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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 馮哲川 | |
| dc.contributor.author | You-Ren Lan | en |
| dc.contributor.author | 藍右任 | zh_TW |
| dc.date.accessioned | 2021-06-15T04:47:21Z | - |
| dc.date.available | 2013-08-12 | |
| dc.date.copyright | 2010-08-12 | |
| dc.date.issued | 2010 | |
| dc.date.submitted | 2010-08-04 | |
| dc.identifier.citation | [1.1] http://old-www.ansto.gov.au/natfac/asrp4.html
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| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/45852 | - |
| dc.description.abstract | 同步加速器光源是二十一尖端科學研究不可或缺的實驗工具，廣泛應用在材料、生物、醫藥、物理、化學、化工、物質、能源、電子、奈米元件等基礎與應用科學研究。光學量測對於分析半導體材料具有很重要的地位，尤其是對於材料的結構、特性，甚至是物理機制。而近幾年的半導體材料，由於它的材料特性非常適合應用在現今生活的電器設備用品上，譬如：發光二極體、積體電路原件…等，所以被廣泛而且深入的研究，縱使已經有不少上市產品應用半導體為材料，但是仍然有許多的問題與困難需要解答與突破，因此，我們將針對目前的許多挑戰做研究。
我們會利用各種不同的光學量測系統得到更多的材料特性，進而得出相互驗證的結果。在第三章，我們利用不同的分析技術來研究有機金屬化學氣相沈積磊晶法生長的氧化鋅鎂的結構特性以及電子組態。我們利用X光光電子能譜術以及同步輻射X光吸收光源精細結構頻譜圖來分析不同鎂含量的氧化鋅鎂，接著再利用X光繞射光譜以及拉曼光譜來佐證我的分析結果。在第四章，我們利用X光光電子能譜術，拉塞福背向散射，同步輻射X光吸收光源精細結構頻譜圖以及掠角X光繞射光譜分析不同生長條件的奈米材料二氧化鉿薄膜生長在矽基板上面的結構以及光學特性。我們在第五章中把重點放在銻磷化銦以氣態源分子束磊晶技術生長在砷化銦基板上，我們利用X光光電子能譜術以及同步輻射X光吸收光源精細結構頻譜圖來分析銻磷化銦的特性。 | zh_TW |
| dc.description.abstract | During the past decade, synchrotron light sources have become indispensable tools for advanced scientific research. Synchrotron light is used widely in basic and applied research throughout the fields of materials science, biology, medicine, physics, chemistry, chemical engineering, geology, energy, electronics, and nanotechnology. A series of optical characterization techniques, including X-ray absorption spectroscopy (XAS), X-ray Photoelectron Spectroscopy (XPS), Raman scattering, and X-ray diffraction (XRD) were employed to analyze II-VI and III-V compound semiconductors.
In chapter 3, we study the structural and electrical properties of MgxZn1-xO materials with wurtzite structure grown on sapphire substrate by Metal-Organic Chemical Vapor Deposition (MOCVD). MgxZn1-xO samples with different composition ratios were analyzed by various characterization techniques, including XPS, Synchrotron Radiation (SR) X-ray absorption fine structure (XAFS), XRD, and Raman scattering. We investigate on the structural and optical characteristics of nanometer scale HfO2 thin film materials epitaxied on Si substrates with different growth condition, by XPS, Rutherford back-scattering (RBS), SR-XAFS, and grazing incidence x-ray diffraction (GIXRD) in chapter 4. In chapter 5, it is focused on the InAsPSb thick epitaxial films grown on GaAs substrate by gas source molecular beam epitaxy (GSMBE). InAsPSb samples with different growth condition were investigated by XPS and SR-XAFS. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-15T04:47:21Z (GMT). No. of bitstreams: 1 ntu-99-R97941090-1.pdf: 3451259 bytes, checksum: 45ab15ba1afe78d7133b505c096726b9 (MD5) Previous issue date: 2010 | en |
| dc.description.tableofcontents | 致謝................................................................................................................................i
摘要...............................................................................................................................ii Abstract...........................................................................................................................iii Content.............................................................................................................................v Lists of Figures................................................................................................................ix Lists of Tables..............................................................................................................xvii Chapter 1 Introduction 1.1. What is Synchrotron Radiation?................................................................1 1.2. History of X-ray Sources..........................................................................2 1.3. Generation of Synchrotron Radiation Sources.........................................3 1.4. The Properties of Synchrotron Radiation................................................4 1.5. How is Synchrotron Light Produced?.......................................................5 1.6. Publication list..............................................7 References.................................................................................................................8 Chapter 2 Theoretical Background and Experimental Details 2.1 X-Ray Absorption Fine-Structure (XAFS)........................................9 2.1.1 X-ray absorption spectroscopy: principle and analysis...............9 2.1.2 X-ray Absorption Near Edge Structure (XANES)......................15 2.1.3 Extended X-ray Absorption Fine Structure (EXAFS)..............17 2.1.4 Polarized-dependence X-ray absorption fine structure.............21 2.2 X-ray Photoelectron Spectrometry (XPS)..............................................22 2.2.1 Introduction....................................................................................22 2.2.2 Spectral Features of XPS: Chemical Shifts.................................24 2.2.3 Spectral Features of XPS Doublet and Multiplet Splitting........25 2.2.4 The Application of XPS: Analysis of the Composition…........26 References...............................................................................................................28 Chapter 3 Investigations of MgZnO thin film materials on sapphire 3.1 Introduction...............................................................................................30 3.2 Experiment.................................................................................................32 3.3 Result and Discussion................................................................................35 3.3.1 X-ray Photoelectron Spectrometry (XPS).................................35 3.3.2 X-Ray Absorption Fine-Structure (XAFS).................................42 a. Extended X-ray Absorption Fine Structure (EXAFS)............42 