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請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/64655
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dc.contributor.advisor吳志毅(Chih-I Wu)
dc.contributor.authorChung-Yen Wangen
dc.contributor.author王中彥zh_TW
dc.date.accessioned2021-06-16T22:56:58Z-
dc.date.available2012-08-15
dc.date.copyright2012-08-15
dc.date.issued2012
dc.date.submitted2012-08-09
dc.identifier.citation1. 王慶均, et al., 透明導電膜之應用概論. 機械工業雜誌, 100年五月號. 338期: p. 5.
2. Nasr, B., et al., Electrical resistivity of nanocrystalline Al-doped zinc oxide films as a function of Al content and the degree of its segregation at the grain boundaries. Journal of Applied Physics, 2010. 108(10): p. 103721.
3. Chen, K.J., et al., Microstructures, optical and electrical properties of In-doped ZnO thin films prepared by sol–gel method. Applied Surface Science, 2009. 255(12): p. 6308-6312.
4. Jung, Y.S., et al., Influence of DC magnetron sputtering parameters on the properties of amorphous indium zinc oxide thin film. Thin Solid Films, 2003. 445(1): p. 63-71.
5. Fortunato, E., Characterization of aluminium doped zinc oxide thin films deposited on polymeric substrates. Vacuum, 2002. 64: p. 233–236.
6. Xian, C.-J., et al., Effect of Deposition Temperature on Al 0.016In 0.003Zn 0.981O Thin Films Grown on Glass Substrates by Pulsed Laser Deposition. Journal of The Electrochemical Society, 2008. 155(10): p. H786.
7. Chirakkara, S., K.K. Nanda, and S.B. Krupanidhi, Pulsed laser deposited ZnO:In as transparent conducting oxide. Thin Solid Films, 2011. 519(11): p. 3647-3652.
8. Agura, H., et al., Low resistivity transparent conducting Al-doped ZnO films prepared by pulsed laser deposition. Thin Solid Films, 2003. 445(2): p. 263-267.
9. Hu, J. and R.G. Gordon, Textured aluminum-doped zinc oxide thin films from atmospheric pressure chemical-vapor deposition. Journal of Applied Physics, 1992. 71(2): p. 880.
10. Nomura, K., Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors. Nature, 2004. 432: p. 488-492.
11. Badeker, K., Annals of Physics, (Leipzig), 1907. 22: p. 749.
12. Floriano, E.A., et al., Evaluation of bulk and surfaces absorption edge energy of sol-gel-dip-coating SnO2 thin films. Materials Research, 2010. 13: p. 437-443.
13. 洪文進.許登貴.萬明安.郭書瑋.蘇昭瑾, ITO 透明導電薄膜:從發展與應用到製備與分析. CHEMISTRY(THE CHINESE CHEM. SOC., TAIPEI), 2005. 63: p. 409~418.
14. 藍銀鋒, 常溫鍍製銦錫氧化物於高分子軟性基板. 逢甲大學材料科學與工程學系博士論文, 2010.
15. Shigesato, Y., In Based TCOs. 2010.
16. 魏嘉瑩, 釓摻雜氧化鋅鋁透明導電薄膜特性分析. 國立中央大學化學工程與材料工程研究所碩士論文, 2009.
17. 楊孟璇, 低溫濺鍍非晶相ZnO:Al 薄膜之研究. 國立中山大學物理學系研究所碩士論文, 2009.
18. H.L. Hartnagel, A.K.J.a.C.J., Semiconducting Transparent Thin Film. 1995.
19. Dutta, M. and D. Basak, p-ZnO/n-Si heterojunction: Sol-gel fabrication, photoresponse properties, and transport mechanism. Applied Physics Letters, 2008. 92(21): p. 212112.
20. Dutta, M., T. Ghosh, and D. Basak, N Doping and Al-N Co-doping in Sol–Gel ZnO Films: Studies of Their Structural, Electrical, Optical, and Photoconductive Properties. Journal of Electronic Materials, 2009. 38(11): p. 2335-2342.
21. 楊明輝, 透明導電膜材料與成膜技術的新發展. 工業材料, 2002. 189: p. 161-174.
22. Morris, J.E., et al., Temperature dependence of Hall mobility in indium–tin oxide thin films. Journal of Applied Physics, 1980. 51(3): p. 1847.
23. Li, S.S., Semiconductor Physical Electronics. Springer; 2nd edition, 2006.
24. Quaas, M., Structural studies of ITO thin Rlms with the Rietveld method. Thin Solid Films, 1998. 332: p. 277-281.
25. Ghosh, R., G.K. Paul, and D. Basak, Effect of thermal annealing treatment on structural, electrical and optical properties of transparent sol–gel ZnO thin films. Materials Research Bulletin, 2005. 40(11): p. 1905-1914.
