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http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/40774完整後設資料紀錄
| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 范光照(Kuang-Chao Fan) | |
| dc.contributor.author | Chi-Hui Liu | en |
| dc.contributor.author | 劉奇惠 | zh_TW |
| dc.date.accessioned | 2021-06-14T16:59:44Z | - |
| dc.date.available | 2013-08-04 | |
| dc.date.copyright | 2008-08-04 | |
| dc.date.issued | 2008 | |
| dc.date.submitted | 2008-07-30 | |
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Dobosz, “New stylus probe with interferometric transducer for surface roughness and form profiling,” Optical Engineering, Vol. 33, No. 3, p 902-907, (1994). 【42】 M. Dobosz, “Application of a focused laser beam in a grating interferometer for high-resolution displacement measurements,” Optical engineering, Vol. 38, No. 6, p 958-967, (1999). 【43】 D. H. Mollenhauer; P. G. Ifju; B. Han, “A compact, robust and versatile Moire interferometer,” Optics and Lasers in Engineering, Vol. 23, No. 1, p 29-40, 1995, 【44】 Chang, Rong-Seng; Lee, Chun-Chi, “Measurement of aberration by moire pattern,” Proceedings of SPIE - The International Society for Optical Engineering, Vol. 1319, p 649,(1990). 【45】 De Nicola, Sergio; Ferraro, Pietro; Finizio, A., “Reflective grating interferometer for measuring the refractive index of transparent materials,” Optics Communications, Vol. 118, No.5-6, p 491-494, (1995). 【46】 De Nicola, Sergio; Ferraro, Pietro; Finizio, A., “Reflective grating interferometer for measuring the focal length of a lens by digital moire effect,” Optics Communications, Vol. 132, No. 5-6, p 432-436, 1996. 【47】 De Angelis, Marella; De Nicola, Sergio; Ferraro, Pietro, “Analysis of moire fringes for measuring the focal length of lenses,” Optics and Lasers in Engineering, Vol. 30, No. 3-4, p 279-286, 1998. 【48】 梁普文 , 陳林才, 何貢 , “誤差理論與數據處理,” 北京 中國計量出版社 | |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/40774 | - |
| dc.description.abstract | 科技不斷的進步,製造技術不斷推陳出新,所有含高科技領域的機械、電子、材料等工業,都朝著高精密度、高效能的方向邁進。都因創新的技術而達到更高的品質。因此在產品的檢測上,利用可程式的裝置可量測的儀器達到嵌入是系統的目的亦或使系統分工提高系統效能。
本文研究的目的預期可以藉由硬體電路的實現取代電腦平台針對雷射光學尺訊號處理的部份,尤其以多軸運動控制的期望下更能有效達到分工的目的。在利用CPLD作為轉換電路訊號的核心建立獨立的轉換介面,轉換後的數位訊號藉由FPGA可程式邏輯運算晶片寫入解析訊號程式,透過此系統得知實際的位移資訊,達到線性量測的目的,並即時回饋位移資料予控制單元。 在訊號的處理方面,利用FIFO的觀念建立高速計數補償的方法,可以確保訊號因光學尺雜訊過大時仍可正確計數。另一方面建立數位修正訊號中心的方法,可以確保中心飄移時能即時補償。 經SIOSMI5000雷射干涉儀的校驗後,在依密閉槍體內無任何溫度、濕度、震動補償環境下,光學系統在15mm量測範圍內,量測準確性在25nm以下,重複性在20nm以下。 | zh_TW |
| dc.description.abstract | Along with constant development in high technology, fields like mechanical engineering, electrical engineering, and material engineering are heading to researches of high precision and high performance. Thus, this research offers the programmable device (embedded device) to improve better performance.
