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完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.advisor | 趙治宇 | |
dc.contributor.author | " Tung-Cheng,Pan" | en |
dc.contributor.author | 潘東成 | zh_TW |
dc.date.accessioned | 2021-06-13T01:24:57Z | - |
dc.date.available | 2011-07-26 | |
dc.date.copyright | 2007-07-26 | |
dc.date.issued | 2007 | |
dc.date.submitted | 2007-07-16 | |
dc.identifier.citation | 第一章 參考文獻
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Reid, Nature 119, 890 (1927). [21] M. Cheng, Ph.D. thesis, SUNY at Buffalo (1988), unpublished. [22] C. F. Chou, Ph.D. thesis, SUNY at Buffalo (1997), unpublished. [23] J. D.Brock, Ph.D. thesis, MIT (1981), unpublished; J. Collett, Ph.D. thesis, Harvard University (1983), unpublished. 第五章 參考文獻 [1] C. Y. Chao, Y. H. Liu, T. C. Pan, B. N. Chang, and J. T. Ho, Phys. Rev. E 64, 050703(R) (2001). [2] E. B. Sirota, P. S. Pershan, S. Amador, and L. B. Sorensen, Phys. Rev. A 35, 2283 (1987). [3] B. D. Swanson, H. Stragier, D. J. Tweet, and L. B. Sorensen, Phys. Rev. Lett. 62, 909 (1989). [4] R. Geer, T. Stoebe, C. C. Huang, R. Pindak, J. W. Goodby, M. Cheng, J. T. Ho, and S. W. Hui, Nature (London) 355, 152 (1992). [5] T. Stoebe, R. Geer, C. C. Huang, and J. W. Goodby, Phys. Rev. Lett. 69, 2090 (1992). [6] A. J. Jin, T. Stoebe, and C. C. Huang, Phys. Rev. E 49, R4791 (1994). [7] A. J. Jin, M. Veum, T. Stoebe, C. F. Chou, J. T. Ho, S. W. Hui, V. Surendranath, and C. C. Huang, Phys. Rev. Lett. 74, 4863 (1995). [8] B. D. Swanson and L. B. Sorensen, Phys. Rev. Lett. 75, 3293 (1995). [9] D. R. Nelson and B. I. Halperin, Phys. Rev. B 19, 2457 (1979). [10] C. Y. Chao, C. F. Chou, J. T. Ho, S. W. Hui, A. J. Jin, and C. C. Huang, Phys. Rev. Lett. 77, 2750 (1996). [11] D. J. Bishop, W. O. Sprenger, R. Pindak, and M. E. Neubert, Phys. Rev. Lett. 49, 1861 (1982). [12] D. E. Moncton, R. Pindak, S. C. Davey, and G. S. Brown, Phys. Rev. Lett. 49, 1865 (1982). [13] B. D. Swanson, H. Stragier, D. J. Tweet, and L. B. Sorensen, Phys. Rev. Lett. 62, 909 (1989). [14] M. Cheng, J. T. Ho, S. W. Hui, and R. Pindak, Phys. Rev. Lett. 59, 1112 (1987). [15] C. F. Chou, J. T. Ho, S. W. Hui, and V. Surendranath, Phys. Rev. Lett. 76, 4556 (1996). [16] C. F. Chou, A. J. Jin, S. W. Hui, C. C. Huang, and J. T. Ho, Science 280, 1424 (1998). [17] C. F. Chou, A. J. Jin, C. Y. Chao, S. W. Hui, C. C. Huang, and J. T. Ho, Phys. Rev. E 55, R6337 (1997). [18] J. G. Dash, in proceedings of the Nineteenth Solvay Conference, edited by F. W. Dewitte (Springer-Verlag, New York, 1988). [19] S. Dietrich, in phase Transitions and Critical Phenomena, edited by C. Domb and J. Lebowitz (Academic, London, 1988), Vol. 12. [20] We cannot totally rule out the presence of short-range exponential forces in 14S5, since our data can also be fitted to , with a penetration depth ξ of 0.39, albeit with a larger χ2 than the power-law expression. [21] T. C. Pan, Master Thesis, National Central University (1999). [22] T. C. Pan, W. J. Hsieh, and C. Y. Chao, Phys. Rev. E 70, 011706 (2004). [23] R. B. Meyer, L. Liebert, L. Strzelecki, and P. Keller, J. Phys. (France) Lett. 36, 69 (1975). [24] S. Dumrongrattana, G. Nounesis, and C. C. Huang, Phys. Rev. A 33, R2181 (1986). [25] R. Shashidhar, B. R. Ratna, G. G. Nair, S. K. Prasad, Ch. Bahr, and G. Heppke, Phys. Rev. Lett. 61, 547 (1988). [26] H. Y. Liu, C. C. Huang, T. Min, M. D. Wand, D. M. Walba, N. A. Clark, Ch. 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Lett. 57, 98 (1986). | |
dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/29919 | - |
dc.description.abstract | 我們使用高解析ac微小訊號熱分析儀、光反射儀和改裝的穿透式電子顯微鏡。分別對正交型液晶(液晶材料為14S5)、鐵電型液晶(液晶材料為C7),這兩種液晶材料進行液晶薄膜光熱及結構相位性質上的研究。
由電子繞射和光反射實驗研究發現,液晶膜發生相變是以一層接著一層(layer-by-layer)表面層相變的方式,從Sm-A相直接變成Cry-B相。在相變過程中,並沒有經歷Hexatic中間相。此外、由液晶分子間的交互作用的wetting行為來看,我們發現分子與分子間的交互作用力是延遲的凡德瓦爾力(retarded van der waals forces)。 而在使用高解析ac微小熱訊號分析儀研究自由懸浮液晶薄膜,由Sm-A-SmC*相變附近比熱的行為,證實了早期對液晶分子傾角量測工作上,內部液晶層發生由一階相變到二階相變的過程是與液晶膜厚度呈函數關係。並且由不對稱的比熱異常(anomaly)數據來看。在極薄膜時顯現了crossover行為,同時我們亦觀察到液晶膜在低溫時,將由Sm-C相相變為傾斜的Cry-G相。這相是有晶格點存在的。此外、我們也推測因為液晶分子是傾斜的,所以液晶薄膜表面的有序性強度是大過正交型的層狀型(smectic)液晶。 | zh_TW |
dc.description.abstract | Defect-mediated phase transition has been generally considered as one of the most exciting topics in condensed matter physics in recent years. The phase transitions in reduced-dimensional system have attracted great attention because it involves the research of fundamental physics and technical applications. Free-standing liquid crystal thin films provide an ideal experimental system for the research of reduced-dimension.We have performed AC calorimetry and optical reflectivity studies on various liquid- crystal thin films and reported the following discoveries:
(1) I have investigated the Sm-A- Cry-B Phase transition of 14S5 in a liquid-crystal material, using electron diffraction and optical reflectivity have provided the direct confirmation of the existence of layer-by-layer surface transitions, without going through an intermediate hexatic phase. The molecular interactions are found to be through retarded van der waals forces. (2) We have also studied heat-capacity measurements near the smectic-A- smectic-C* phase transition in free standing films of one chiral liquid-crystal compound-C7. The heat-capacity behavior confirms the evolution of the transition in the interior layers from first to second order as function of film thickness suggested earlier in tilt angle measurements. The asymmetry in the heat-capacity anomaly exhibits an interesting crossover in thinner films. The surface ordering strength in these films is found to be much larger than that in other orthogonal-smectic films, which we speculate is due to the molecular tilt. In this thesis, by using our state-of-the-art ac calorimeter and high-resolution optical reflectivity setup, I have systematically studied several phase transitions in 14S5 and C7 liquid-crystal materials. It can’t be denied that the ac calorimetric and optical-reflectivity studies provide a new and important field for the study of the free-standing liquid-crystal films. Many interesting compounds including their phase diagrams remain to be investigated. The substrate-free property also with the quantized layer number makes free-standing liquid-crystal films unique and suitable for the study of the reduced-dimensional system. Chiral LC compounds have many new phase and some interesting physical phenomena, and of course, need further studies. | en |
