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標題: | 以基因演算法為基礎之類比IC設計自動化佈局系統 A GA-based Automatic Layout System for Analog IC Layout Design |
作者: | Che-Hsin Cheng 鄭哲欣 |
指導教授: | 黃漢邦 |
關鍵字: | 類比電路,佈局系統,面積利用率,元件關連關係,熱能消耗,基因演算法, Analog IC,Automatic Layout System,Chip Area Utility Ratio,Input/Output Relationship,Power Consumption,Genetic Algorithm, |
出版年 : | 2008 |
學位: | 碩士 |
摘要: | 隨著半導體產業的蓬勃發展,為了提升競爭力與增加收益,半導體產品的開發時程也日益緊縮。本研究旨在針對類比式電路產品開發流程中的佈局設計部分提出改善方法,期能縮短類比式電路產品開發時程。
對類比式電路產品而言,佈局設計對產品的最終成效影響甚大,佈局設計也是一項高度依賴設計人員的經驗與專業技巧之工作。為了提升類比式電路產品開發的整體效率,本研究提出一個類比式IC設計之自動化佈局系統,此系統以考量晶片面積利用率、電路元件之關連關係與電路元件的熱能消耗此三要素,透過系統佈置設計(SLP)流程與基因演算法之求解,以改良式樹狀結構的佈局方式,在短時間內快速提供設計人員最適合的佈局方式。 本研究最後以類比式電路產品為例,透過此自動化佈局系統重新進行佈局設計,並透過模擬與實際上的比較來驗證此系統。 Due to the continuous breakthrough of manufacturing process and market expansions in semiconductor industry, semiconductor product development time is more and more tighten for reducing time to market, and increasing the benefits of the upstream and downstream members in the design chain. The focus of this research is the development of automatic layout system which is expected to improve the layout design procedure for analog IC product developments. Obviously, layout extremely affects the performance of analog IC products, and it is truly a time-consuming work to develop an analog IC products. Moreover, the layout design procedure of analog IC highly depends on designer’s experience and expertise. In order to improve the efficiency of analog IC product development process, automatic layout system (ALS) is established in this research for providing layout design pattern quickly. Core chip area utility ratio, input/output relationship between components and the power consumption produced from thermal noise of analog circuits are concerned in automatic layout system, and layout patterns through a revised tree-structure methodology can be acquired quickly. The layout problem is solved through systematic layout planning (SLP) process flow and genetic algorithm (GA). Designers can acquire the suitable layout pattern immediately from automatic layout system. To verify this automatic layout system, two existing analog IC products are chosen as testing samples. The comparisons between actual layout and layout from automatic layout system are listed in the following content. |
URI: | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/26542 |
全文授權: | 未授權 |
顯示於系所單位: | 工業工程學研究所 |
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ntu-97-1.pdf 目前未授權公開取用 | 7.25 MB | Adobe PDF |
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