26. Nomura, K., et al., Carrier transport in transparent oxide semiconductor with intrinsic structural randomness probed using single-crystalline InGaO[sub 3](ZnO)[sub 5] films. Applied Physics Letters, 2004. 85(11): p. 1993.
27. ORITA, M., Amorphous transparent conductive oxide InGaO3(ZnO), (m < 4): a Zn4s conductor. PHILOSOPHICAL MAGAZINE B, 2001. Vol 81, No 5,: p. 501-515.
28. Manouni, A.E., et al., Effect of aluminium doping on zinc oxide thin films grown by spray pyrolysis. Superlattices and Microstructures, 2006. 39(1-4): p. 185-192.
29. Mridha, S. and D. Basak, Aluminium doped ZnO films: electrical, optical and photoresponse studies. Journal of Physics D: Applied Physics, 2007. 40(22): p. 6902-6907.
30. P. SAGAR, M.K., R.M. MEHRA, Electrical and optical properties of sol-gel derived ZnO:Al thin films. Materials Science-Poland, 2005. Vol. 23, No. 3: p. 685-696.
31. Yao, P.-C., et al., Optical and electrical characteristics of Al-doped ZnO thin films prepared by aqueous phase deposition. Applied Surface Science, 2010. 257(5): p. 1441-1448.
32. Wang, H., et al., Low temperature synthesis of sol–gel derived Al-doped ZnO thin films with rapid thermal annealing process. Journal of Materials Science: Materials in Electronics, 2009. 21(6): p. 589-594.
33. Tauc, J., Amorphous and Liquid Semiconductor,. Plenum Presss, New York, 1974: p. 159.
34. Hamberg, I., et al., Band-gap widening in heavily Sn-doped In2O3. Physical Review B, 1984. 30(6): p. 3240-3249.
35. Aghdaee, S.R., V. Soleimanian, and B. Tayebi, Effect of Al doping on the microstructural, optical and electrical properties of ZnO films. Superlattices and Microstructures, 2012. 51(1): p. 149-162.
36. Kim, Y.-S. and W.-P. Tai, Electrical and optical properties of Al-doped ZnO thin films by sol–gel process. Applied Surface Science, 2007. 253(11): p. 4911-4916.
37. Lin, J.-P. and J.-M. Wu, The effect of annealing processes on electronic properties of sol-gel derived Al-doped ZnO films. Applied Physics Letters, 2008. 92(13): p. 134103.
38. 蔡裕榮.周禮君, 以溶膠凝膠法製備透明導電氧化物薄膜的探討. CHEMISTRY (THE CHINESE CHEM. SOC., TAIPEI), 2002. Vol. 60, No. 3: p. 307~318.
39. E. Hosono, S.F., T. Kimura, H. Imai, non basic solution routes to prepare ZnO nanoparticals. J. Sol–Gel Sci. Technol., 2003. 29: p. 71-79.
40. 范凱雄, 氧化鋯鋅溶凝膠薄膜之製備及其在薄膜電晶體之應用研究. 逢甲大學材料科學與工程學系碩士論文, 2007.
41. Ohya, Y., et al., Microstructure of TiO2 and ZnO Films Fabricated by the Sol-Gel Method. Journal of the American Ceramic Society, 1996. 79(4): p. 825-830.
42. Liu, A., J. Zhang, and Q. Wang, Structural and Optical Properties of Zno Thin Films Prepared by Different Sol-Gel Processes. Chemical Engineering Communications, 2010. 198(4): p. 494-503.
43. O'Brien, S., L.H.K. Koh, and G.M. Crean, ZnO thin films prepared by a single step sol–gel process. Thin Solid Films, 2008. 516(7): p. 1391-1395.
44. Brian L. Cushing, V.L.K., and Charles J. O’Connor, Recent Advances in the Liquid-Phase Syntheses of Inorganic Nanoparticles. Chem. Rev., 2004. 104: p. 3893-3946.
45. Yoon, S.H., et al., Effect of chelating agents on the preferred orientation of ZnO films by sol-gel process. Journal of Materials Science, 2008. 43(18): p. 6177-6181.
46. Ohya, Y.S., H.; Takahashi, Y., Preparation of transparent, electrically conducting ZnO film from zinc acetate and alkoxide. Journal of Materials Science, 1994. vol. 29, no. 15: p. 4099-4103.
