請用此 Handle URI 來引用此文件:
http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/47079
標題: | 近場電漿子菲涅耳波帶片的數值分析與實驗量測 Numerical Study and Experimental Measurement of Near-field Plasmonic Fresnel Zone Plate |
作者: | Yao-Jen Tsai 蔡耀仁 |
指導教授: | 李佳翰(Jia-han Li) |
關鍵字: | 繞射極限,菲涅耳波帶片,角頻譜表示法,近場光學顯微儀,共軛焦顯微鏡,電漿子學, diffraction limit,Fresnel zone plate,angular spectrum representation,scanning near-field optical microscopy,confocal microscopy,plasmonics, |
出版年 : | 2010 |
學位: | 碩士 |
摘要: | 近年來無論在光學影像或奈米微影的領域上,如何突破繞射極限已成為一個重要的議題。在此我們利用三維時域有限差分法模擬設計了一個具有突破繞射極限的銀奈米結構菲涅耳波帶片,並利用角頻譜法分析此結構聚焦面的光場分佈,模擬分析後,發現消逝波在此聚焦面也有貢獻以致聚焦光點可以突破繞射極限。隨後我們利用聚焦離子束顯微鏡製作銀奈米結構菲涅耳波帶片,並用近場光學顯微鏡與共軛焦顯微鏡量測它的聚焦面,探討銀奈米結構菲涅耳波帶片在近場和遠場觀察之光學聚焦的行為。 In recent years, how to break down the diffraction limit has become a significantly research issue in optical images and nano-lithography. We use three- dimensional finite-difference time-domain method to simulate the silver Fresnel zone plate nanostructures that breaks the diffraction limit in the focal plane. Utilizing the angular spectrum representation to analyze the light field distribution in the focal plane, we found that the evanescent waves has the contribution in the focal plane and result in breaking down the diffraction limit. We use the focused ion beam to fabricate the silver Fresnel zone plate and measure the field intensity in the focal plane by scanning near-field optical microscopy and confocal microscopy. The focusing behavior of silver Fresnel zone plate is observed in near-field and far-field. |
URI: | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/47079 |
全文授權: | 有償授權 |
顯示於系所單位: | 工程科學及海洋工程學系 |
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