Skip navigation

DSpace

機構典藏 DSpace 系統致力於保存各式數位資料(如:文字、圖片、PDF)並使其易於取用。

點此認識 DSpace
DSpace logo
English
中文
  • 瀏覽論文
    • 校院系所
    • 出版年
    • 作者
    • 標題
    • 關鍵字
    • 指導教授
  • 搜尋 TDR
  • 授權 Q&A
    • 我的頁面
    • 接受 E-mail 通知
    • 編輯個人資料
  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 電子工程學研究所
請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/25164
完整後設資料紀錄
DC 欄位值語言
dc.contributor.advisor黃俊郎
dc.contributor.authorYuan-Chi Yuen
dc.contributor.author游源祺zh_TW
dc.date.accessioned2021-06-08T06:04:01Z-
dc.date.copyright2007-07-30
dc.date.issued2007
dc.date.submitted2007-07-25
dc.identifier.citation[1] X. Dai, D. Chen, and R. Geiger, “A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs,” IEEE International Symposium on Circuits and Systems, ISCAS, vol. 5, pp. 4831–4834, May 2005.
[2] B.-S. Song, M. F. Tompsett, and K. R. Lakshmikumar, “A 12-bit 1-Msample/s capacitor error-averaging pipelined A/D converter,” IEEE Journal of Solid-State Circuits, vol. 23, no. 6, pp. 1324–1333, Dec. 1988.
[3] H. Ohara, H. X. Ngo, M. J. Armstrong, C. F. Rahim, and P. R. Gray, “A CMOS programmable self-calibrating 13-bit eight-channel data acquisition peripheral,” IEEE Journal of Solid-State Circuits, vol. SC-22, no. 6, pp. 930-938, Dec. 1987.
[4] S.-H. Lee and B.-S. Song, “Digital-domain calibration of multistep analog-to-digital converters,” IEEE Journal of Solid-State Circuits, vol. 27, no. 12, pp. 1679–1688, Dec. 1992.
[5] J. Guo, W. Law, W. J. Helms, and D. J. Allstot, “Digital calibration for monotonic pipelined A/D converters,” IEEE Transactions on Instrumentation and Measurement, vol. 53, no. 12, pp. 1485–1492, Dec. 2004.
[6] B. Provost, and E. Schez-Sinencio, “A practical self-calibration scheme implementation for pipeline ADC,” IEEE Transactions on Instrumentation and Measurement, vol. 53, no. 2, pp. 448—456, Apr. 2004.
[7] L. Jin, D. Chen, and R. Geiger, “A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals,” IEEE International Symposium on Circuits and Systems, ISCAS, vol. 2, pp. 1378—1381, May 2005.
[8] 0. Bernal, F. Bony, P. Laquerre, and M. Lescure, “Digitally self-calibrated pipelined analog-to-digital converter,” IEEE Instrumentation and Measurement Technology Conference, IMTC, pp. 900—904, Apr. 2006.
[9] D. Chen, Z. Yu, and R. Geiger, “An adaptive truly background calibration method for high speed pipeline ADC design,” IEEE International Symposium on Circuits and Systems, ISCAS, vol. 6, pp. 6190—6193, May 2005.
[10] J. Márkus and I. Kollár, “On the monotonicity and linearity of ideal radix-based A/D converters,” IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 6, pp. 2454—2457, Dec. 2005.
dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/25164-
dc.description.abstract在本論文中,我們提出了一個針對1-bit/stage的管線式類比數位轉換器的全數位校正技術,它是從一個既有的數位校正演算法所延伸而來的。原本的方法在校正完後仍會留有些許輸出字碼遭受到異常大的非線性錯誤,而所提出的方法依據輸出字碼的統計直方圖將這些有瑕疵的輸出字碼取出,並根據瑕疵的程度做出不同處理以增加線性度。除了輸入信號以外,其他所有的校正運作都是在數位的範圍裡,並且整體的運作速度與類比數位轉換器本身的轉換速度相同。這個方法不需要對類比數位轉換器本身的類比部份做出任何修改,並且十分容易延伸至其他不同架構的管線式類比數位轉換器。分析的結果顯示出最大的微分非線性誤差將小於最小字碼單位長度的三分之一,而軟體模擬的結果也顯示積分非線性誤差至少會有一個位元精準度的改善。在最後一個可行的硬體實現架構也被提出。zh_TW