b. X-ray Absorption Near Edge Structure (XANES).................48 3.3.3 X-ray Diffraction XRD(XRD)......................................................54 3.3.4 Raman scattering...........................................................................55 3.4 Conclusion..................................................................................................57 References..............................................................................................................59 Chapter 4 Investigations of HfO2 thin film on Si-based 4.1 Introduction...............................................................................................63 4.2 Experiment.................................................................................................64 4.3 Result and Discussion..........................................................................66 4.3.1 X-ray Photoelectron Spectrometry (XPS).................................66 4.3.2 Rutherford backscattering (RBS)................................................71 4.3.3 X-ray Absorption Near Edge Structure (XANES).................74 4.3.4 Grazing Incidence X-ray Diffraction (GIXRD)..........................78 4.3.5 High-resolution Transmission Electron Microscopy (HR-TEM).....................................................................................84 4.4 Conclusion........................................................................................85 References...............................................................................................................86 Chapter 5 Investigations of InAsPSb epitaxial materials on GaAs from molecular beam epitaxy 5.1 Introduction..............................................................................................89 5.2 Experiment.................................................................................................90 5.3 Result and Discussion................................................................................92 5.3.1 X-ray Photoelectron Spectrometry (XPS).................................92 5.3.2 Extended X-ray Absorption Fine Structure (EXAFS)...........98 5.4 Summary..................................................................................................104 References.............................................................................................................105 Chapter 6 Investigation on other materials 6.1 AlZnO...........................................................107 6.1.1 Introduction...................................................107 6.1.2 Experiment.....................................................108 6.1.3 Result and Discussion............................................109 a. Near Edge X-ray Absorption Spectroscopy (NEXAFS).........109 b. Raman scattering..................................................112 6.1.4 Summary........................................................115 6.2 InGaN/GaN/ZnO....................................................116 6.2.1 Sample information........................................................116 6.2.2 Result.....................................................116 6.3 Tb:SiO2......................................................118 6.3.1 Sample information......................................................118 6.3.2 Result..............................................................119 6.4 PbZrxTi1-xO3.................................................................................................127 6.4.1 Introduction...................................................127 6.4.2 Sample information............................................128 6.4.3 Result..........................................................128 a. Extended X-ray Absorption Fine Structure (EXAFS)............128 b. High-resolution Transmission Electron Microscopy (HR-TEM)......................................................................................129 6.5 Ba1-xSrxTiO3..................................................................................................130 6.5.1 Introduction............................................................130 6.5.2 Sample information............................................................130 6.5.3 Result..........................................................130 a. Extended X-ray Absorption Fine Structure (EXAFS)...........130 b. High-resolution Transmission Electron Microscopy (HR-TEM)......................................................................................131 References.............................................................................................................133 | |
| dc.language.iso | en | |
| dc.subject | 同步加速器輻射光源 | zh_TW |
| dc.subject | 銻磷砷化銦 | zh_TW |
| dc.subject | 二氧化鉿 | zh_TW |
| dc.subject | 氧化鋅鎂 | zh_TW |
| dc.subject | X光光電子能譜術 | zh_TW |
| dc.subject | X光吸收光源精細結構頻譜圖 | zh_TW |
| dc.subject | Synchrotron Radiation (SR) | en |
| dc.subject | X-ray absorption fine structure (XAFS) | en |
| dc.subject | X-ray absorption spectroscopy (XAS) | en |
| dc.subject | X-ray Photoelectron Spectroscopy (XPS) | en |
| dc.subject | MgZnO | en |
| dc.subject | HfO2 | en |
| dc.subject | InAsPSb | en |
| dc.title | 同步輻射X光吸收光譜以及X光光電子能譜術對氧化鋅鎂,二氧化鉿及銻磷砷化銦薄膜材料的特性研究 | zh_TW |
| dc.title | Synchrotron Radiation X-ray Absorption and X-ray Photoelectron Spectroscopy Analysis of MgZnO, HfO2, and InAsPSb epitaxial materials | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 98-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 林浩雄,李坤彥 | |
| dc.subject.keyword | 同步加速器輻射光源,X光吸收光源精細結構頻譜圖,X光光電子能譜術,氧化鋅鎂,二氧化鉿,銻磷砷化銦, | zh_TW |
| dc.subject.keyword | Synchrotron Radiation (SR),X-ray absorption fine structure (XAFS),X-ray absorption spectroscopy (XAS),X-ray Photoelectron Spectroscopy (XPS),MgZnO,HfO2,InAsPSb, | en |
| dc.relation.page | 135 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2010-08-04 | |
| dc.contributor.author-college | 電機資訊學院 | zh_TW |
| dc.contributor.author-dept | 光電工程學研究所 | zh_TW |
| 顯示於系所單位： | 光電工程學研究所 | |
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