2.72 mV, which corresponded to 4.2 nm in displacement. The displacement resolution of the modified optical configuration was higher than the original red-light pickup head. | en |
| dc.description.provenance | Submitted by admin ntu (admin@lib.ntu.edu.tw) on 2023-08-16T16:46:51Z No. of bitstreams: 0 | en |
| dc.description.provenance | Made available in DSpace on 2023-08-16T16:46:51Z (GMT). No. of bitstreams: 0 | en |
| dc.description.tableofcontents | 目錄
致謝 I 摘要 II Abstract III 目錄 IV 圖目錄 VII 表目錄 XII 第一章 緒論 1 1.1 研究背景 1 1.2 文獻回顧 1 1.2.1 AFM之歷史及原理 1 1.2.2 HS-AFM之發展 3 1.2.3 像散式光學檢測法 9 1.2.4 AFM微懸臂量測靈敏度 13 1.3 研究目的 16 1.4 內容簡介 17 第二章 原子力顯微鏡原理與靈敏度 18 2.1 AFM原理與架構 18 2.2 AFM與樣品間作用力 19 2.3 微懸臂探針 21 2.4 光偏折式微懸臂感測系統靈敏度 22 第三章 實驗架構與設計 26 3.1 像散式光路設計 26 3.2 整體架構設計 29 3.2.1 氦氖雷射固定機構 30 3.2.2 光纖對位與調控機構 31 3.2.3 光纖輸出端對位機構 32 3.2.4 光路固定支架 33 3.2.5 微懸臂機構 34 3.3 實驗儀器 37 3.3.1 功率計 37 3.3.2 位置感測器 38 3.3.3 壓電掃描器與控制器 39 3.3.4 讀取頭放大電路 41 3.3.5 Z軸步進滑台 42 3.3.6 控制系統 43 3.4 實驗架構 43 3.4.1 光強與訊雜比量測實驗 44 3.4.2 靈敏度量測實驗 45 第四章 實驗流程與結果 48 4.1 光強與訊雜比量測實驗 48 4.1.1 光強與訊雜比量測實驗流程 48 4.1.2 光強與訊雜比量測結果 49 4.1.3 光強與訊雜比量測結果討論 56 4.2 靈敏度量測實驗 58 4.2.1 靈敏度量測實驗流程 58 4.2.2 靈敏度量測結果 61 4.2.3 靈敏度量測結果討論 75 第五章 結論與未來展望 78 參考文獻 79 附錄A 紅光讀取頭規格表 82 附錄B 氦氖雷射規格表(HNL150LB) 83 附錄C PDQ80A 85 附錄D 微懸臂探針規格表(FMAuD) 87 附錄E 微懸臂探針規格表(AC240TS) 88 附錄F 微懸臂探針規格表(SCM-PIC) 90 附錄G 微懸臂探針規格表(MLCT-A) 91 | - |
| dc.language.iso | zh_TW | - |
| dc.subject | 靈敏度 | zh_TW |
| dc.subject | 像散 | zh_TW |
| dc.subject | 高速原子力顯微鏡 | zh_TW |
| dc.subject | 光學讀取頭 | zh_TW |
| dc.subject | Optical pickup head | en |
| dc.subject | High-speed atomic force microscope | en |
| dc.subject | Astigmatism | en |
| dc.subject | Sensitivity | en |
| dc.title | 提升像散式原子力顯微鏡靈敏度之研究 | zh_TW |
| dc.title | Study on Improving Sensitivity of Astigmatic Atomic Force Microscope | en |
| dc.type | Thesis | - |
| dc.date.schoolyear | 111-2 | - |
| dc.description.degree | 碩士 | - |
| dc.contributor.oralexamcommittee | 楊志文;高豐生 | zh_TW |
| dc.contributor.oralexamcommittee | Chih-Wen Yang;Feng-Sheng Kao | en |
| dc.subject.keyword | 高速原子力顯微鏡,光學讀取頭,像散,靈敏度, | zh_TW |
| dc.subject.keyword | High-speed atomic force microscope,Optical pickup head,Astigmatism,Sensitivity, | en |
| dc.relation.page | 91 | - |
| dc.identifier.doi | 10.6342/NTU202302879 | - |
| dc.rights.note | 同意授權(全球公開) | - |
| dc.date.accepted | 2023-08-08 | - |
| dc.contributor.author-college | 工學院 | - |
| dc.contributor.author-dept | 機械工程學系 | - |
| 顯示於系所單位: | 機械工程學系 | |
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