47. Kim, Y.-S., W.-P. Tai, and S.-J. Shu, Effect of preheating temperature on structural and optical properties of ZnO thin films by sol–gel process. Thin Solid Films, 2005. 491(1-2): p. 153-160.
48. 陳東煌, AZO透明導電膜之製備與特性分析. 成功大學化學系碩士論文, 2006.
49. Morosanu., C.E., Thin Films by Chemical Vapour Deposition. Elsevier, 1990.
50. Musat, V., et al., Effect of post-heat treatment on the electrical and optical properties of ZnO:Al thin films. Thin Solid Films, 2006. 502(1-2): p. 219-222.
51. Luna-Arredondo, E.J., et al., Indium-doped ZnO thin films deposited by the sol–gel technique. Thin Solid Films, 2005. 490(2): p. 132-136.
52. Li, J., et al., Effects of rapid thermal annealing in different ambients on structural, electrical, and optical properties of ZnO thin films by sol-gel method. Journal of Electroceramics, 2011. 26(1): p. 84-89.
53. Hwang, Y.H., S.-J. Seo, and B.-S. Bae, Fabrication and characterization of sol-gel-derived zinc oxide thin-film transistor. Journal of Materials Research, 2011. 25(04): p. 695-700.
54. Baik, S.J., et al., Highly textured and conductive undoped ZnO film using hydrogen post-treatment. Applied Physics Letters, 1997. 70(26): p. 3516-3518.
55. Oh, B.-Y., M.-C. Jeong, and J.-M. Myoung, Stabilization in electrical characteristics of hydrogen-annealed ZnO:Al films. Applied Surface Science, 2007. 253(17): p. 7157-7161.
56. Sagar, P., M. Kumar, and R.M. Mehra, Influence of hydrogen incorporation in sol-gel derived aluminum doped ZnO thin films. Thin Solid Films, 2005. 489(1-2): p. 94-98.
57. Huang, C., et al., Effects of hydrogen annealing on the structural, optical and electrical properties of indium-doped zinc oxide films. Journal of Materials Science: Materials in Electronics, 2010. 21(11): p. 1221-1227.
58. Van de Walle, C.G., Hydrogen as a Cause of Doping in Zinc Oxide. Physical Review Letters, 2000. 85(5): p. 1012-1015.
59. Yasuhiro Igasaki, H.S., The effects of zinc diffusion on the electrical and optical properties of ZnO:Al films prepared by r.f. reactive sputtering. Thin Solid Films, 1991. 199(2): p. 223-230.
60. Corning Eagle2000 material information.
61. A. JAIN, P.S., R. M. MEHRA, Changes of structural, optical and electrical properties of sol-gel derived ZnO films with their thickness. Materials Science-Poland, 2007. Vol. 25, No. 1: p. 233-242.
62. Pauw, L.J.v.d., A Method of Measuring Specific Resistivity and Hall Effect of Discs of Arbitrary Shapes. Philips Res. Repts., 1958. 13: p. 1-9.
63. Pauw, L.J.v.d., A Method of Measuring Specific Resistivity and Hall Coefficient on Lamellae of Arbitrary Shape. Philips Technical Review, 1958. 20: p. 220-224.
64. Kasap, S., Hall Effect in Semiconductors. caltech.edu courses, an e-Booklet. S. O. Kasap 1990-2001.
65. 王文杰, 無毒性溶膠凝膠之P及N型氧化鋅透明導電膜製程研究. 國立台灣大學電機資訊學院光電工程學研究所碩士論文, 2011.
66. 林麗娟, X光繞射原理及其應用. 工業材料, 民83. 86期(X光材料分析技術與應用專題): p. 100-109.
67. Alam, M.J. and D.C. Cameron, Preparation and properties of transparent conductive aluminum-doped zinc oxide thin films by sol–gel process. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2001. 19(4): p. 1642.
68. Tang, W. and D.C. Cameron, Aluminum-doped zinc oxide transparent conductors deposited by the sol-gel process. Thin Solid Films, 1994. 238: p. 83-87.
69. COSSEMENT, D. and J.-M. STREYDIO, FABRICATION OF ZnO POLYCRYSTALLINE LAYERS BY CHEMICAL SPRAY. Journal of Crystal Growth, 1985. 72: p. 57-60.
70. Demiryont, H., J.R. Sites, and a.K. Geib, Effects of oxygen content on the optical properties ofntantalum oxide films deposited by ion-beam sputtering. APPLIED OPTICS, 1985. Vol. 24, No. 4.
71. 羅丞曜, 銦鋅氧化膜基本特性及其與氮化鎵接觸應用之研究. 國立中央大學光電科學研究所碩士論文, 2001.
