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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 范光照(Kuang Chao Fan) | |
| dc.contributor.author | Kyaw-Kyaw Maung | en |
| dc.contributor.author | 楊世將 | zh_TW |
| dc.date.accessioned | 2021-06-15T02:22:37Z | - |
| dc.date.available | 2016-08-19 | |
| dc.date.copyright | 2011-08-19 | |
| dc.date.issued | 2011 | |
| dc.date.submitted | 2011-08-17 | |
| dc.identifier.citation | 【1】 L. M. Ferran, and J. Carrabina , “On the application of configurable computing to real-time industrial visual inspection,” Emerging Technologies and Factory Automation, 1999. Proceedings. ETFA '99. 1999 7th IEEE International Conference , Vol,1, pp. 487- 494, 18-21 Oct. 1999.Newman, T. S. and Jain, A. K., “A survey of automated visual inspection,” Computer Vision and Image Understanding, Vol. 61, No. 2, March, pp. 231-262, 1995.
【2】 R. T. Chin, and C. A. Harlow, 1982, “Automated visual inspection: a survey”, IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. Pam-4, No. 6, pp. 557-573. 【3】 T. S. Newman, and A. K. Jain, “A survey of automated visual inspection,” Computer Vision and Image Understanding, Vol. 61, No. 2, March, pp. 231-262, 1995. 【4】 M. Moganti, F. Ercal, C. H. Dagli, and S.Tsunekawa 1996, “Automatic PCB Inspection Algorithms: A Survey”, Computer Vision and Image Understanding, Vol.63, No. 2, March, pp. 287-313,1996. 【5】 張頌榮，“TFT-LCD面板之點線瑕疵自動化檢測系統”，成功大學製造工程研究所碩士論文，2005. 【6】 陳朝治，“應用影像處理與類神經網路於ITO導電玻璃之瑕疵分類”，台灣科技大學自動化及控制研究所碩士論文,2007. 【7】 蔡英男，“應用影像處理與類神經網路於偏光膜瑕疵辨識”，台灣科技大學碩士論，2003. 【8】 陳志忠，“液晶顯示器的像素點缺陷與亮度均一性之自動化檢測”，中原大學機械工程研究所碩士論文，2001. 【9】 劉建宏，“光學影像檢測模組之開發與應用”，台灣大學機械工程研究所碩士論文，2002. 【10】 陳彥宏，“彩色機械視覺於表面瑕疵檢測之研究”，台灣大學機械工程研究所碩士論文，2003. 【11】 泰洛科技股份有限公司，“增進視覺系統辨識率之光源選擇與技巧,” Mechtronics Magazine，pp. 99-104, Oct 2000. 【12】 N. Otsu , “A threshold selection method from gray-level histograms,” IEEE Transactions on System, Man, and Cybernetics, Vol. SMC-9, No. 1, pp. 62-66, January 1979. 【13】 R. C. Gonzalez , and R. E. Woods, “Digital Image Processing,” 3rd ed. , Addison-Wesley Publishing Company,1992 【14】 R. M. Haralick, and L. G. .Shapiro, “Computer and Robot Vision,” Vol. 1, pp. 28-40, 1992. 【15】 J. Benschop, and G.. V. Rosmalen, “Confocal compact scanning optical microscope based on compact disc technology.” Appl. Opt., 1991. 30(10): p. 1179-1184. 【16】 T. R. Armstrong, and M.P. Fitzgerald, “An Autocollimator Based on the Laser Head of a Compact Disc Player”, Measurement Science & Technology, 1992. 3(11): p. 1072-1076. 【17】 J. H. Zhang, and L. L. Cai, An autofocusing measurement system with a piezoelectric translator. Ieee-Asme Transactions on Mechatronics, 1997. 2(3): p. 213-216. 【18】 K. C. Fan, et al., Development of a high-precision straightness measuring system with DVD pick-up head. Measurement Science and Technology, 2003. 14(1): p. 47-54. 【19】 P. S. P. Wang and Y. Y. Zhang, “A fast and flexible thinning algorithm,” IEEE Transactions on Computers, Vol. 38, No. 5, pp. 741-745, May 1989. 【20】 T. Y. Zhang and C. Y. Suen, “A fast parallel algorithm for thinning digital patterns,” Communications of the ACM, Vol. 27, No. 3, pp. 236-239, March 1984. | |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/43509 | - |
| dc.description.abstract | 本研究旨在發展出一套適用於手機面板的多功能自動化檢測系統;有別於一般檢測系統只能對表面瑕疵做檢測，對於膜厚的檢測無法實現，因此在本檢測系統中結合了DVD聚焦探頭模組，利用聚焦探頭量測手機面板膜厚;其中探頭部份以市售紅光DVD光學讀取頭做為感測元件，其聚焦方式為像散法，量測原理為利用聚焦誤差訊號曲線性區域之電壓與位移的關係，得到線性的位移量即為面板的膜厚。
在影像擷取過程中，設計正向光源與背向光源於同一站，分別對正向光源影像和背向光源影像取像並進行影像處理。其中，背光影像主要檢測孔洞為主;正光影像又可分為鍍膜區與玻璃基板區並且分開處理，鍍膜區主要有刮傷與油邊瑕疵，玻璃基板區有油污與條紋兩種瑕疵。在處理正光影像時，可藉由二值化、濾波處理、形態處理、點塊自動分析及相關判斷式，定義出瑕疵的特徵並進行分類。 | zh_TW |
| dc.description.abstract | This research aims to develop a multi-function for mobile phone panel automated inspection systems. It is different from the standard system which can only identify surface defects and not for thickness defects. So, this system in combination with a DVD focus probe module and use focus probe to measurement the mobile panel thickness. Adopted a commercial DVD pickup head as the sensor, and focusing by astigmatic method. Using the linear region of the focus error signal curve between the voltage and displacement relationship was measured. And get the panel thickness by linear displacement.