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dc.description.tableofcontents | 目錄
口試委員會審定書 ……………………………………………………………………i 誌謝 …………………………………………………………………………………ii 中文摘要 ……………………………………………………………………………iii 英文摘要 ……………………………………………………………………………iv 第一章 導論 1 1.1 引言 1 1.2 液晶的由來與發展歷史 3 1.3 液晶的種類 5 1.4 液晶分子的物理性質 16 1.5 各章節目錄 23 參考文獻………………………...…………………………………...24 第二章 液晶分子特性介紹 25 2.1 液晶分子的物理性質 25 2.2 液晶分子的排列與有序性分類 27 2.3 液晶分子統計理論 34 2.4 Free-standing 液晶薄膜 35 參考文獻…………………………………...……………………...….37 第三章 液晶薄膜相變理論與界面現象(Wetting理論) 40 3.1 平均場理論 40 3.2 二維缺陷溶化理論(連續相變) 48 3.3 SmecticA-SmecticC相變 58 3.4 液晶表面層Layer-by-Layer Wetting理論 68 參考文獻……………………………………...…………………...….71 第四章 液晶薄膜光熱現象與結構量測方法 74 4.1 一維熱流模型與光反射原理 74 4.2 液晶薄膜微小熱訊號量測系統 87 4.3 光反射率量測系統 97 4.4 同時量測…………………….……………………….…………….101 4.5 改裝之穿透式電子顯微鏡(TEM Modification)……………..……103 4.6 液晶薄膜層數校正………………………………….....….……….106 參考文獻……………………………………………...……….….…108 第五章 分析與結果…………………………………….110 引言…………………………………………….………………….......110 主題一………………………………………………………………...112 5.1 前言…………………………………………………...……………..112 5.2 研究課題………..………………………….……….…….……….….114 5.3 實驗方法與結果..………………………….……….…………..….….114 主題二………………………………………………….……………...125 5.4 前言…..………………..…………………………….…..………...….125 5.5 研究課題…..………………………………………...……….……….125 5.6 實驗方法與結果…..……………………………………....………….127 參考文獻…………..………………………….….…...…...………....136 第六章 結論………………………...……………………….……...……………..140 第一章圖目錄 圖1.1 物質結構三態變化情形示意圖……………………….…………….2 圖1.2 一般固體液體與液晶分子排列情形之比較……………….……….3 圖1.3 棒狀形液晶分子大小示意圖…………………………………….….7 圖1.4 實驗室常用之液晶化合物材料種類的化學結構式………………..8 圖1.5 層狀型(Smectic)液晶結構示意圖…………………………..……….9 圖1.6 向列型(Nematic)液晶結構示意圖…………………………..………10 圖1.7 膽固醇型(Cholesteric)液晶結構示意圖…………………..………...11 圖1.8 圓盤型(Discotic)液晶化學結構示意圖………………..……………12 圖1.9 圓盤型液晶以Nematic相的排列示意圖…………………….….....12 圖1.10 雙親分子Amphiphilic示意圖…………………………..…………..13 圖1.11 (a)部分為 hexagonal 溶致型液晶相示意圖, (b)部份為 reversed hexagonal 溶致型液晶相示意圖…………..15 圖1.12 為Lamella相(或稱neat相)………………………………….……15 圖1.13 為micelle相及reverse micelle相………………………..………..15 圖1.14 雙親分子依含水量多寡而分成各種不同中間相 示意圖…………………………..……………………….......……...15 圖1.15 雙層或多層的雙親分子層泡泡狀相位(vesicle相)...........................16 圖1.16 因缺陷而產生的dislocation現象形成原因………….………......18 圖1.17 偏光顯微鏡下的液晶disclination缺陷示意圖………………….…20 圖1.18 為disclination line缺陷變化情形…………………………....…...20 圖1.19 為Vortex值與相位隨空間座標的變化情形………………....…..22 圖1.20 在不同的disclination下強度S變化的拓樸 (topology)行為…………………………………………..………...22 第二章 圖目錄 圖2.1 液晶分子指向方向與主長軸夾一角度之空間位置 示意圖…………………………………………….…....…………....26 圖2.2 層狀型(Smectic)液晶其相位是依分子排列的有序性而 區分之示意圖…………………………………………....………….27 圖2.3 液晶相的繞射圖形…………………………………………………30 圖2.4 液晶分子鍵的方向有序程度(B.O.O.)示意圖……………………..31 圖2.5 為Free-Standing液晶膜於兩層膜時的情形……………………...36 第三章 圖目錄 圖3.1 為平均場論中的Landau自由能區域模型示意圖…………….….41 圖3.2 連續相變中對稱性變化情形………………….…………………...44 圖3.3 在低溫下2D XY模型中Vortex束縛情形…………………….....50 圖3.4 溫度上升後將由bound vortex pair分離成為電荷為 +1、-1情形……………………………….………........……..…51 圖3.5 電腦模擬2D XY模型中連續相變比熱情形……….