72. Kim, G.H., et al., Effect of indium composition ratio on solution-processed nanocrystalline InGaZnO thin film transistors. Applied Physics Letters, 2009. 94(23): p. 233501.
73. Kaleemulla, S., et al., Physical properties of In2O3 thin films prepared at various oxygen partial pressures. Journal of Alloys and Compounds, 2009. 479(1-2): p. 589-593.
74. Kumar, B., H. Gong, and R. Akkipeddi, High mobility undoped amorphous indium zinc oxide transparent thin films. Journal of Applied Physics, 2005. 98(7): p. 073703.
75. HONG, C., et al., Influence of the aluminum and indium concentrations on the electrical resistivity and transmittance properties of InAlZnO thin films. Journal of the Ceramic Society of Japan, 2009. Vol. 117 No. 1365: p. 566-569.
dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/64655-
dc.description.abstract本論文將介紹以溶膠凝膠方法製備N型氧化鋅透明導電膜製程,並探討摻雜物種類與摻雜濃度對氧化鋅透明導電膜之電學及光學特性的影響。
研究的目的在於藉由調變前驅溶液中的摻雜物濃度,以製備具有最低電阻率的氧化鋅透明導電膜,並利用各種量測方式,深入分析摻雜物在氧化鋅內引起的各種效應,以了解不同摻雜濃度在氧化鋅中造成電學與光學特性上變化的原因。
實驗共分為三大主題:摻鋁氧化鋅(AZO)、摻銦氧化鋅(IZO)以及鋁銦共摻雜氧化鋅(AIZO)。在摻鋁氧化鋅的部分中,氧化鋅經過0.67 at%的鋁摻雜可得到最佳的電性,電阻率、載子濃度和載子遷移率分別為1.78×〖10〗^(-2) Ωcm、2.92×〖10〗^19 〖cm〗^(-3)以及12.0〖cm〗^2/Vs,樣品在可見光區皆有高於80%的穿透度。
在摻銦氧化鋅的部分,則是在3.5 at%的銦摻雜下,氧化鋅可得到最佳電性,其電阻率、載子濃度和載子遷移率分別為1.51×〖10〗^(-2) Ωcm、3.25×〖10〗^19 〖cm〗^(-3)以及12.7〖cm〗^2/Vs,樣品在可見光區的穿透度最高可達85%以上。
鋁銦共摻雜氧化鋅的實驗中,在1.2 at%的銦和0.67 at%的鋁混合摻雜的情形下可得到最低之電阻率,其電阻率、載子濃度和載子遷移率分別為7.95×〖10〗^(-3) Ωcm、4.28×〖10〗^19 〖cm〗^(-3)以及18.3〖cm〗^2/Vs,在可見光區的穿透度皆可達到83%以上。
zh_TW
dc.description.abstractIn this study, we investigate the fabrication process to derive N-type ZnO transparent conductive thin films by sol-gel method and discuss the doping effect on ZnO films.
This investigation aims to produce solution-processed ZnO films with lowest resistivity by changing the composition of doping materials. In addition, we wish to realize the effect on electrical and optical properties brought by different doping composition in ZnO films.
There are three topics in the thesis:Aluminum-doped ZnO(AZO), Indium-doped ZnO and Aluminum-Indium co-doped ZnO.
For Aluminum-doped ZnO, resistivity reaches a minimum value at 0.67% Al doping concentration, with resistivity of 1.78×〖10〗^(-2) Ωcm, electron concentration of 2.92×〖10〗^19 〖cm〗^(-3), and carrier mobility of 12.0〖cm〗^2/Vs. For optical properties, all AZO samples exhibit more than 80% transparent in visible region.
For Indium -doped ZnO, resistivity reaches a minimum value at 3.5% In doping concentration, with resistivity of 1.51×〖10〗^(-2) Ωcm, electron concentration of 2.75×〖10〗^19 〖cm〗^(-3), and carrier mobility of 13.0〖cm〗^2/Vs. The IZO samples can reach over than 85% transparent in visible region.
