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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 朱士維(Shi-Wei Chu) | |
| dc.contributor.author | Yu-Chien Huang | en |
| dc.contributor.author | 黃郁茜 | zh_TW |
| dc.date.accessioned | 2022-11-23T09:27:21Z | - |
| dc.date.available | 2021-08-04 | |
| dc.date.available | 2022-11-23T09:27:21Z | - |
| dc.date.copyright | 2021-08-04 | |
| dc.date.issued | 2021 | |
| dc.date.submitted | 2021-07-06 | |
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| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/80122 | - |
| dc.description.abstract | 吸收是光和物質基本的交互作用之一，藉由量測物質的吸收特性，我們便能區分不同材料組成及結構。定量奈米物體的吸收通常是仰賴比爾-朗伯定律：量測光在通過大量奈米物體後的衰減量。雖然這個方法相當直接有效，但它量測的結果是眾多奈米物體吸收的平均，缺乏單一奈米粒子的解析度，也因此無法得知個別奈米粒子之間的不同。量測單一奈米粒子的吸收十分困難，因為奈米粒子的吸收截面積比可見光的繞射極限小了數個數量級，因此很難在奈米尺度下直接量測吸收。 光熱顯微術(photothermal microscopy)是一種能夠定量量測奈米材料吸收的技術，利用泵探針(pump-probe)的原理來量測因光吸收而造成的散射變化。當加熱泵束(pump beam)被樣品吸收後，樣品釋放出的熱改變周圍介質的折射率，即為熱透鏡效應(thermal lens effect)，再利用探測光束(probe beam)去偵測因熱透鏡生成而造成的光散射變化。然而，量測奈米材料的微小散射場變化通常必須利用對相位高度敏感的干涉技術來達成，這使得定量闡釋光熱訊號十分不容易。 在這篇論文中，我們利用寬場干涉光熱顯微術量測不同大小的金屬奈米粒子(金、銀奈米粒子)的光熱訊號。實驗數據顯示：對於很小的奈米粒子(在我們系統為小於40奈米的粒子)而言，光熱訊號是由熱透鏡的散射場所貢獻，也就是源自於奈米粒子逸散出的熱，且和加熱泵束的光強及樣品的吸收截面積成正比，與粒子的尺寸和材料無關。我們利用影像差頻鎖相偵測法(image-based difference-frequency lock-in detection)來提升信號雜訊比，能夠在寬場照明下量測到5奈米金粒子的吸收。此外，我們建立了一個模型來解釋實驗數據，證實光熱訊號的本質是熱透鏡所導致的散射場透過干涉影像偵測所造成的結果。我們更進一步研究大粒子(40奈米至100奈米)的光熱訊號，在這個區間，奈米粒子的散射場已經無法被忽視且與探測光束光強相當，此時，熱透鏡的散射場會與奈米粒子的散射場互相干涉，造成光熱訊號的放大。這個事實指出光熱訊號不僅只和樣品吸光後所逸散出的熱有關，樣品與環境的散射特性也會影響光熱訊號，所以若要定量量測奈米尺度的吸收，樣品本身的散射性質必須同時被考慮進光熱量測模型中。這個研究成果將有助於未來在不均勻環境的複雜樣品中，進行定量且準確的吸收量測研究。 | zh_TW |
| dc.description.provenance | Made available in DSpace on 2022-11-23T09:27:21Z (GMT). No. of bitstreams: 1 U0001-0507202118521000.pdf: 4562294 bytes, checksum: 60974cccecbc359f9db81d7e099958fc (MD5) Previous issue date: 2021 | en |
| dc.description.tableofcontents | 口試委員審定書................................................................# 誌謝..........................................................................i 中文摘要.....................................................................ii ABSTRACT.....................................................................iv CONTENTS....................................................................vii LIST OF FIGURES...............................................................x LIST OF TABLES..............................................................xii Chapter 1 Introduction........................................................1 1.1 Scattering and absorption of light of small particles.....................1 1.2 Photothermal detection....................................................4 1.3 Thesis structure..........................................................8 Chapter 2 Principle of interferometric detection of scattering signal........10 2.1 Scattering-based microscopy: darkfield and interferometric microscopy....10 2.2 Coherent brightfield microscopy (COBRI)..................................14 2.2.1 Interferometric scattering detection and contrast enhancement..........14 2.2.2 COBRI contrast.........................................................17 2.2.3 Signal-to-noise ratio (SNR)............................................20 Chapter 3 Mechanisms of photothermal signal generation and detection.........23 3.1 The role of interference in photothermal contrast........................23 3.1.1 Interference