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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 邱奕鵬 | zh_TW |
| dc.contributor.advisor | Yih-Peng Chiou | en |
| dc.contributor.author | 吳勉育 | zh_TW |
| dc.contributor.author | Mian-Yu Wu | en |
| dc.date.accessioned | 2026-03-04T16:15:58Z | - |
| dc.date.available | 2026-03-05 | - |
| dc.date.copyright | 2026-03-04 | - |
| dc.date.issued | 2026 | - |
| dc.date.submitted | 2026-02-18 | - |
| dc.identifier.citation | 參考文獻
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Schoelkopf, "Charge-Insensitive Qubit Design Derived from The Cooper Pair Box," Physical Review A—Atomic, Molecular, and Optical Physics, vol. 76, no. 4, pp. 042319, 2007. [11] D. J. Hover, "Dispersive Readout of a Superconducting Qubit Using a SLUG Amplifier," Ph.D. dissertation, Department of Physics, University of Wisconsin-Madison, Madison, Wisconsin, USA, 2013. [12] J. C. Bardin, D. H. Slichter, and D. J. Reilly, "Microwaves in Quantum Computing," IEEE journal of microwaves, vol. 1, no. 1, pp. 403-427, 2021. [13] A. Caglar, S. Van Winckel, S. Brebels, P. Wambacq, and J. Craninckx, "Design and Analysis of a 4.2 mW 4 K 6–8 GHz CMOS LNA for Superconducting Qubit Readout," IEEE Journal of Solid-State Circuits, vol. 58, no. 6, pp. 1586-1596, 2022. [14] B. Patra, M. Incandela, J. P. G. van Dijk, H. A. R. Homulle, L. Song, M. Shahmohammadi, R. B. Staszewski, A. Vladimirescu, M. Babaie, F. Sebastiano, and E. Charbon, "Cryo-CMOS Circuits and Systems for Quantum Computing Applications," IEEE Journal of Solid-State Circuits, vol. 53, no. 1, pp. 309-321, 2017. [15] B. Lin, H. Mani, P. Marsh, R. Al Hadi, and H. Wang, "A 4.2-9.2 GHz Cryogenic Transformer Feedback Low Noise Amplifier with 4.5 K Noise Temperature and Noise-Power Matching in 22nm CMOS FDSOI," in Proc. IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 2022, pp. 23-26. [16] M. B. Yelten, "A 180-nm X-band Cryogenic CMOS LNA," IEEE Microwave and Wireless Components Letters, vol. 30, no. 4, pp. 395-398, 2020. [17] Y. Peng, A. Ruffino, and E. Charbon, "A Cryogenic Broadband Sub-1-dB NF CMOS Low Noise Amplifier for Quantum Applications," IEEE Journal of Solid-State Circuits, vol. 56, no. 7, pp. 2040-2053, 2021. [18] B. Sadhu, K. Tien, S. Chakraborty, D. Frank, P. Rosno, D. Moertl, M. Yeck, J. Bulzacchelli, D. Frolov, D. Underwood, K. Inoue, C. Baks, D. Ramirez, J. Ekman, R. Black, T. Schmerbeck, R. Richetta, D. Yilma, A. Davies, J. Glick, D. Wisnieff, B. Snell, J. Timmerwilke, R. Robertazzi, G. Zettle, S. Lekuch, S. Willenborg, B. Gaucher, and D. Friedman, "Cryogenic CMOS circuits for future scaled quantum computing systems: challenges and solutions," in Proc. IEEE Custom Integrated Circuits Conference, 2025, pp. 1–3. [19] Y. L. Lin, "設計與分析源極耦合低雜訊放大器" M.S. thesis, Department of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan, 2008. [20] A. Van der Ziel, "Thermal Noise in Field-Effect