For Aluminum-Indium co-doped ZnO, resistivity reaches a minimum value at AIZO film co-doped with 0.67% Al and 1.2 at%, with resistivity of 7.95×〖10〗^(-3) Ωcm, electron concentration of 4.28×〖10〗^19 〖cm〗^(-3), and carrier mobility of 18.3〖cm〗^2/Vs. All AIZO samples demonstrate more than 83% transparent in visible region.
en
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Previous issue date: 2012
en
dc.description.tableofcontents誌謝 i
中文摘要 ii
ABSTRACT iii
目錄 iv
圖目錄 vii
表目錄 x
第一章 緒論 1
1.1 前言 1
1.2 研究目的 2
第二章 理論基礎與文獻回顧 3
2.1 透明導電氧化物介紹 3
2.2 氧化鋅的基本性質 5
2.3 氧化鋅透明導電膜的導電機制 7
2.3.1 古典載子傳輸理論 7
2.3.2 影響氧化鋅導電率的因素 10
2.4 氧化鋅透明導電膜的光學性質 13
2.5 溶膠凝膠製備法(Sol-gel technique)介紹 16
2.5.1 前驅溶液的化學反應 16
2.5.2 前驅溶液的塗佈[38] 17
2.5.3 熱處理程序 19
第三章 實驗方法 21
3.1 前驅溶液的調配 21
3.2 基板的準備與清潔 21
3.3 塗佈方法 22
3.4 氧化鋅樣品的熱處理 24
3.5分析儀器及測量原理 24
3.5.1 凡得包量測原理 24
3.5.2 霍爾量測儀 26
3.5.3 紫外-可見光光譜儀(UV-Vis spectrophotometer) 30
3.5.4 X射線繞射儀(X-ray diffraction system, XRD) 31
3.5.5 X光光電子能譜儀(X-ray photoemission spectroscopy, XPS) 32
3.5.6 原子力顯微鏡(Atomic force microscope) 33
第四章 氧化鋁鋅(AZO)樣品分析與討論 35
4.1 霍爾電性量測結果 35
4.2 X射線繞射儀量測結果 37
4.3 原子力顯微鏡(AFM)量測結果 38
4.4 氧化鋁鋅(AZO)電性之分析與討論 40
4.5紫外-可見光光譜儀(UV-vis)量測結果 41
第五章 氧化銦鋅(IZO)樣品分析與討論 45
5.1 霍爾電性量測結果 45
5.2 X射線繞射儀量測結果 47
5.3 原子力顯微鏡(AFM)量測結果 48
5.4 X光光電子能譜儀(XPS)量測結果 50
5.5 氧化銦鋅(IZO)電性之分析與討論 52
5.6紫外-可見光光譜儀(UV-vis)量測結果 54
第六章 氧化鋁銦鋅(AIZO)樣品分析與討論 57
6.1 霍爾電性量測結果 57
6.1.1 不同濃度鋁與1.2 at%銦混合摻雜製備之AIZO電性比較 57
6.1.2 不同濃度銦與1 at%鋁混合摻雜製備之AIZO電性比較 57
6.2 X射線繞射儀量測結果 61
6.3 原子力顯微鏡(AFM)量測結果 63
6.4 氧化鋁銦鋅(AIZO)電性結果之分析與討論 64
6.5 紫外-可見光光譜儀(UV-vis)量測結果 66
第七章 總結與未來展望 69
7.1 總結 69
7.1.1電學性質 69
7.1.2結構特性 69
7.1.3光學特性 70
7.2 未來展望 70
參考文獻 71
dc.language.isozh-TW
dc.subject氧化銦鋅zh_TW
dc.subject溶膠凝膠zh_TW
dc.subject透明導電氧化物zh_TW
dc.subject氧化鋅zh_TW
dc.subject氧化鋁鋅zh_TW
dc.subjectsol-gelen
dc.subjectAl-doped ZnO(AZO)en
dc.subjectIn-doped ZnO(IZO)en
dc.subjectZinc oxide (ZnO)en
dc.subjecttransparent conductive oxideen
dc.title溶膠凝膠法製備鋁及銦摻雜之氧化鋅透明導電膜特性研究zh_TW
dc.titleAluminum and Indium-Doped Transparent Conductive Zinc-Oxide Thin Films Deposited by the Sol-Gel Methoden
dc.typeThesis
dc.date.schoolyear100-2
dc.description.degree碩士
dc.contributor.oralexamcommittee何志浩(Chih-Hao Ho),陳奕君(I-Chun Cheng)
dc.subject.keyword溶膠凝膠,透明導電氧化物,氧化鋅,氧化鋁鋅,氧化銦鋅,zh_TW
dc.subject.keywordsol-gel,transparent conductive oxide,Zinc oxide (ZnO),In-doped ZnO(IZO),Al-doped ZnO(AZO),en
dc.relation.page75
dc.rights.note有償授權
dc.date.accepted2012-08-10
dc.contributor.author-college電機資訊學院zh_TW
dc.contributor.author-dept光電工程學研究所zh_TW
顯示於系所單位:光電工程學研究所

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