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http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/72383完整後設資料紀錄
| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 盧信嘉 | |
| dc.contributor.author | Han-Ren Huang | en |
| dc.contributor.author | 黃瀚仁 | zh_TW |
| dc.date.accessioned | 2021-06-17T06:39:06Z | - |
| dc.date.available | 2018-08-21 | |
| dc.date.copyright | 2018-08-21 | |
| dc.date.issued | 2018 | |
| dc.date.submitted | 2018-08-15 | |
| dc.identifier.citation | [1] Chun-Long Wang and Ruey-Beei Wu, 'Modeling and design for electrical performance of wideband flip-chip transition', IEEE Transactions on Advanced Packaging, vol. 26, no. 4, pp. 385-391, Nov. 2003.
[2] G. F. Engen and C. A. Hoer, “thru-Reflect-line”: An improved technique for calibrating the dual six-port automatic network analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. 27 MTT-27, no. 12, pp.987-993. Dec. 1979. [3] FR4, source: http://www.fortex.co.uk/product/fr4-uncoated-double-sided-copper-clad-pcb-laminate/ [4] RO4003C, data sheet: http://www.rogerscorp.com/documents/726/acs/RO4000-LaminatesData-Sheet.pdf [5] end launch 轉接頭, source: http://mpd.southwestmicrowave.com/products/family.php?family=71 [6] TRL, source: http://read.pudn.com/downloads140/doc/606865 /%BE%DF%8C%92%EEl%C1%BF%9Cy%D6%AELST%D0%A3%D5%FD%C0%ED%D5%93/093YZU00650017-004.PDF [7] David M. Pozar, Microwave Engineering, 4th edition, John Wiley & Sons, 2011 [8] H. J. Eul and B. Schiek, “A generalized theory and new calibration procedures for network analyzer self calibration,” IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 4, pp. 724–731, Apr. 1993. [9] C. Seguinot, P. Kennis, J.-F. Legier, F. Huret, E. Paleczny and L. Hayden, 'Multimode TRL—A new concept in microwave measurements: theory and experimental verification', IEEE Transactions on Microwave Theory and Techniques, vol.46, no. 5, pp.536-542, May 1998. [10] M. Wojnowski, V. Issakov, G. Sommer, R. Weigel, 'Multimode TRL calibration technique for characterization of differential devices', IEEE Transactions on Microwave Theory and Techniques, vol. 60, no. 7, pp. 2220-2247, Jul. 2012. [11] Hsin-Chia Lu and Tah-Hsiung Chu, “On transition characterization using TRL calibration method” 2002 Asia-Pacific Microwave Conference (APMC), Dec.2002, pp.911-913. [12] H. Kim, J. Kim and Y. Eo, 'Broadband thin-film transmission-line characterization for accurate high-frequency measurements of on-wafer components,' in IEEE Transactions on Microwave Theory and Techniques, vol. 64, no. 3, pp. 931-938, March 2016. [13] S. K. Kwok, K. F. Tsang, and Y. L. Chow, “A novel capacitance formula of the microstrip line using synthetic asymptote,” Microwave and Optical Technology Letters, vol. 36, no. 5, March 2003, pp. 327-330. [14] Rainee N. Simons, Coplanar Waveguide Circuits, Components, and Systems, New York, John Wiley & Sons, Inc., 2001 [15] G. Ghione and C. Naldi, 'Parameters of coplanar waveguides with lower ground plane,' Electronics Letters, vol. 19, no. 18, pp. 734-735, September 1 1983. [16] SMA data sheet: http://www.jyebao.com.tw/upload/SMA862K-0000.pdf [17] End launch connector data sheet: https://signalmicrowave.com/pdf/ELF67-002_Outline.pdf | |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/72383 | - |
| dc.description.abstract | 本論文主要分為兩個部分，第一部為介紹廣義TRL並推導廣義TRL在單一模態情況下式子，利用T與L電路的特徵值矩陣及R的校準器計算出待測物與誤差盒子的轉移矩陣且正確的判斷待測物轉移矩陣與誤差盒子轉移矩陣的正負號的問題，並利用不對稱的誤差盒子TRL電路情況下驗證演算法的準確性。第二部分設計出GCPW的穿層轉接電路與end launch轉接頭電路，使用廣義TRL演算法求出單一轉接端電路特性並與模擬結果做比較，得到不錯的結果。 | zh_TW |
| dc.description.abstract | This thesis is divided into two parts. The first part of this thesis introduces the generalized TRL and deduces the generalized TRL to the case of single mode propagation. The eigenvalue matrix of the T and L circuits and R calibrator are used to calculate the transfer matrices of the DUT and the error boxes. We can correctly determine the sign of the DUT and the error box transfer matrices. We also verify the accuracy of the algorithm by using asymmetric error boxes in TRL circuit. In the second part of this thesis, we use the GCPW through-layer transition and the end launch connector as a single transition. Then we use the developed algorithm to extract of S-matrix of a single transition and compared with simulation. Good agreement is obtained. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-17T06:39:06Z (GMT). No. of bitstreams: 1 ntu-107-R04942021-1.pdf: 8891087 bytes, checksum: 1045ab5d37a52365f9c683ec2642ee79 (MD5) Previous issue date: 2018 | en |
| dc.description.tableofcontents | 口試委員會審定書 #
誌謝 i 中文摘要 ii ABSTRACT iii 目錄 iv 圖目錄 vi 表目錄 ix Chapter 1 簡介 1 1.1 背景與研究動機 1 1.2 印刷電路板介紹 2 1.3 TRL校準方法文獻研究 4 1.4 論文的貢獻 5 1.5 各章節簡介 5 Chapter 2 TRL校準方法介紹 6 2.1 TRL介紹 6 2.2 廣義TRL式子推導 10 2.3 TRL公式驗證 16 2.3.1 誤差盒子不對稱 16 2.3.2 誤差盒子不同情況下驗證 28 2.4 特徵阻抗萃取 34 Chapter 3 PCB製程下GCPW穿層轉接特性量測 37 3.1 PCB製程下GCPW穿層轉接電路設計模擬 37 3.2 PCB轉接電路量測方式說明 40 3.2.1 GCPW穿層電路照片與尺寸 40 3.2.2 焊接SMA接頭 41 3.2.3 網路分析儀介紹 42 3.3 量測與模擬結果比較 43 Chapter 4 End-launch轉接頭轉接特性量測 50 4.1 End-launch轉接頭電路介紹 50 4.2 End-launch轉接頭量測說明 52 4.3 量測與模擬結果比較 53 Chapter 5 結論與未來的展望 62 5.1 結論 62 5.2 未來展望 62 參考文獻 63 | |
| dc.language.iso | zh-TW | |
| dc.title | 使用TRL校準方法進行單一轉接量測 | zh_TW |
| dc.title | Single Transition Characterization Using TRL Calibration Method | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 106-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 陳晏笙,曾昭雄 | |
| dc.subject.keyword | 散射參數矩陣,轉移矩陣,TRL,校正,誤差盒子,轉接,特徵阻抗, | zh_TW |
| dc.subject.keyword | scattering parameter matrix,transfer matrix,TRL,calibration,error box,transition,characteristic impedance, | en |
| dc.relation.page | 64 | |
| dc.identifier.doi | 10.6342/NTU201803560 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2018-08-16 | |
| dc.contributor.author-college | 電機資訊學院 | zh_TW |
| dc.contributor.author-dept | 電信工程學研究所 | zh_TW |
| 顯示於系所單位： | 電信工程學研究所 | |
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