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  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 光電工程學研究所
請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/61093
完整後設資料紀錄
DC 欄位值語言
dc.contributor.advisor李君浩(Jiun-Haw Lee)
dc.contributor.authorTian-You Chengen
dc.contributor.author鄭天佑zh_TW
dc.date.accessioned2021-06-16T10:46:03Z-
dc.date.available2014-08-20
dc.date.copyright2013-08-20
dc.date.issued2013
dc.date.submitted2013-08-12
dc.identifier.citationChapter 1
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Chapter 2
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Chapter 3
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Chapter 4
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dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/61093-
dc.description.abstract電漿子結構中,在其結構周圍的局部性強場所形成的特殊光學特性,通常用來增強螢光或散射訊號。然而,受限於光學顯微的限制,只有少數光學顯微技術擁由足夠的空間解析度,可直接觀測到場的分佈,固此特殊光學特性理論計算的研究很多,而實驗方面的分析缺十分的稀少。
本研究中,吾人以散射式近場光學顯微技術,直接觀察與分析電漿子結構中的特殊光學行為。散射式近場光學顯微鏡之架構以原子力顯微鏡為核心,藉由針尖與樣品間的電磁交互作用,將局部性的場訊號轉換為遠場的輻射訊號後被偵測分析,其橫向與縱向解析度分別可達 9 奈米與 10 奈米。藉由此散射式近場光學顯微鏡以及尖銳化的矽探針,吾人成功的觀測到間距為 10 奈米之奈米金粒子陣列的侷域光學特性。當中最特別的是,吾人觀察到在奈米金粒子的間隙中,被增強的侷域場訊號所形成的“熱點”以及其局域場方向皆成功的被觀測到,且由吾人所提出的所提出的電偶耦合模型來解釋這兩種特殊的近場特性。這個結果證明了散射式近場光學顯微鏡十分適合用以研究奈米尺度的光學特性,且預期有助於了解二維電漿子結構的光學特性,進而協助開發其在光學方面的應用。
zh_TW
dc.description.abstractAnomalous optical properties displayed by plasmonic structures are commonly attributed to the enhanced, local field within their corrugations. Though theoretical calculations of such field enhancements abound, experimental observations are relatively few, because only few optical microscopic techniques have enough spatial resolution. The scattering-type scanning near-field optical microscope (s-SNOM)—operating based on the electromagnetic interaction induced by a nanotip—transforms local field characteristics to far-field radiation for detection. The lateral resolution and vertical resolution of s-SNOM are 9 nm and 10 nm, respectively. The local optical characteristics of gold nanoparticle array with a gap of 10 nm between adjacent particles are resolved by s-SNOM with use of sharpened silicon tips. Specifically, the local, enhanced field—“hot spot”—is observed at the gap region and the local field direction is extracted as well. These two distinctive near-field traits are interpreted with a proposed dipole-coupling model. The findings corroborate that s-SNOM is a powerful analytical instrument to reveal optical characteristics in sub-10 nm scale and would be expectantly beneficial to the development of optical applications based on two-dimensional sub-wavelength plasmonic structures and their epistemological understanding.en
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Previous issue date: 2013
en
dc.description.tableofcontents口試委員審定書 i
致謝 ii
中文摘要 iii
Abstract iv
Table of contents v
List of figures viii
Chapter 1 Introduction 1
1.1 Near-field optics 2
1.2 Plasmonics 3
1.3 Near-field optical microscopy 5
1.4 Organization of thesis 6
Reference 8
Chapter 2 Principles of scattering-type near-field optical
microscopy 10
2.1 Electromagnetic interaction between a nano-tip and
a sample 11
2.1.1 Point-dipole model 11
2.1.2 More complicated models 13
2.1.2.1 Finite-dipole model 14
2.1.2.2 Extension to layered systems 17
2.1.3 Electrodynamic simulations 21
2.2 Extracting near-field optical traits 22
2.2.1 Extracting field amplitude and phase 23
2.2.2 Different detection modalities 25
2.2.2.1 Homodyne detection 25
2.2.2.2 Heterodyne detection 27
2.2.2.3 Pseudo-heterodyne detection 29
2.2.3 Background contribution 31
2.3 Summary 33
Reference 35
Chapter 3 Experimental implementation of scattering –type
scanning near-field optical microscopy 37
3.1 Instrument 37
3.1.1 Optical layout 38
3.1.2 Optical alignment 40
3.1.3 Considerations of AFM tip 42
3.2 Spatial resolution 46
3.3 Material contrast 48
3.4 Critical issues 50
3.4.1 Noise 50
3.4.2 Mitigating background interference 53
3.4.3 Imaging artifacts 54
3.5 Summary 56
Reference 57
Chapter 4 Near-field traits of two-dimensional plasmonic
Structure 58
4.1 Basics of surface plasmon polariton 58
4.2 SPP with periodic surface corrugations: hole and particle
arrays 63
4.2.1 Periodic nano-hole arrays 64
4.2.2 Periodic nano-particle array 67
4.3 Two-dimensional hexagonally-packed nanoparticle
arrays 68
4.3.1 Nanoparticle array grown in anodic aluminum oxide 70
4.3.2 Far-field optical characterization 72
4.3.3 Dipole-coupling model and electrodynamic
simulation 73
4.4 Near-field traits of two-dimensional hexagonal
close-packed Au nanoparticle arrays 79
4.4.1 Local field amplitude and phase arrays 79
4.4.2 Quasi-electrostatic dipole coupling model 83
4.5 Summary 86
Reference 88
Chapter 5 Near-field traits of two-dimensional
plasmonic structure 92
dc.language.isozh-TW
dc.subject近場zh_TW
dc.subject氧化鋁週期結構zh_TW
dc.subject熱點zh_TW
dc.subject奈米粒子zh_TW
dc.subject電漿子zh_TW
dc.subject散射式近場光學顯微鏡zh_TW
dc.subjecthot spoten
dc.subjectAAOen
dc.subjectnanoparticleen
dc.subjects-SNOMen
dc.subjectPlasmonen
dc.subjectnear-fielden
dc.title散射式近場光學顯微鏡對奈米金粒子陣列之研究zh_TW
dc.titleScrutinizing Au nanoparticle arrays with scattering-type scanning near-field optical microscopyen
dc.typeThesis
dc.date.schoolyear101-2
dc.description.degree博士
dc.contributor.coadvisor王玉麟(Yuh-Lin Wang)
dc.contributor.oralexamcommittee魏培坤(Pei-Kuen Wei),王俊凱(Juen-Kai Wang),朱仁佑(Jen-Yu Chu),張宏鈞(Hung-chun Chang)
dc.subject.keyword電漿子,熱點,奈米粒子,氧化鋁週期結構,近場,散射式近場光學顯微鏡,zh_TW
dc.subject.keywordPlasmon,hot spot,nanoparticle,AAO,near-field,s-SNOM,en
dc.relation.page93
dc.rights.note有償授權
dc.date.accepted2013-08-12
dc.contributor.author-college電機資訊學院zh_TW
dc.contributor.author-dept光電工程學研究所zh_TW
顯示於系所單位:光電工程學研究所

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