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| ???org.dspace.app.webui.jsptag.ItemTag.dcfield??? | Value | Language |
|---|---|---|
| dc.contributor.advisor | 高振宏 | zh_TW |
| dc.contributor.advisor | C Robert Kao | en |
| dc.contributor.author | 吳培綱 | zh_TW |
| dc.contributor.author | Pei-Kang Wu | en |
| dc.date.accessioned | 2025-09-10T16:24:31Z | - |
| dc.date.available | 2025-09-11 | - |
| dc.date.copyright | 2025-09-10 | - |
| dc.date.issued | 2025 | - |
| dc.date.submitted | 2025-07-28 | - |
| dc.identifier.citation | 1. Chen, R., Y.-C. Li, J.-M. Cai, K. Cao, and H.-B.-R. Lee, Atomic level deposition to extend Moore’s law and beyond. International Journal of Extreme Manufacturing, 2020. 2(2): p. 022002.
2. Medhat, D., M. Dessouky, and D. Khalil, A programmable checker for automated 2.5 D/3D IC latch-up verification and hot junctions detection. Microelectronics Reliability, 2021. 124: p. 114310. 3. Tu, K.-N., H.-Y. Hsiao, and C. Chen, Transition from flip chip solder joint to 3D IC microbump: Its effect on microstructure anisotropy. Microelectronics Reliability, 2013. 53(1): p. 2-6. 4. Zhang, S., Z. Li, H. Zhou, R. Li, S. Wang, K.-W. Paik, and P. He, Challenges and recent prospectives of 3D heterogeneous integration. e-Prime-Advances in Electrical Engineering, Electronics and Energy, 2022. 2: p. 100052. 5. Tu, K.-N. and Y. Liu, Recent advances on kinetic analysis of solder joint reactions in 3D IC packaging technology. Materials Science and Engineering: R: Reports, 2019. 136: p. 1-12. 6. Tu, K.-N., Reliability challenges in 3D IC packaging technology. Microelectronics Reliability, 2011. 51(3): p. 517-523. 7. Yao, Y., Y. An, J. Dong, Y. Wang, K. Tu, and Y. Liu, Effect of Joule heating on the reliability of microbumps in 3D IC. Journal of Materials Research and Technology, 2024. 31: p. 3374-3382. 8. Sakuma, K., K. Tunga, B. Webb, K. Ramachandran, M. Interrante, H. Liu, M. Angyal, D. Berger, J. Knickerbocker, and S. Iyer. An enhanced thermo-compression bonding process to address warpage in 3D integration of large die on organic substrates. in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC). 2015. IEEE. 9. Vianco, P. and M. Neilsen, Processing and Reliability of Solder Interconnections in Stacked Packaging. 3D Microelectronic Packaging: From Architectures to Applications, 2021: p. 471-526. 10. Dias, M., T. Costa, O. Rocha, J.E. Spinelli, N. Cheung, and A. Garcia, Interconnection of thermal parameters, microstructure and mechanical properties in directionally solidified Sn–Sb lead-free solder alloys. Materials Characterization, 2015. 106: p. 52-61. 11. Zoran Miric, A. and A. Grusd, Lead‐free alloys. Soldering & Surface Mount Technology, 1998. 10(1): p. 19-25. 12. Tunthawiroon, P. and K. Kanlayasiri, Effects of Ag contents in Sn–xAg lead-free solders on microstructure, corrosion behavior and interfacial reaction with Cu substrate. Transactions of Nonferrous Metals Society of China, 2019. 29(8): p. 1696-1704. 13. Subramanian, K., K. Suganuma, and K.-S. Kim, Sn-Zn low temperature solder. Lead-Free Electronic Solders: A Special Issue of the Journal of Materials Science: Materials in Electronics, 2007: p. 121-127. 14. Zhong, S.-j., L. Zhang, M.-l. Li, W.-m. Long, and F.-j. Wang, Development of lead-free interconnection materials in electronic industry during the past decades: Structure and properties. Materials & Design, 2022. 215: p. 110439. 15. Liu, X., C. Wang, F. Gao, I. Ohnuma, and K. Ishida, Thermodynamic calculation of phase equilibria in the Sn-Ag-Cu-Ni-Au system. Journal of electronic materials, 2007. 36: p. 1429-1441. 16. Liu, Y. and K. Tu, Low melting point solders based on Sn, Bi, and In elements. Materials Today Advances, 2020. 