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  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 電子工程學研究所
請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/26261
完整後設資料紀錄
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dc.contributor.advisor曹恆偉(Hen-Wai Tsao)
dc.contributor.authorYen-Ting Kuoen
dc.contributor.author郭彥廷zh_TW
dc.date.accessioned2021-06-08T07:04:25Z-
dc.date.copyright2009-01-20
dc.date.issued2009
dc.date.submitted2009-01-12
dc.identifier.citation[1] 林嵩鈞,”低溫多晶矽薄膜電晶體元件電容特性之分析”,碩士論文,台灣大學電子工程學研究所,2005年7月
[2] Mark D. Jacunski, Micheal S. Shur, Albert A. Owusu, Trond Ytterdal, Michael Hack, and Benjamin Iniguez, “A Short-Channel DC SPICE Model for Polysilicon Thin-Film Transistors Including Temperature Effects”, IEEE TRANSACTIONS ON ELECTRON DEVICE, VOL. 46, NO. 6, JUNE 1999
[3] Walid Benzarti, Francois Plais, Anthony De Luca, and Didier Pribat, “Compact Analytical Physical-Based Model of LTPS TFT for Active Matrix Displays Addressing Circuits Simulation and Design”, IEEE TRANSACTIONS ON ELECTRON DEVICE, VOL. 51, NO. 3, MARCH 2004
[4] Ming-Dou Ker, Chin-Kang Deng, and Ju-Lin Huang, “On-Panel Output Buffer With Offset Compensation Technique for Data Driver in LTPS Technology”, JOURNAL OF DISPLAY TECHNOLOGY, VOL. 2, NO. 2, JUNE 2006
[5] Jung-Sheng Chen, and Ming-Dou Ker, “New Gate-Bias Voltage-Generating Technology With Threshold-Voltage Compensation for On-Glass Analog Circuits in LTPS Process”, JOURNAL OF DISPLAY TECHNOLOGY, VOL. 3, NO. 3, SEPTEMBER 2007
[6] Satoshi Inoue, Hiroyuki Ohshima, and Tatsuya Shimoda, “Analysis of Degradation Phenomenon Caused by Self-Heating in Low-Temperature-Process Polycrystalline Silicon Thin Film Transistor”, Jpn. J. Appl. Phys. vol. 41, no. 11A, pp. 6313-6319, Nov. 2002
[7] T. Fuyuki, K. Kitajima, H. Yano, T. Hatayama, Y. Uraoka, S. Hashimoto, and Y. Morita, “Thermal Degradation of Low Temperature Poly-Si TFT”, Thin Solid Films, vol. 487, no. 1/2, pp. 216-220, Sep. 2005
[7] 劉深淵,楊清淵,”鎖相迴路”,滄海書局
[8] In-Chul Hwang, Sang-Hun Song, and Soo-Won Kim, “A Digitally Controlled Phase-Locked Loop With a Digital Phase-Frequency Detector for Fast Acquisition” IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 36, NO. 10, OCT 2001
[9] Ching-Che Chung and Chen-Yi Lee, ”An All-Digital Phase-Locked Loop for High-Speed Clock Generation ”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 38, NO. 2, FEBRUARY 2003
[10] Pao-Lung Chen, Ching-Che Chung, and Chen-Yi Lee, “A Portable Digitally Controlled Oscillator Using Novel Varactors”, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-II : EXPRESS BRIEFS, VOL. 52, NO. 5, MAY 2005
[11] Pao-Lung Chen, Ching-Che Chung, Jyh-Neng Yang, and Chen-Yi Lee, “A Clock Generator With Cascaded Dynamic Frequency Counting Loops for Wide Multiplication Range Applications”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 41, NO. 6, JUNE 2006
[12] R. B. Staszewski, D. Leipold, K. Muhammand, and P. T. Balsara, “Digitally controlled oscillator (DCO)-based architecture for RF frequency synthesis in a deep-submicrometer CMOS process,” IEEE Trans. Circuit Syst. II, Analog Digit. Signal Process., Vol. 50, no. 11, pp. 815-822, Nov. 2003.