regime....................................................24 3.1.2 Darkfield-like regime..................................................27 3.2 Lock-in detection in photothermal measurement............................28 3.2.1 Image-based lock-in detection..........................................28 3.2.2 Dual-frequency lock-in detection.......................................30 Chapter 4 Experimental methods...............................................33 4.1 Sample preparation.......................................................33 4.2 Widefield interferometric photothermal microscopy........................34 4.2.1 Coherent brightfield microscopy (COBRI)................................35 4.2.2 Addition of a heating beam for photothermal detection..................38 4.2.3 Z-module...............................................................38 4.3 Image data analysis......................................................40 Chapter 5 Results and discussion.............................................43 5.1 Characterization of widefield interferometric photothermal microscopy....43 5.2 Quantitative absorption measurements of single metallic nanoparticles....45 5.2.1 Interference regime....................................................46 5.2.2 Darkfield-like regime..................................................49 5.3 Noise floor of photothermal detection....................................54 5.4 Detection sensitivity and SNR............................................55 5.5 Comparison with laser-scanning photothermal detection....................58 Chapter 6 Conclusion.........................................................60 Reference....................................................................63 | |
| dc.language.iso | en | |
| dc.subject | 奈米粒子 | zh_TW |
| dc.subject | 光熱顯微術 | zh_TW |
| dc.subject | 干涉散射顯微術 | zh_TW |
| dc.subject | 同調式明場顯微術 | zh_TW |
| dc.subject | 光散射 | zh_TW |
| dc.subject | 光吸收 | zh_TW |
| dc.subject | scattering | en |
| dc.subject | nanoparticles | en |
| dc.subject | absorption | en |
| dc.subject | photothermal microscopy | en |
| dc.subject | coherent brightfield microscopy | en |
| dc.subject | interferometric scattering microscopy | en |
| dc.title | 利用寬場干涉光熱顯微術定量單一奈米粒子吸收影像 | zh_TW |
| dc.title | Quantitative Absorption Imaging of Single Nanoparticles by Widefield Interferometric Photothermal Microscopy | en |
| dc.date.schoolyear | 109-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.advisor-orcid | 朱士維(0000-0001-7728-4329) | |
| dc.contributor.coadvisor | 謝佳龍(Chia-Lung Hsieh) | |
| dc.contributor.coadvisor-orcid | 謝佳龍(0000-0002-6757-8689) | |
| dc.contributor.oralexamcommittee | 黃承彬(Hsin-Tsai Liu),呂宥蓉(Chih-Yang Tseng),駱遠 | |
| dc.subject.keyword | 光熱顯微術,干涉散射顯微術,同調式明場顯微術,光散射,光吸收,奈米粒子, | zh_TW |
| dc.subject.keyword | photothermal microscopy,interferometric scattering microscopy,coherent brightfield microscopy,scattering,absorption,nanoparticles, | en |
| dc.relation.page | 70 | |
| dc.identifier.doi | 10.6342/NTU202101282 | |
| dc.rights.note | 同意授權(全球公開) | |
| dc.date.accepted | 2021-07-07 | |
| dc.contributor.author-college | 理學院 | zh_TW |
| dc.contributor.author-dept | 物理學研究所 | zh_TW |
| 顯示於系所單位： | 物理學系 | |
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|---|---|---|---|
| U0001-0507202118521000.pdf | 4.46 MB | Adobe PDF | 檢視/開啟 |
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