8: p. 100115. 17. Jayaram, V., O. Gupte, K. Bhangaonkar, and C. Nair, A review of low-temperature solders in microelectronics packaging. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2023. 13(4): p. 570-579. 18. Sun, L., Z. Guo, X. Zhao, Y. Liu, K. Tu, and Y. Liu, A new low-temperature solder assembly technique to replace eutectic Sn-Bi solder assembly. Micromachines, 2022. 13(6): p. 867. 19. Aspandiar, R., K. Byrd, K.K. Tang, L. Campbell, and S. Mokler. Investigation of low temperature solders to reduce reflow temperature, improve SMT yields and realize energy savings. in Proceedings of the 2015 APEX Conference. 2015. 20. Han Le, D., Improving the mechanical properties of the In52Sn48 alloy by adding third elements. 2022, 博士論文. 21. Han, D.L., Y.-A. Shen, F. Huo, and H. Nishikawa, Microstructure evolution and shear strength of tin-indium-xCu/Cu joints. Metals, 2021. 12(1): p. 33. 22. Subramanian, K., S.-W. Chen, C.-H. Wang, S.-K. Lin, and C.-N. Chiu, Phase diagrams of Pb-free solders and their related materials systems. Lead-Free Electronic Solders: A Special Issue of the Journal of Materials Science: Materials in Electronics, 2007: p. 19-37. 23. Dong, W., Y. Shi, Z. Xia, Y. Lei, and F. Guo, Effects of trace amounts of rare earth additions on microstructure and properties of Sn-Bi-based solder alloy. Journal of Electronic Materials, 2008. 37: p. 982-991. 24. Wang, F., H. Chen, Y. Huang, L. Liu, and Z. Zhang, Recent progress on the development of Sn–Bi based low-temperature Pb-free solders. Journal of Materials Science: Materials in Electronics, 2019. 30: p. 3222-3243. 25. Ribas, M., A. Kumar, D. Kosuri, R.R. Rangaraju, P. Choudhury, S. Telu, and S. Sarkar. Low temperature soldering using Sn-Bi alloys. in Proceedings of SMTA International. 2017. 26. Ribas, M., S. Chegudi, A. Kumar, R. Pandher, R. Raut, S. Mukherjee, S. Sarkar, and B. Singh. Development of low-temperature drop shock resistant solder alloys for handheld devices. in 2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013). 2013. IEEE. 27. Li, W., L. Guo, D. Li, and Z.-Q. Liu, Research Overview on the Electromigration Reliability of SnBi Solder Alloy. Materials, 2024. 17(12): p. 2848. 28. Hadian, F., S. Panta, J. Flores, and E.J. Cotts, The failure of Sn-Bi-based solder joints due to current stressing. Journal of Electronic Materials, 2023. 52(2): p. 751-759. 29. Mokhtari, O. and H. Nishikawa, Correlation between microstructure and mechanical properties of Sn–Bi–X solders. Materials Science and Engineering: A, 2016. 651: p. 831-839. 30. Chen, X., F. Xue, J. Zhou, and Y. Yao, Effect of In on microstructure, thermodynamic characteristic and mechanical properties of Sn–Bi based lead-free solder. Journal of Alloys and Compounds, 2015. 633: p. 377-383. 31. El-Daly, A., H. El-Hosainy, T. Elmosalami, and W. Desoky, Microstructural modifications and properties of low-Ag-content Sn–Ag–Cu solder joints induced by Zn alloying. Journal of Alloys and Compounds, 2015. 653: p. 402-410. 32. McCormack, M. and S. Jin, Improved mechanical properties in new, Pb-free solder alloys. Journal of electronic materials, 1994. 23: p. 715-720. 33. Zhou, S., O. Mokhtari, M.G. Rafique, V.C. Shunmugasamy, B. Mansoor, and H. Nishikawa, Improvement in the mechanical properties of eutectic Sn58Bi alloy by 0.5 and 1 wt% Zn addition before and after thermal aging. Journal of Alloys and Compounds, 2018. 765: p. 1243-1252. 34. Wang, Q., H. Chen, and F. Wang, Effect of trace Zn addition on interfacial evolution in Sn-10Bi/Cu solder joints during aging condition. Materials, 2019. 12(24): p. 4240. 35. Mokhtari, O., S. Zhou, and H. Nishikawa, Effect of Zn addition on interfacial reactions between Sn-Bi solder and Cu substrate. Materials Transactions, 2016. 