[13] P. Raha, S. Randall, R. Jennings, B. Helmick, A. Amerasekera, and B. Haroun, “A robust delay line architecture in a 0.13-um CMOS technology node for reduced design and process sensitivity,” in Proc. ISQED’02, Mar. 2002, pp. 148-153.
dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/26261-
dc.description.abstract本論文使用3um LTPS TFT製程設計一個全數位式鎖相迴路,用來產生倍頻的時脈,本鎖相迴路的輸出頻率範圍是0.625MHz~12MHz,倍頻範圍是1~30倍,模擬結果時間解析度粗調是5.6ns,微調是0.25ns,而量測結果粗調的時間解析度為8ns。鎖相迴路在電路的應用上是一個重要的模組,近年來發展的潮流也是朝全數位化發展。全數位化的好處是電路對製程的變異性不敏感、電路更改製程容易等。zh_TW
dc.description.abstractThe thesis presents an all-digital phase-locked loop (ADPLL) as a clock generator implemented in 3um LTPS TFT process. The output frequency range of the ADPLL is from 0.625MHz to 12MHz, the multiplication factors of the reference clock are 1 to 30, and the time resolution of the coarse-tuning part of the DCO is 5.6 ns and that of the fine-tuning part is 0.25ns by simulation. The measuring result of the time resolution of course-tuning part is 8ns. PLL is an essential module in many applications, and the trend of development of PLL is toward all-digital realization. The nature of digital circuits has high immunity against process deviation and it is easy for circuits to be ported among different processes.en
dc.description.provenanceMade available in DSpace on 2021-06-08T07:04:25Z (GMT). No. of bitstreams: 1
ntu-98-R94943089-1.pdf: 3239256 bytes, checksum: e6c7c7ab2684960e9773bdc022c951f5 (MD5)
Previous issue date: 2009
en
dc.description.tableofcontents中文摘要 I
Abstract II
圖目錄 VI
表目錄 IX
第一章 簡介 1
________________________________________________________________________________
1.1 低溫多晶矽薄膜電晶體介紹 1
1.2 全數位式鎖相迴路 2
1.3 動機 2
1.4 論文架構 3
第二章 低溫多晶矽薄膜電晶體 5
________________________________________________________________________________
2.1 低溫多晶矽薄膜電晶體介紹 5
2.2 電晶體特性曲線 6
2.3 電路設計考量 9
2.3.1 臨界電壓變異性( ) 9
2.3.2 自發熱效應(self-heating) 10
第三章 鎖相迴路介紹 11
________________________________________________________________________________
3.1 類比式鎖相迴路 11
3.2 數位控制式鎖相迴路 13
3.3 全數位式鎖相迴路 14
3.4 鎖相迴路比較 18
第四章 全數位式鎖相迴路架構 19
________________________________________________________________________________
4.1 電路架構 19
4.2 頻率及相位鎖定演算法 22
4.3 穩定度分析 23
4.4 頻率鎖定 24
4.5 相位鎖定 26
4.6 電路規格 27
4.7 行為模擬 27
第五章 電路模組設計 31
________________________________________________________________________________
5.1 數位控制震盪器 31
5.2 數位式相位頻率偵測器 36
5.3 計數器 37
5.4 正反器 38
5.5 鎖定偵測器 42
5.6 Mask 44
5.7 增益控制器 45
第六章 量測結果及閉迴路模擬 47
________________________________________________________________________________
6.1 數位控制震盪器量測結果 47
6.2 全數位式鎖相迴路模擬結果 53
第七章 結論及展望 58
_____________________________________________________________________________________
7.1 結論 58
7.2 未來展望 59
參考文獻 60
dc.language.isozh-TW
dc.subject全數位式鎖相迴路zh_TW
dc.subject低溫多晶矽薄膜電晶體zh_TW
dc.subjectall-digital phase-locked loopen
dc.subjectLTPS TFTen
dc.title以低溫多晶矽薄膜電晶體製程實現之全數位式鎖相迴路設計zh_TW
dc.titleDesign of all-digital phase-locked loop implemented in LTPS TFT processen
dc.typeThesis
dc.date.schoolyear97-1
dc.description.degree碩士
dc.contributor.oralexamcommittee陳建中(Jiann-John Chen),陳伯奇(Poki Chen),黃崇禧(Chorng-Sii Hwang)
dc.subject.keyword低溫多晶矽薄膜電晶體,全數位式鎖相迴路,zh_TW
dc.subject.keywordLTPS TFT,all-digital phase-locked loop,en
dc.relation.page61
dc.rights.note未授權
dc.date.accepted2009-01-12
dc.contributor.author-college電機資訊學院zh_TW
dc.contributor.author-dept電子工程學研究所zh_TW
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