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完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.advisor | 黃崇興(Chung-Hsing Huang) | |
dc.contributor.author | Shu-Kai Hsu | en |
dc.contributor.author | 許書凱 | zh_TW |
dc.date.accessioned | 2021-06-16T02:27:55Z | - |
dc.date.available | 2020-08-31 | |
dc.date.copyright | 2015-08-31 | |
dc.date.issued | 2015 | |
dc.date.submitted | 2015-08-03 | |
dc.identifier.citation | 一、中文部分
1. 柯煇耀,可靠度保證–工程與管理技術之應用,中華民國品質學會,1997。 2. 王宗華,可靠度工程與管理,中華民國品質學會,2010。 3. 柯煇耀,壽命驗證與評估-加速壽命試驗技術之應用,科技圖書股份有限公司,2012。 4. 賴耿陽,產品壽命管制技術,復漢出版社,1988。 二、英文部分 1. GM quarterly financial report SEC 10-Q on 2014/07/24 2. Rosin, P.; Rammler, E., The Laws Governing the Fineness of Powdered Coal, Journal of the Institute of Fuel 7: 29–36, 1933. 3. Weibull W., A statistical distribution function of wide applicability. J. Appl. Mech. 18:293-7, 1951. 4. Wallace R. Blischke, D. N. Prabhakar Murthy, Reliability:Modeling, Prediction, and Optimization. WILEY, 2000. 5. D. N. Prabhakar Murthy, Min Xie, Renyan Jiang, Weibull Models. WILEY, 2003. 6. Wallace R. Blischke, D. N. Prabhakar Murthy, Case Studies in Reliability and Maintenance, WILEY, 2002. 7. U.S. Department of Defense, Military Handbook, Reliability Prediction of Electronic Equipment, MIL-HDBK-217F, 1991. 8. R. Yang and J. T. Kim, 'Temperature accelerated life test(ALT) at the circuit board level,' IEEE/CPMT Elect Manufacturing Technology Symposium, Texas, 1995, pp. 158-165 9. Singiresu S. Rao, Reliability-Based Design, McGraw-Hill, 1993. 10. Nelson, W., Accelerated Testing:Statistical Models, Test Plans, and Data Analysis, John Wiley & Sons, 1990. 11. Aitkin, M. and Clayton, D., The fitting of exponential, Weibull and extreme value distributions to complex censored survival data using GLIM, Appl. Statist., 29(2), 156-163, 1980. 三、網頁部分 1. Strategy Analytics: https://www.strategyanalytics.com/ 2. 拓墣產業研究所: http://www.topology.com.tw/tri/ 3. EETimes: http://www.eetimes.com/ 4. ITRI: http://www.itri.org.tw/ 5. ARTC: http://www.artc.org.tw/ 6. Wikipedia: http://www.wikipedia.org/ | |
dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/53702 | - |
dc.description.abstract | 近年因應石油危機、地球暖化,節能與環保議題愈被重視。且隨著高齡化社會的到來,高齡人口照護及交通擁擠問題,為了改善交通安全及運輸效率,達到環保、節能、舒適、安全、減輕環境負擔的交通環境,使得車輛朝向智慧化、數位化、電子控制化、人性化發展。
Strategy Analytics指出,全球汽車電子產值將由2013年的1975億美元成長至2015年的2388億美元。根據拓墣產業研究所預估,至2020年前都將維持平均8.5%的複合年均成長率(CAGR)。全球IT業者都在為低毛利傷透腦筋,汽車電子產品的巨大商機,讓大家紛紛積極布局發展汽車電子產品,希望將汽車產業發展成為繼3C(電腦Computer、消費電子Consumer electronics、通訊設備Communication devices)之後的第四個C(Car)產業。 相較於3C電子產品,汽車的單價高出許多。再者車輛承載至少一名人員,任何汽車電子零組件造成的失效,所引致的生命、財產損失,遠高於3C電子產品。因此,汽車電子產業對品質的要求也遠高於3C電子產品。由於汽車生命週期長,車廠要求汽車電子產品供應商要能滿足長期供貨(Longevity support)的要求。原本3C電子產品供應商的短期大量製造生產出貨,以經濟規模降低成本的獲利模式,在汽車電子產業不一定適用。 當一個3C電子產品供應商,欲進入汽車電子產業,如何評估失效成本,如何估計產品壽命以符合客戶要求是一個課題。本研究以韋伯分布及加速壽命實驗來評估一個汽車電子產品的壽命,並討論個案W公司汽車電子事業處由後裝AM產品供應商轉型成前裝OEM供應商的過程中,如何改善品質以符合汽車電子高品質要求的經驗。期能作為同業在從事汽車電子產業之參考,藉此改善設計與流程,以符合汽車電子產業之高品質要求,提升產業之國際競爭力。 | zh_TW |
dc.description.abstract | Recently due to oil crisis and global warming, energy saving and environmental issues receive much more attentions. In order to improve traffic safety and transportation efficiency, and to build an traffic environment which is environmental friendly, energy saving, comfortable, safe and with reduced environmental loading, vehicle is developed to be smart, digital, electronic controlled, ergonomic.