57(8): p. 1272-1276. 36. Yang, T., X. Zhao, Z. Xiong, W. Tan, Y. Wei, C. Tan, X. Yu, and Y. Wang, Improvement of microstructure and tensile properties of Sn–Bi–Ag alloy by heterogeneous nucleation of β-Sn on Ag3Sn. Materials Science and Engineering: A, 2020. 785: p. 139372. 37. Minho, O., Y. Tanaka, and E. Kobayashi, Microstructure evolution at the interface between Cu and eutectic Sn–Bi alloy with the addition of Ag or Ni. Journal of Materials Research and Technology, 2023. 26: p. 8165-8180. 38. Ma, L., G. Xu, F. Guo, and X. Wang. Retarding electromigration on the Sn-Ag-Cu solder joints by micro-sized metal-particle reinforcement. in 2011 12th International Conference on Electronic Packaging Technology and High Density Packaging. 2011. IEEE. 39. Chen, C.-m. and C.-c. Huang, Effects of silver doping on electromigration of eutectic SnBi solder. Journal of Alloys and Compounds, 2008. 461(1-2): p. 235-241. 40. Wang, F., Y. Huang, Z. Zhang, and C. Yan, Interfacial reaction and mechanical properties of Sn-Bi solder joints. Materials, 2017. 10(8): p. 920. 41. Kim, D.-G., H.-S. Jang, and S.-B. Jung, Solid state intermetallic compound layer growth between Sn-8Zn-3Bi solder and bare copper substrate. Journal of Materials Science: Materials in Electronics, 2005. 16: p. 523-528. 42. Yang, S., Y. Wang, C. Chang, and C. Kao, Analysis and experimental verification of the volume effect in the reaction between Zn-doped solders and Cu. Journal of electronic materials, 2008. 37: p. 1591-1597. 43. Jiang, J., J.-E. Lee, K.-S. Kim, and K. Suganuma, Oxidation behavior of Sn–Zn solders under high-temperature and high-humidity conditions. Journal of alloys and compounds, 2008. 462(1-2): p. 244-251. 44. Jin, Z., S. Fujiwara, J. Takenaka, K. Hagio, and H. Nishikawa, Impact reliability enhancement approach of Sn–Bi–Zn–in alloy bumps under high-humidity and high-temperature tests. Journal of Materials Research and Technology, 2023. 27: p. 7013-7023. 45. Yang, S., C. Ho, C. Chang, and C. Kao, Strong Zn concentration effect on the soldering reactions between Sn-based solders and Cu. Journal of materials research, 2006. 21(10): p. 2436-2439. 46. Ma, D. and P. Wu, Effects of Zn concentration on the aging reactions and IMC massive spalling phenomenon in the Sn–58Bi–x Zn/Cu system. Journal of Materials Science: Materials in Electronics, 2015. 26: p. 1338-1346. | - |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/99477 | - |
| dc.description.abstract | 本研究探討在錫-鉍-銦基銲料中添加不同的合金元素(如鎳、銅、銀與鋅)對其與銅基板之介面反應的影響。對於錫-鉍-銦-(鎳、銅、銀)/銅銲點而言,在迴焊後可在介面觀察到Cu6Sn5介金屬化合物的生成。在等溫時效處理的過程中,Cu6Sn5層持續增厚,導致介面處鉍相顯著累積。由於該富鉍層具高脆性,可能會削弱銲點的剪切強度。相較之下,當添加鋅元素時,錫-鉍-鋅/銅介面會生成Cu5Zn8介金屬。由於Cu5Zn8的生長並不消耗錫,因此能有效抑制時效處理過程中鉍的聚集。
根據上述結果,錫-鉍-鋅與錫-鉍-銀-鋅被視為具發展潛力的合金材料,值得進一步探究。本研究進一步以小尺寸銲球評估錫-鉍-鋅與錫-鉍-銀-鋅銲點於攝氏120度等溫時效處理後的介面反應與機械性質。然而,在高溫條件下,含鋅銲料出現嚴重的氧化現象,氧化反應深入銲球內部及介面,顯著降低銲點的剪切強度。為進一步釐清氧化問題,本研究設計了於不同環境條件下進行高溫時效處理的實驗,包含真空、空氣、油浴爐環境下與包覆底部填充膠的樣品,以探討錫-鉍-鋅銲料的氧化行為。 | zh_TW |
| dc.description.abstract | This study investigates the effects of adding various alloying elements such as Ni, Sb, Cu, Ag, and Zn on the interfacial reactions of Sn-Bi-In-based solder joints with Cu substrates. For the Sn-Bi-In-(Ni, Sb, Cu, Ag)/Cu solder joint, Cu6Sn5 intermetallic compounds (IMCs) were observed at the interface after reflow. During isothermal aging, the Cu₆Sn₅ layer thickened, leading to significant Bi phase accumulation at the interface. The presence of this brittle Bi-rich layer may deteriorate the shear strength of solder joints. In contrast, when Zn was added, Cu5Zn8 formed at the Sn-Bi-Zn/Cu interface. Since the growth of Cu5Zn8 does not consume Sn, it effectively suppressed Bi accumulation at the interface during aging.