In the image acquisition process, the front-lighting and back-lighting are taken from the same station. The main of back-lighting images was detection for holes; front-lighting image may divide into the coating area and the transparent area. The coating area mainly has the scratch and edge defect. The transparent area mainly has the oil stain and stripe defect. It is can define a characteristic by binarization, filtering, morphological processing, automatic analysis and other method for defects, and classify the defects. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-15T02:22:37Z (GMT). No. of bitstreams: 1 ntu-100-R98522736-1.pdf: 1485036 bytes, checksum: e9532ffbcfaf1d037a7e66c6ac30f083 (MD5) Previous issue date: 2011 | en |
| dc.description.tableofcontents | 口試委員會審定書 i
誌謝 ii 中文摘要 iii ABSTRACT iv CONTENTS v LIST OF FIGURES ix LIST OF TABLES xii 第 一章 緒論 1 1-1 研究背景 1 1-2 參考文獻回顧 2 1-3 研究方法與內容概要 6 第 二章 光源系統與影像處理技術 7 2-1 光源種類 7 2-2 光源的架設 9 2-2-1 前照式(Front Illumination) 9 2-2-2 背照式(Back Illumination) 13 2-3 前言 15 2-4 影像濾波 16 2-4-1 遮罩法 (Mask) 16 2-4-2 線性濾波(Linear Filter) 18 2-5 影像分割 20 2-5-1 二值化 20 2-5-2 自動閥值 21 2-5-3 邊緣檢測 23 2-5-4 連通性標記(Connected Labeling) 27 2-6 形態學 28 2-6-1 膨脹和侵蝕(Dilate and Erode) 28 2-6-2 斷開和閉合(Open and Close) 30 2-7 細線化 31 2-7-1 序列式的細線化方法 32 2-7-2 平行式的細線化方法 33 第 三章 光學讀取頭的感測原理與量測應用 35 3-1 光學讀取頭相關文獻回顧 35 3-2 光學讀取頭之結構與元件介紹 38 3-2-1 雷射二極體 39 3-2-2 光柵 40 3-2-3 偏極化分光鏡與1/4波片 40 3-2-4 準直透鏡 41 3-2-5 物鏡 41 3-2-6 四象限光感測器 42 3-3 光學讀取頭聚焦原理簡介 44 3-4 DVD讀取頭之量測應用 45 3-4-1 膜厚量測 45 3-4-2 系統校正 47 3-4-3 膜厚量測結果 50 3-4-4 量測結果驗證 55 第 四章 表面瑕疵檢測 56 4-1 系統架構 56 4-2 檢測流程 58 4-3 瑕疵的種類 59 4-4 瑕疵特徵擷取 60 4-4-1 油污瑕疵特徵 60 4-4-2 條紋瑕疵特徵 61 4-4-3 刮傷瑕疵 62 4-4-4 油邊瑕疵 63 4-4-5 孔洞瑕疵 64 4-5 瑕疵分類 65 4-5-1 面積判別(Area Differentiate) 65 4-5-2 面積橢圓法 66 4-5-3 瑕疵分類準則 66 4-6 實驗結果 67 第 五章 結論與未來展望 71 5-1 結論 71 5-2 未來展望 72 REFERENCE 73 | |
| dc.language.iso | zh-TW | |
| dc.title | 手機面板之膜厚與瑕疵檢測技術研究 | zh_TW |
| dc.title | Research of Mobile Panel Thickness and Defects Inspection | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 99-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 修芳仲,陳亮嘉 | |
| dc.subject.keyword | 手機面板,膜厚,瑕疵檢測, | zh_TW |
| dc.subject.keyword | mobile panel,thickness,defect inspection, | en |
| dc.relation.page | 75 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2011-08-17 | |
| dc.contributor.author-college | 工學院 | zh_TW |
| dc.contributor.author-dept | 機械工程學研究所 | zh_TW |
| 顯示於系所單位： | 機械工程學系 | |
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