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  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 電子工程學研究所
請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/60496
完整後設資料紀錄
DC 欄位值語言
dc.contributor.advisor黃鐘揚
dc.contributor.authorLing-Ya Nien
dc.contributor.author倪鈴雅zh_TW
dc.date.accessioned2021-06-16T10:19:46Z-
dc.date.available2013-08-22
dc.date.copyright2013-08-22
dc.date.issued2013
dc.date.submitted2013-08-16
dc.identifier.citation[1] P. Rashinkar, P. Paterson, and L. Singh, System-on-a-Chip Verification: Methodology and Techniques. Boston, MA: Kluwer, 2000.
[2] David M. Anderson, Design for Manufacturability & Concurrent Engineering: How to Design for Low Cost, Design in High Quality, Design for Lean Manufacture, and Design Quickly for Fast Production. CIM Press, 2010.
[3] D. Thomas and P. Moorby, The VerilogR Hardware Description Language, volume 2. Springer, 2002.
[4] M. Abromovici, P. R. Menon, and D. T. Miller, “Critical Path Tracing - An Alternative to Fault Simulation”, Proc. Design Automation Conference, pp. 214-220, 1983.
[5] S.-Y. Huang and K.-T. Cheng, “ErrorTracer: A Fault Simulation Based Approach to Design Error Diagnosis,” IEEE Trans. Computer-Aided Design, pp. 1341-1352, 1999.
[6] S.-Y. Huang, “A fading algorithm for sequential fault diagnosis,” in Proc. DFT VLSI Syst., 2004, pp. 139–147.
[7] S. Huang and K. Cheng, “Formal Equivalence Checking and Design Debugging,” Kluwer Academic Publisher, 1998.
[8] A. Smith, A. Veneris, M. F. Ali, and A. Viglas, “Fault diagnosis and logic debugging using Boolean satisfiability,” IEEE Trans. Comput.-Aided Design, vol. 24, no. 10, pp. 1606–1621, Oct. 2005.
[9] A. Veneris and I.N. Hajj, “Design Error Diagnosis and Correction via Test Error Simulation”, IEEE Trans. on CAD of Integrated Circuits and Systems, vol. 18, no 12, Dec. 1999 pp. 1803 -1816
[10] Y. Chen, S. Safarpour, J. Marques-Silva, and A. Veneris,“Automated design debugging with maximum satisfiability,” IEEE Trans. on CAD, vol. 29, pp. 1804–1817, November 2010.
[11] S. Safarpour and A. Veneris, “Automated design debugging with abstraction and refinement,” IEEE Trans. on CAD, vol. 28, no. 10, pp. 1597–1608, 2009.
[12] B. Keng and A. Veneris, “Managing complexity in design debugging with sequential abstraction and refinement,” in ASP Design Automation Conf., 2011, pp. 479–484.
[13] B. Keng, S. Safarpour, and A. Veneris, “Bounded model debugging,” IEEE Trans. CAD of ICs and Systems, vol. 29, no. 11, 2010.
[14] B. Keng and A. Veneris, “Scaling VLSI design debugging with interpolation,” in Proc. Formal Methods CAD, 2009, pp. 144–151.
[15] H. Mangassarian, A. Veneris, D. E.Smith, and S. Safarpour, “Debugging with dominance: On-the-fly debug solution implications,” in Int’l Conf. on CAD, 2011.
[16] H. Mangassarian, A. Veneris, and M. Benedetti, “Robust QBF encodings for sequential circuits with applications to verification, debug, and test,” IEEE Trans. on Computers, vol. 59, no. 7, pp. 981–994, 2010.
[17] M.H. Moskewicz, C. F. Madigan, Y. Zhao, L. Zhang and S. Malik, “Chaff: Engineering an Efficient SAT Solver,” in Proc. of DAC, pp. 530-535, 2001.
[18] J. P. M.-Silva and K. A. Sakallah, “GRASP –A Search Algorithm for Propositional Satisfiability,” in IEEE Trans. on Computers, vol. 48, no. 5, pp. 506-521, May 1999.
[19] S. Graf and H. Sa‥ıdi, “Construction of abstract state graphs with pvs,” In Computer aided verification, pages 72–83.Springer, 1997.
[20] VIS Verification Benchmarks.
http://vlsi.colorado.edu/vis/.
dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/60496-
dc.description.abstract給定一個錯誤的暫存器轉換階層設計以及一條顯示設計與規格不符的錯誤軌跡,自動除錯技術藉由此錯誤軌跡與暫存器轉換階層設計中模擬的結果,找出在暫存器轉換階層設計中可能的錯誤根源。值得注意的是,在現今極端複雜的超大積體電路設計中,幾乎不可能不利用自動化技術來進行除錯。如此,自動除錯技術在設計能否成功被完成中扮演著很重要的腳色。然而,這些自動除錯工具實際上並沒有如預期的受歡迎。最主要的原因是這些自動除錯工具產生極大量的可能錯誤根源,使得工程師必須花費大量的時間過濾這些可能錯誤根源。更糟糕的是,自動除錯工具所找到的可能錯誤根源大部分都是位於合成後的電路上,要從這些在合成後電路上的可能錯誤根源推論出暫存器轉換階層設計中的錯誤,對工程師而言相當費時。為了解決這個問題,我們提出一個自動暫存器轉換階層設計除錯演算法,這個演算法作用在基於有限狀態機的錯誤模型中。我們並沒有在合成後的電路上找尋可能錯誤根源,而是將可能發生在暫存器轉換階層設計上的錯誤,依照這些錯誤在其有限狀態機上的錯誤加以分類。這些可能錯誤根源能夠直接對應到原始的暫存器轉換階層程式碼中。實驗結果顯示,藉由我們的有限狀態基錯誤模型,我們的演算法能夠有效地在少數可能錯誤根源中偵測出真正的錯誤。zh_TW
dc.description.abstractGiven an erroneous RTL design and an error trace that demonstrates a mismatch between the specification and the design, automated design debugging techniques utilize this error trace and its simulation values on the circuit netlist to identify the potential error locations in the RTL design. Notably, with the extreme high complexity of modern VLSI designs, it is virtually impossible to debug the designs without the help of automated algorithms. Therefore, automated design debugging plays a very important role in ensuring the successful design sign-off. However, in reality these automated debugging tools are not as popular as they should be. The main reason is because they are notorious for generating results with a huge number of error candidates. Consequently, designers have to spend a very long time to screen out the spurious error candidates manually. What is worse, as the error candidates are mostly annotated on the circuit netlist, it is also very time-consuming for the designers to figure out the actual causes of the error on the original RTL design by tracing the error locations in the circuit implementation. To conquer these problems, we propose an automated RTL debugging algorithm that works on the FSM-based error models. Instead of representing the error candidates in a circuit implementation, we classify the potential errors of a RTL design by considering different error scenarios on its corresponding finite-state machine model. These error candidates can then be directly mapped to error locations in the original RTL code. The experimental results show that our algorithm is able to effectively identify the actual errors among a small number of error candidates with our finite-state machine error model.en
dc.description.provenanceMade available in DSpace on 2021-06-16T10:19:46Z (GMT). No. of bitstreams: 1
ntu-102-R00943082-1.pdf: 1928727 bytes, checksum: 12e1a998f3d92f1d7afb75c53da41d07 (MD5)
Previous issue date: 2013
en
dc.description.tableofcontents口試委員會審定書 #
誌謝 i
中文摘要 ii
ABSTRACT iii
CONTENTS iv
LIST OF FIGURES vi
LIST OF TABLES viii
Chapter 1 Introduction 1
1.1 Related Works 2
1.2 Contributions of this Thesis 5
1.3 Organization of this Thesis 6
Chapter 2 Preliminaries 7
2.1 Finite-state Machine 7
2.2 Functional Debugging 7
2.3 Correction Model to Circuit Implementation 8
2.4 Boolean Satisfiability and Circuit Satisfiability 9
2.5 SAT-based Functional Debugging 10
Chapter 3 Proposed FSM-based error models 11
3.1 The Erroneous Triggering Condition Error Model 11
3.2 Missing Transition Error Model 12
3.3 Erroneous State Value Error Model 13
Chapter 4 Main Algorithms 15
4.1 Algorithm Overview 15
4.2 Extracting FSM of RTL Design 17
4.3 FSM-based Correction Model 21
4.4 RTL Design Debugging Using Error Models 23
4.4.1 Debugging Using Erroneous Triggering Condition Error Model 25
4.4.2 Debugging Using Missing Transition Error Model 27
4.4.3 Debugging Using Erroneous State Value Error Model 29
Chapter 5 Experiments 32
5.1 Experiment Description 32
5.2 Experimental Results 32
5.2.1 Erroneous Triggering Condition Error Model 33
5.2.2 Missing Transition Error Model 34
5.2.3 Erroneous State Value Error Model 34
5.2.4 Candidate Dropping 35
Chapter 6 Conclusions and Future Work 39
REFERENCE 40
dc.language.isoen
dc.subject暫存器轉換階層設計zh_TW
dc.subject有限狀態機錯誤模型zh_TW
dc.subject除錯zh_TW
dc.subjectRTL designen
dc.subjectdebuggingen
dc.subjectFSM-based error modelen
dc.title基於FSM錯誤模型所開發之RTL Design除錯技術zh_TW
dc.titleRTL Design Debugging Techniques for FSM-based Error Modelsen
dc.typeThesis
dc.date.schoolyear101-2
dc.description.degree碩士
dc.contributor.oralexamcommittee李建模,顏嘉志
dc.subject.keyword暫存器轉換階層設計,除錯,有限狀態機錯誤模型,zh_TW
dc.subject.keywordRTL design,debugging,FSM-based error model,en
dc.relation.page42
dc.rights.note有償授權
dc.date.accepted2013-08-16
dc.contributor.author-college電機資訊學院zh_TW
dc.contributor.author-dept電子工程學研究所zh_TW
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