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Publication Year	Title	Author(s)	Department
2007	使用電容量測曲線的低散逸因子區域來決定超薄閘極氧化層的厚度 Determination of Ultrathin Gate Oxide Thickness (＜2.0 nm) Using Low Dissipation Factor Regions of C－V Measurements	*Po-Kai Chang; 張博凱*	電子工程學研究所
2018	碳化矽基金屬/薄氧化層/半導體元件結構在紫外光照射下的電特性研究 Electrical Characterization of 4H–SiC Metal–Thin Oxide–Semiconductor Structure Examined by Ultraviolet Illumination	*Po-Kai Chang; 張博凱*	電子工程學研究所
2025	都市地區交通污染源之微粒肺部沉積表面積濃度評估 Evaluation of Lung Deposited Surface Area from Traffic Emission in the Urban Area	*張博凱; Po-Kai Chang*	環境工程學研究所

Showing results 1 to 3 of 3

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