Strategy Analytics points out, the global annual value of automotive electronics products will increase to 238.8 billion USD in 2015 from 197.5 billion USD in 2013. According to estimation by TRI (Topology Research Institute), automotive electronics industry will keep CAGR(Compound Annual Growth Rate) to be around 8.5% by 2020. The big opportunity of automotive electronics products attracts global IT vendors which suffer from low gross margin. IT vendors aggressively entry automotive electronics industry, and hope automotive electronics products will be 4th C industry after previous 3C (Computer, Consumer electronics, Communication). Compared to 3C products, the unit price of a car is much higher. And a vehicle carries more than one passenger; any malfunction results from defect of electronic component in a car will lead to much higher life and monetary loss than 3C products. Hence the quality requirement of automotive electronics industry is much higher than 3C electronics industry. In addition, due to long life time of a vehicle, car makers ask suppliers to provide longevity support. The profit model of 3C electronics products vendors, economy of scale to lower cost by mass production and shipment in a short period, may not be applicable in automotive electronics industry. If a 3C electronics products vendor would like to entry automotive electronics industry, how to evaluate failure cost and product life time to meet customer’s requirement should be important topics for the new entry vendor. This study simulates the life time based on Weibull distribution and accelerated life time test. And this study investigates the quality improvement experience of automotive electronics business unit of W-company, which is transformed from an AM supplier to an OEM supplier. It’s expected that this study can be a reference to other automotive electronics manufacturer in Taiwan for improving the design and process to meet the high quality requirement. And the industry would be upgraded to fight against world competition. | en |
dc.description.provenance | Made available in DSpace on 2021-06-16T02:27:55Z (GMT). No. of bitstreams: 1 ntu-104-P97748013-1.pdf: 3480587 bytes, checksum: 63231ddf9d75108b0d37476bbde97d60 (MD5) Previous issue date: 2015 | en |
dc.description.tableofcontents | 誌 謝 ii
中文摘要 iii THESIS ABSTRACT iv 目 錄 vi 圖目錄 viii 表目錄 ix 第一章 緒 論 1 第一節、研究背景與動機 1 第二節、研究目的 2 第三節、研究範圍 2 第四節、論文結構 3 第二章 文 獻 探 討 4 第一節、 失效時間與機率密度函數 4 第二節、 韋伯分布 8 第三節、浴缸曲線(bathtub curve) 11 第四節、亞瑞尼斯方程式(Arrhenius equation) 13 第五節、汽車電子產業特性 15 第三章 研 究 方 法 25 第一節、研究架構 25 第二節、研究方法 26 第三節、研究對象及資料收集 26 第四節、研究限制 27 第四章 汽車電子產品壽命推估與分析 28 第一節、個案W公司 28 第二節、加速壽命實驗 31 第三節、建立失效模型 32 第三節、刪減的作法 36 第四節、綜合分析討論 38 第五章 結 論 與 建 議 41 第一節、研究結論與建議 41 第二節、未來研究方向 42 參考文獻 44 一、中文部分 44 二、英文部分 44 三、網頁部分 45 | |
dc.language.iso | zh-TW | |
dc.title | 以韋伯分布與加速壽命實驗評估汽車電子產品的壽命 | zh_TW |
dc.title | Using Weibull Distribution and Accelerated Life Time Test to Evaluate Life Time of an Automotive Electronic Product | en |
dc.type | Thesis | |
dc.date.schoolyear | 103-2 | |
dc.description.degree | 碩士 | |
dc.contributor.oralexamcommittee | 葉明義(Ming-Yih Yeh),謝銘元(Ming-Yuan Hsieh) | |
dc.subject.keyword | 汽車電子,失效函數,產品壽命,韋伯分布,亞瑞尼斯方程式, | zh_TW |
dc.subject.keyword | Automotive industry,Failure function,Product Lifetime,Weibull distribution,Arrhenius equation, | en |
dc.relation.page | 45 | |
dc.rights.note | 有償授權 | |
dc.date.accepted | 2015-08-03 | |
dc.contributor.author-college | 管理學院 | zh_TW |
dc.contributor.author-dept | 商學組 | zh_TW |
顯示於系所單位: | 商學組 |
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