dc.description.abstractIn this thesis, a fully digital calibration scheme for the 1-bit/stage pipelined ADC is presented. It is extended from the existing digital calibration algorithm that still suffers arbitrary large DNL in some output codes. The proposed technique extracts these codes from the histogram data and then applies proper modification to them to enhance the linearity. Except for the input ramp signal, the whole calibration is performed in the digital domain and is done at the nominal ADC speed. The approach does not require any modification to the original analog section of the ADC and is convenient to be extended to the different structures of the pipeline stage. The analysis exhibits a bound of 1/3 LSB in the DNL. Simulation result also shows at least 1-bit improvement in the INL. The digital hardware implementation scheme is presented as well.en
dc.description.provenanceMade available in DSpace on 2021-06-08T06:04:01Z (GMT). No. of bitstreams: 1
ntu-96-R94943156-1.pdf: 657486 bytes, checksum: 063db64ca63be9e4d8ac2a84873f71ee (MD5)
Previous issue date: 2007
en
dc.description.tableofcontents誌謝 I
中文摘要 II
ABSTRACT III
TABLE OF CONTENTS IV
LIST OF FIGURES VI
LIST OF TABLES VII
CHAPTER 1 INTRODUCTION 1
1-1 MOTIVATION 1
1-2 SHORT SUMMARY OF THE PROPOSED METHOD 2
CHAPTER 2 PRELIMINARIES 3
2-1 STATIC TESTING OF ADC 3
2-2 FUNDAMENTALS OF PIPELINED ADC 5
2-2.1 Ideal Pipelined ADC 5
2-2.2 A Simplified Model for Each Sage 6
2-2.3 Error Sources of the Pipelined ADC 8
2-2.4 Conventional Calibration Technique 10
2-2.4.1 Coefficient Extraction 14
2-2.5 Problem of Conventional Technique 14
CHAPTER 3 PROPOSED EXTERNAL CALIBRATION TECHNIQUE 16
3-1 DEFINITION OF JUNCTION CODES 16
3-2 THE PROPOSED JUNCTION CODES FIX TECHNIQUE 16
3-2.1 Determine the Junction Codes 17
3-2.2 Further Processing of the Junction Codes 19
3-2.3 Performance Analysis 21
3-2.3.1 DNL Analysis 21
3-2.3.2 INL Analysis 22
3-2.3.3 Extra Memory Usage for Type 1 Codes 24
3-2.4 Overlap Cancellation 24
3-2.5 Generating the Error Coefficients 27
3-2.6 Calibration Coefficients Extraction Algorithm 27
3-2.7 Limited Hardware Resources 28
3-3 DETERMINE NUMBER OF STAGES TO CALIBRATE 30
CHAPTER 4 SIMULATION RESULTS 33
4-1 SIMULATION RESULTS OF JUNCTION CODES PROCESSING 33
4-2 SIMULATION RESULTS OF LIMITED HARDWARE RESOURCE 36
CHAPTER 5 DIGITAL CALIBRATION CIRCUIT IMPLEMENTATION SCHEME 39
5-1 THE CONVENTIONAL DIGITAL CALIBRATION SCHEME 39
5-2 THE PROPOSED DIGITAL CALIBRATION SCHEME 41
5-3 SYNTHESIS RESULT 42
CHAPTER 6 CONCLUSION AND FUTURE WORK 44
REFERENCES 45
dc.language.isoen
dc.subject管線式 類比數位轉換器 校正zh_TW
dc.subjectpipeline ADC Calibrationen
dc.title一管線式類比數位轉換器之全數位外部校正技術zh_TW
dc.titleA Fully Digital External Calibration Technique for 1-bit/stage Pipelined ADCen
dc.typeThesis
dc.date.schoolyear95-2
dc.description.degree碩士
dc.contributor.oralexamcommittee陳竹一,李建模
dc.subject.keyword管線式 類比數位轉換器 校正,zh_TW
dc.subject.keywordpipeline ADC Calibration,en
dc.relation.page45
dc.rights.note未授權
dc.date.accepted2007-07-25
dc.contributor.author-college電機資訊學院zh_TW
dc.contributor.author-dept電子工程學研究所zh_TW
顯示於系所單位:電子工程學研究所

文件中的檔案:
檔案 大小格式 
ntu-96-1.pdf
  未授權公開取用
642.08 kBAdobe PDF
顯示文件簡單紀錄


系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。

社群連結
聯絡資訊
10617臺北市大安區羅斯福路四段1號
No.1 Sec.4, Roosevelt Rd., Taipei, Taiwan, R.O.C. 106
Tel: (02)33662353
Email: ntuetds@ntu.edu.tw
意見箱
相關連結
館藏目錄
國內圖書館整合查詢 MetaCat
臺大學術典藏 NTU Scholars
臺大圖書館數位典藏館
本站聲明
© NTU Library All Rights Reserved