By using Complex Programmable Logic Device (CPLD) to help Analog Digital Converter (ADC) sample the digital signal obtained from Interferometer’s analogical signal, Felid Programmable Gate Array (FPGA), with high speed operation, will process the retained digital data and immediately send the real displacement data back to control unit to further achieve higher performance. In respect of signal processing, signal correcting is based on first in first out (FIFO) architecture circuit. This method assures correct counting of periodic signal when signal is decaying caused by interferometer. Also, FIFO architecture is used to correct DC draft in real time. To verify the theoretical predictions and the overall system specifications of the system, the SIOS MI5000 laser interferometer is adopted as the calibration tool. Within the distance of 15mm, the measuring is conducted in a close chamber, a regular laboratory environment, without using conditions of temperature control, humidity control and anti-vibration. The maximum error is 25nm and the repeatability is below 20 nm. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-14T16:59:44Z (GMT). No. of bitstreams: 1 ntu-97-R95522723-1.pdf: 1722168 bytes, checksum: d74c49fc548f176844f0912ee40cfb0f (MD5) Previous issue date: 2008 | en |
| dc.description.tableofcontents | 摘要 i
Abstract iii 目錄 iv 圖目錄 vii 表目錄 viii 第一章 緒論 1 1-1 研究緣起與目的 1 1-2 相關論文回顧 2 1-2-1 關於光學編碼器 2 1-2-2 本研究光學編碼器 5 1-2-3 FPGA訊號處理工具 6 1-2-4 關於訊號細分割 7 第二章 數位訊號處理 9 2-1 PC的作業系統 9 2-2 即時處理 9 2-3 數位訊號處理器(digital signal processor ) 10 2-4 ASIC數位訊號處理 11 2-4-1 FPGA架構 13 2-4-2 CPLD 14 2-5 MCU微處理器 16 第三章 電路硬體架構 17 3-1 轉換介面工具 17 3-2 光機架構 21 3-2-1 二極體雷射 21 3-2-2 光偵測器 22 3-3 訊號完整性 25 3-4 數位控制IC的實現 26 3-4-1 anti-aliasing濾波器 27 3-4-2 A/D轉換器 27 3-5 訊號處理處理核心FPGA 31 3-6 通訊介面 33 第四章 訊號處理演算法與量測分析 34 4-1 光學尺訊號區分 34 4-2 計算方法 35 4-2-1 干涉儀條紋計數 35 4-2-2 Heterodyne移頻 36 4-2-3 振幅細分法 38 4-2-4 數位內插法 39 4-3 使用橢圓最小平方法消除誤差 41 4-4 使用FPGA硬體開發架構與演算的實現 43 4-4-1 數位量化比較解相位法 44 4-4-2 除法器與鎖相迴路應用 47 4-4-3 資料流與系統架構 49 4-4-4 觸發邊緣計數的誤判 50 4-4-5 計數方法高速的比較邊緣緩衝器(FIFO) 51 4-4-6 計數簡易型數位濾波 52 4-5 量測性能分析 56 第五章 公差校正與平台位移量測 58 5-1 前言 58 5-2 量測結果 63 5-2-1 誤差來源分析 66 第六章 結論 68 參考文獻 69 | |
| dc.language.iso | zh-TW | |
| dc.subject | 雷射光學編碼器 | zh_TW |
| dc.subject | FPGA | zh_TW |
| dc.subject | CPLD | zh_TW |
| dc.subject | 細分 | zh_TW |
| dc.subject | Interpolation | en |
| dc.subject | laser encoder | en |
| dc.subject | FPGA | en |
| dc.subject | CPLD | en |
| dc.title | 以可程式邏輯運算晶片發展雷射光學尺訊號解析系統 | zh_TW |
| dc.title | Development of a Laser Encoder Signal Processing system with Programmable Device | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 96-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 朱志良(Chih-Liang Chu),修芳仲(Fang-Jung Shiou) | |
| dc.subject.keyword | FPGA,CPLD,細分,雷射光學編碼器, | zh_TW |
| dc.subject.keyword | FPGA,CPLD,Interpolation,laser encoder, | en |
| dc.relation.page | 77 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2008-07-30 | |
| dc.contributor.author-college | 工學院 | zh_TW |
| dc.contributor.author-dept | 機械工程學研究所 | zh_TW |
| 顯示於系所單位: | 機械工程學系 | |
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