Transistors," Proceedings of the Institute of Radio Engineers, vol. 50, no. 8, pp. 1808-1812, 1962. [21] A. Van der Ziel, "Flicker Noise in Electronic Devices," in Advances in Electronics and Electron Physics, L. Marton and C. Marton, Eds. New York, NY, USA: Academic Press, 1979, pp. 225–297. [22] X. Jehl, M. Sanquer, R. Calemczuk, and D. Mailly, "Detection of Doubled Shot Noise in Short Normal-Metal/Superconductor Junctions," Nature, vol. 405, no. 6782, pp. 50-53, 2000. [23] B. Razavi, R.-H. Yan, and K. F. Lee, "Impact of Distributed Gate Resistance on the Performance of MOS Devices," IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, vol. 41, no. 11, pp. 750-754, Nov. 1994. [24] R. van Langevelde, J. C. J. Paasschens, A. J. Scholten, R. J. Havens, L. F. Tiemeijer, and D. B. M. Klaassen, "New compact model for induced gate current noise," in Proc. IEEE International Electron Devices Meeting (IEDM) Technical Digest, 2003, pp. 191-194. [25] A. Van der Ziel and E. Chenette, "Noise in Solid State Devices," in Advances in Electronics and Electron Physics, vol. 46, L. Marton and C. Marton, Eds. New York, NY, USA: Academic Press, 1978, pp. 313–383. [26] A. Platzker, W. Struble, and K. T. Hetzler, "Instabilities Diagnosis and The Role of K in Microwave Circuits," in Proc. IEEE MTT-S International Microwave Symposium Digest, 1993, pp. 1185-1188. [27] W. Zhuo, X. Li, S. Shekhar, S. H. K. Embabi, J. Pineda de Gyvez, D. J. Allstot, and E. Sanchez-Sinencio, "A Capacitor Cross-Coupled Common-Gate Low-Noise Amplifier," IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 52, no. 12, pp. 875-879, 2005. [28] L. Belostotski, "No Noise is Good Noise: Noise Matching, Noise Canceling, and Maybe a Bit of Both for Wide-Band LNAs," IEEE Microwave Magazine, vol. 17, no. 8, pp. 28-40, 2016. [29] L. Belostotski and J. W. Haslett, "Noise Figure Optimization of Wide-Band Inductively-Degenerated CMOS LNAs," in Proc. 2007 50th Midwest Symposium on Circuits and Systems, 2007, pp. 1002-1005. [30] R. Saligram, S. Datta, and A. Raychowdhury, "Scaled Back End of Line Interconnects at Cryogenic Temperatures," IEEE Electron Device Letters, vol. 42, no. 11, pp. 1674-1677, 2021. [31] M. Tada, K. Okamoto, T. Tanaka, M. Miyamura, H. Ishikuro, K. Uchida, and T. Sakamoto, "A 65nm Cryogenic CMOS Design and Performance at 4.2 K for Quantum State Controller Application," IEEE Journal of the Electron Devices Society, vol. 12, pp. 28-33, 2023. [32] Y. Cao, W. Zhang, J. Fu, Q. Wang, L. Liu, and A. Guo, "A Complete Small-Signal MOSFET Model and Parameter Extraction Technique for Millimeter Wave Applications," IEEE Journal of the Electron Devices Society, vol. 7, pp. 398-403, 2019. | - |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/101749 | - |
| dc.description.abstract | 隨著超導量子計算技術的快速發展,量子位元數量的規模化對讀取介面電路提出了嚴峻挑戰。為了克服傳統室溫電子設備需透過大量長電纜連接至低溫腔體所帶來的訊號損耗與熱負載問題,將射頻前端電路整合至 4 K 低溫環境的 CryoCMOS 技術已成為關鍵解決方案。本論文旨在設計並實作適用於4 K環境、頻寬涵蓋4–10 GHz之寬頻低雜訊放大器,以滿足頻分多工量子讀取系統之需求。
