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http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/57289| 標題: | 使用反射式三天線法量測天線增益及散射特性 Antenna Gain and Scattering Measurements Using Reflection-Type Three Antenna Method |
| 作者: | Yi-Chang Du 杜奕漳 |
| 指導教授: | 瞿大雄 |
| 關鍵字: | 天線量測,反射式三天線法, antenna measurement,reflection-type three antenna method, |
| 出版年 : | 2014 |
| 學位: | 碩士 |
| 摘要: | 本論文結合三天線法及天線散射矩陣建立反射式三天線法,用以量測天線增益及結構散射特性,並利用於不同天線距離所量測之資料,計算發射天線與接收天線相位中心間之距離。在量測上,包含撰寫電腦程式,建立使用者人機介面,記錄網路分析儀量測之單埠反射係數,並從量測之反射係數求得各天線之增益及結構散射特性,並將量測結果與穿透式三天線法予以比較。 In this thesis, a reflection-type three antenna method is to combine the concepts of three antenna method and antenna scattering matrix to measure the antenna gain and its structural scattering characteristics. The path lengths between the transmitting and receiving antennas can be calculated from the measured data at two different distances. In the measurement, a man-machine interface is written in Visual Basic language to record the measured data from the VNA, then each antenna gain and its structural scattering characteristics can be calculated from the measured data. In addition, the measurement results are compared with the results using the transmission-type three antenna method. |
| URI: | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/57289 |
| 全文授權: | 有償授權 |
| 顯示於系所單位: | 電信工程學研究所 |
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| ntu-103-1.pdf 未授權公開取用 | 5.23 MB | Adobe PDF |
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