摺紙式紙光偵測器

Abstract

本文中，我們藉由網絲網印技術在紙基板上製作出氧化鋅陣列光偵測器，並結合三浦摺疊折紙結構，成就超高可撓的摺紙式紙光偵測器。 在實驗中，我們呈現了紙光感測器的超高伸縮(伸縮高達1000%)特性、可彎曲(彎曲角度> 30度)特性以及可扭轉特性(扭轉高達360度)。除此之外，即使在高達85度的光入射角下，紙光偵測器在低伸縮狀態(伸縮從0%到500%)的光暗電流比變化幅度相當的小(從-20%到-40%)，相比於高伸縮狀態(從500%到1000%)有很好的全向廣角量測特性。三浦折紙結構式的氧化鋅陣列紙光偵測器也具有高穩定及耐久性，我們分別對其做了400次週期性的伸縮、彎曲以及扭轉測試，顯示了紙光偵測器的高穩定度。在實際應用上，我們也量測了不同大小的光源，曲面以及不平坦表面，顯示超高可撓紙光偵測器良好的環境適應性。 這裡提出結合紙基板、折紙及氧化鋅陣列的新策略，將可進一步促進紙上電子元件以及超高可撓元件的發展。

ZnO UV photodetector (PD) arrays based on paper using screen printed methods and Miura-origami (Miura-ori) technology exhibit ultra-high stretchable (strain: up to 1000%), bendable (bending angle: >30°) and twistable (twist angle: up to 360°) properties. Compared to under high strain (>500%), the AOI-dependent variation of PDCR is small (from -20% to -40%) under low strain (from 0% to 500%) even at the largest angle of incidence (85°), showing the ultra-high omnidirectional property. Moreover, ultra-stable performance of paper-based ZnO UV PD arrays with Miura-ori structures was measured even after 400-cycle stretching, bending and twisting processes, respectively, showing the outstanding capability for various practical conditions such as different size of light sources, various curve and uneven surfaces. Via the fusion of paper substrates, origami methods and ZnO UV PD unite cells, the strategy described here opens avenues to develop paper-based PDs with low-cost for the next-generation deformable optoelectronic applications.