本研究採用TSMC 28 nm CMOS製程,設計並實作了源極電感退化與交叉電容耦合共閘極(CCC-CG)兩款不同架構之低雜訊放大器。源極退化架構利用電感性回授達成低雜訊與良好輸入匹配,而CCC-CG架構則透過交叉耦合電容提升等效轉導(𝑔𝑚),在低功耗下實現寬頻匹配與增益平坦度。電路設計過程中考量了低溫下 MOS 電晶體載子遷移率提升與閾值電壓漂移之特性,並針對 Chip-on-Board (COB)封裝引入的打線寄生效應進行了嚴謹的電磁模擬與優化。量測結果顯示,兩款晶片在常溫環境下皆功能正常,且透過引入打線電感與PCB寄生模型之擬合模擬,成功驗證了實測頻率偏移之物理成因。在4 K低溫量測中,受惠於金屬導線電阻下降與電晶體轉導提升,電路展現出優異的增益與雜訊性能。本研究成功驗證了 28 nm CMOS 製程應用於高效能量子讀取介面之可行性,並建立了從元件建模、電路設計到低溫封裝量測的完整開發流程,為未來大規模量子電腦之控制晶片設計提供重要參考。 | zh_TW |
| dc.description.abstract | With the rapid development of superconducting quantum computing technology, the scaling of qubit numbers poses severe challenges to readout interface circuits. To overcome the signal attenuation and thermal load issues caused by connecting traditional room-temperature electronics to the cryogenic chamber via massive long cables, integrating RF front-end circuits into the 4 K cryogenic environment using Cryo-CMOS technology has become a key solution. This thesis aims to design and implement broadband low-noise amplifiers (LNAs) suitable for the 4 K environment, covering a bandwidth of 4 – 10 GHz, to meet the requirements of frequency-division multiplexing (FDM) quantum readout systems.
This study utilizes the TSMC 28 nm CMOS process to design and implement two different LNA architectures: Source Inductive Degeneration and Cross-Coupled Capacitor Common-Gate (CCC-CG). The source degeneration architecture utilizes inductive feedback to achieve low noise and good input matching, while the CCC-CG architecture enhances effective transconductance through cross-coupled capacitors, achieving broadband matching and gain flatness with low power consumption. The circuit design process considered the characteristics of carrier mobility enhancement and threshold voltage shift of MOS transistors at cryogenic temperatures. Furthermore, rigorous electromagnetic simulation and optimization were conducted to address the wire-bonding parasitic effects introduced by Chip-on-Board (COB) packaging. Measurement results show that both chips function normally at room temperature. Through fitting simulations incorporating wire bond inductance and PCB parasitic models, the physical causes of the measured frequency shift were successfully verified. In 4 K cryogenic measurements, benefiting from the reduced resistance of metal interconnects and the increased transistor transconductance, the circuits demonstrated excellent gain and noise performance. This research successfully verifies the feasibility of applying the 28 nm CMOS process to high-performance quantum readout interfaces and establishes a complete development flow—from device modeling and circuit design to cryogenic packaging measurement—providing an important reference for the design of control chips for future large-scale quantum computers. | en |
| dc.description.provenance | Submitted by admin ntu (admin@lib.ntu.edu.tw) on 2026-03-04T16:15:58Z No. of bitstreams: 0 | en |