…...….........53 圖3.6 5-fold的disclination被7-fold的disclination所束縛 而成的缺陷情形………………………….…...................….…..55 圖3.7 (a)部分為5-fold的disclination它是藉由移除1/6的 晶格然後將 與 線段連結在一起而成。 (b)部分為典型的5-fold disclination……..............................…..55 圖3.8 包含Hexatic相的二維系統,溫度(T)-壓力(P)關係 之相圖。圖中呈現代表因defect-mediated而造成的 連續相變過程。雙線代表式一階相變化....................................56 圖3.9 在電子繞射實驗下所看到的Hex-B相的繞射圖形以 及繞射圖形結構上各個方向的掃描示意圖……………..............57 圖3.10 層狀型液晶各個相的幾何形狀表示………….….………....……58 圖3.11 為H(10)F(5)MOPP液晶材料在30層膜厚時的比熱 數據增加Gaussian fluctuations項後的fitting結果..................... 62 圖3.12 為C7液晶材料在Sm-A-Sm-C*相變過程中比熱值 Cp與溫度的關係…………………………………………............63 圖3.13 為C7自由懸浮液晶膜在不同層數時溫度與平均分子 傾角的關係…………………………………………..……...……64 圖3.14 為Nematic、Smectic-A、Smectic-C三相點之相圖…………....66 圖3.15 為Sm-A-Sm-C相變是一個似平均場相變,伴隨一 個過渡行為………………………………………….………...…67 圖3.16 由power-law公式fitting驗證layer-by-layer 表面層 freezing的行為………………………………….…….…………70 第四章 圖目錄 圖4.1 理想一維熱流模型示意圖……………………………………………76 圖4.2 為4O.8和54COOBC液晶材料的 值與液晶層厚度關 係……………………………………………………...………………82 圖4.3 對75OBC(4層膜)時光反射量測所得到液晶分子的 In-Plane密度值與X-ray的實驗結果…………….…..………….….86 圖4.4 刮自由懸浮液晶膜的方法示意圖………...…….…...…………....…89 圖4.5 高解析ac微小熱訊號分析儀示意圖……………..…….…………..89 圖4.6 使用精密Screw調整液晶膜板位置高度示意圖......................….…91 圖4.7 調整TC位置的高精密微調器……………….………..….....………92 圖4.8 為Thermocouple結構示意圖………….……………..…..…….........95 圖4.9 基本光反射儀器原理架構…………………………..……..………...98 圖4.10 同時進行高解析ac微小熱訊號量測及光反射率值量測實 驗………………………………………………..….………….……102 圖4.11 改裝後的穿透式電子顯微鏡內部結構圖…………...……….……104 第五章 圖目錄 圖5.1 藉由電子繞射圖形看出由Sm-A-Hex-B-Cry-B 相變過程情形………………………....……………………….113 圖5.2 為14S5液晶材料在40層膜時的電子繞射圖形…………….116 圖5.3 為14S5液晶膜在六層膜溫度64.5℃時的Cry-B 相位…………………………………………………………….117 圖5.4 液晶膜三層膜厚(N=3)時縱向方向掃描的情形…...............…118 圖5.5 為14S5液晶膜在64層膜時的光反射率值…………………122 圖5.6 以三種液晶材料顯示在6層膜厚時液晶膜 layer-by-layer surface freezing的相變過程………...............124 圖5.7 在Sm-A相上表面層顯現的兩種傾斜Synclinic相 和Anticlinic相…………………………………….…….……127 圖5.8 為C7液晶膜在不同層數時的Sm-A-Sm-C*相變 之比熱值……………………………...……….….....………...130 圖5.9 為C7液晶膜在13層15層18層23層時,Sm-C* -Cry-G相變的比熱訊號…………………….……...……….134 圖5.10 為C7液晶膜以15層膜為例,溫度在59℃以下持 續降溫所顯現整個的相變過程………………..…..…...…….135 表目錄 表1-1 液晶中間相依其狀態與溫度或對稱性結構而分的圖表………...6 表2-1 在3D系統中液晶分子之間的相關聯性的有序程度..................33 表2-2 在2D系統中液晶分子之間的相關聯性的有序程度..................34 表3-1 各個統計模型在溫度不為零的情況下,是否發生連續 相變的情形………………………………………………………49 表4-1 比熱值與樣品及交換氣體之間關係表…………………………80 附錄 作者歷來發表著作集與參加國際會議論文集………….…..……142 | |
dc.language.iso | zh-TW | |
dc.title | 液晶薄膜光熱現象與結構研究 | zh_TW |
dc.title | Optical-Thermal Phenomenon and Structural Study of Liquid Crystal Thin Films | en |
dc.type | Thesis | |
dc.date.schoolyear | 95-2 | |
dc.description.degree | 博士 | |
dc.contributor.oralexamcommittee | 曹培熙,梁啟德,劉祥麟,朱士維 | |
dc.subject.keyword | ac微小訊號熱分析儀,光反射儀,改裝的穿透式電子顯微鏡,液晶,鐵電型液晶,延遲的凡德瓦爾力,過渡行為, | zh_TW |
dc.subject.keyword | liquid crystal,Defect-mediated phase transition,smectic-C*,retarded van der waals forces,crossover behavior, | en |
dc.relation.page | 145 | |
dc.rights.note | 有償授權 | |
dc.date.accepted | 2007-07-18 | |
dc.contributor.author-college | 理學院 | zh_TW |
dc.contributor.author-dept | 物理研究所 | zh_TW |
顯示於系所單位: | 物理學系 |
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