| dc.description.provenance | Made available in DSpace on 2026-03-04T16:15:58Z (GMT). No. of bitstreams: 0 | en |
| dc.description.tableofcontents | 誌謝 i
中文摘要 ii ABSTRACT iii 目次 iv 圖次 vii 表次 xi 第一章 緒論 1 1.1 文獻回顧 1 1.2 研究動機 10 1.3 論文架構 11 第二章 基本原理與研究方法 12 2.1 低雜訊放大器的效能指標及拓樸[9,19] 12 2.1.1 雜訊指數(Noise Figure, NF) 12 2.1.2 增益(Gain) 17 2.1.3 輸入輸出匹配(Matching) 17 2.1.4 穩定度(Stability) 18 2.1.5 功耗(Power Consumption) 19 2.1.6 線性度(Linearity) 19 2.1.7 輸入匹配架構比較(Matching topology comparison) 20 2.2 共源極低雜訊放大器(common-source LNA)架構分析 23 2.2.1 架構原理 23 2.2.2 源極電感退化(Inductive Source Degeneration) 23 2.2.3 雜訊特性分析 25 2.3 共閘極低雜訊放大器(Common-gate LNA)架構分析 26 2.3.1 架構原理 26 2.3.2 交叉電容耦合共閘極(Cross-Coupled Capacitor Common-gate) 26 2.3.3 雜訊特性分析 28 2.4 雜訊匹配(noise matching) 29 第三章 低雜訊放大器設計與模擬 31 3.1 設計流程 31 3.1.1 整體設計流程 31 3.1.2 電路架構與元件參數設計策略 32 3.2 源極退化低雜訊放大器(Inductively Degenerated LNA) 32 3.2.1 輸入級設計與分析 32 3.2.2 中間級設計與分析 35 3.2.3 輸出級設計與驅動 37 3.2.4 完整電路模擬與分析 39 3.3 交叉電容耦合共閘極低雜訊放大器(CCC-CG LNA) 44 3.3.1 輸入級設計與分析 44 3.3.2 中間級設計與分析 47 3.3.3 輸出級設計與驅動 49 3.3.4 完整電路模擬與分析 51 3.4 低溫模型模擬結果 56 3.4.1 源極退化低雜訊放大器 57 3.4.2 交叉電容耦合共閘極低雜訊放大器 60 第四章 實驗架構與量測結果 64 4.1 晶片設計與封裝實現 64 4.1.1 晶片製程與佈局(IC Layout) 64 4.1.2 量測用PCB測試板設計與實作 67 4.1.3 封裝與晶片顯微照片(Die Bonding and Micrograph) 71 4.2 實驗架構與量測方法 75 4.2.1 測試晶片實驗架設(test-kit) 75 4.2.2 常溫環境量測架構 77 4.2.3 低溫環境量測架構 79 4.3 Test-Kit量測結果 81 4.4 DUT室溫量測結果 83 4.4.1 源極退化低雜訊放大器 83 4.4.2 交叉電容耦合共閘極低雜訊放大器 88 4.5 DUT低溫量測結果 92 4.5.1 源極退化低雜訊放大器 93 4.5.2 交叉電容耦合共閘極低雜訊放大器 94 第五章 結論 96 參考文獻 97 | - |
| dc.language.iso | zh_TW | - |
| dc.subject | 低雜訊放大器 | - |
| dc.subject | 低溫 CMOS | - |
| dc.subject | 量子位元讀取 | - |
| dc.subject | 源極電感退化 | - |
| dc.subject | 交叉電容耦合共閘極 | - |
| dc.subject | Low Noise Amplifier (LNA) | - |
| dc.subject | Cryo-CMOS | - |
| dc.subject | Qubit Readout | - |
| dc.subject | Source Inductive Degeneration | - |
| dc.subject | Cross-Coupled Capacitor Common-Gate (CCC-CG) | - |
| dc.title | 應用於超導量子讀取系統之低溫CMOS低功耗寬頻低雜訊放大器設計與實現 | zh_TW |
| dc.title | Design and Implementation of Cryo-CMOS Low-Power Broadband Low Noise Amplifiers for Superconducting Quantum Readout Systems | en |
| dc.type | Thesis | - |
| dc.date.schoolyear | 114-1 | - |
| dc.description.degree | 碩士 | - |
| dc.contributor.oralexamcommittee | 賴志賢;江衍忠 | zh_TW |
| dc.contributor.oralexamcommittee | Chih-Hsien Lai;Yen-Chung Chiang | en |
| dc.subject.keyword | 低雜訊放大器,低溫 CMOS量子位元讀取源極電感退化交叉電容耦合共閘極 | zh_TW |
| dc.subject.keyword | Low Noise Amplifier (LNA),Cryo-CMOSQubit ReadoutSource Inductive DegenerationCross-Coupled Capacitor Common-Gate (CCC-CG) | en |
| dc.relation.page | 99 | - |
| dc.identifier.doi | 10.6342/NTU202600338 | - |
| dc.rights.note | 同意授權(全球公開) | - |
| dc.date.accepted | 2026-02-23 | - |
| dc.contributor.author-college | 電機資訊學院 | - |
| dc.contributor.author-dept | 光電工程學研究所 | - |
| dc.date.embargo-lift | 2026-03-05 | - |
| 顯示於系所單位: | 光電工程學研究所 | |
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