Based on these results, Sn-Bi-Zn and Sn-Bi-Ag-Zn were identified as two promising candidates for further investigation. We examined the interfacial reactions and mechanical properties of Sn-Bi-Zn, and Sn-Bi-Ag-Zn solder joints using small solder balls after aging at 120 °C. However, high-temperature aging caused severe oxidation in the Zn-containing solders, penetrating both the solder interior and the interfacial region, which significantly reduced the shear strength of the joints. To further investigate this issue, we conducted aging tests under different environmental conditions, including vacuum, air, silicone oil bath, and samples encapsulated with underfill, to examine the oxidation behavior of Sn-Bi-Zn solder. | en |
| dc.description.provenance | Submitted by admin ntu (admin@lib.ntu.edu.tw) on 2025-09-10T16:24:31Z No. of bitstreams: 0 | en |
| dc.description.provenance | Made available in DSpace on 2025-09-10T16:24:31Z (GMT). No. of bitstreams: 0 | en |
| dc.description.tableofcontents | 誌謝 i
中文摘要 iii ABSTRACT iv CONTENTS v LIST OF FIGURES viii LIST OF TABLES xv Chapter 1 Introduction 1 1.1 3D IC Technology 1 1.2 The growth kinetics Reliability Issues in 3D IC Integration 5 1.3 Lead-Free Solders 8 1.4 Low-Temperature Solders 11 1.4.1 Demand for Low-Temperature Solders 11 1.4.2 Sn-In Solder Alloys 14 1.4.3 Sn-Bi Solder Alloys 16 Chapter 2 Literature Review 20 2.1 Effect of In addition into Sn-Bi solder 20 2.2 Effect of Zn addition into Sn-Bi solder 24 2.3 Effect of Ag addition into Sn-Bi solder 29 Chapter 3 Objectives 33 Chapter 4 Experimental Procedures 34 4.1 Bulk Solder 34 4.1.1 Alloy Preparation 34 4.1.2 Solid-Solid Interfacial Reaction 36 4.2 Small Solder Ball 38 4.2.1 Solid-Solid Interfacial Reaction 38 4.2.2 Oxidation Behavior of Sn-Bi-Zn Solder under Various Environmental Conditions 40 4.2.3 Ball Shear Test and Fracture Surface Analysis 42 Chapter 5 Results and Discussions 43 5.1 Bulk Solder 43 5.1.1 Interfacial Reactions between Sn-Bi-In solder with Cu substrate at 120°C 43 5.1.2 Effect of Minor Alloying Additions on the Interfacial Reactions Between Sn-Bi-In Solder and Cu Substrate at 120°C 45 5.1.3 Effect of Minor Alloying Additions on Bi Accumulation at the Interface 50 5.1.4 Issues Associated with Minor In Addition 52 5.1.5 Growth Kinetics of Cu5Zn8 54 5.2 Small Solder Ball 60 5.2.1 Interfacial Reactions of Sn-Bi-Zn and Sn-Bi-Ag-Zn Solders with Cu substrate at 120 °C 60 5.2.2 Oxidation Behavior of Sn-Bi-Zn Solder under Various Environmental Conditions 73 5.2.3 Ball Shear Test and Fracture Behavior Analysis 76 Chapter 6 Conclusions 84 REFERENCE 86 | - |
| dc.language.iso | en | - |
| dc.subject | 錫鉍 | zh_TW |
| dc.subject | 低溫銲料 | zh_TW |
| dc.subject | 介面反應 | zh_TW |
| dc.subject | 剪切強度 | zh_TW |
| dc.subject | 鋅 | zh_TW |
| dc.subject | interfacial reaction | en |
| dc.subject | Sn-Bi | en |
| dc.subject | low-temperature solder | en |
| dc.subject | zinc | en |
| dc.subject | shear strength | en |
| dc.title | 微量添加元素對錫鉍銲料與銅基板介面反應之影響 | zh_TW |
| dc.title | Influence of Minor Alloying Elements on the Interfacial Reactions Between Sn-Bi Solder and Cu Substrate | en |
| dc.type | Thesis | - |
| dc.date.schoolyear | 113-2 | - |
| dc.description.degree | 碩士 | - |
| dc.contributor.oralexamcommittee | 沈育安;王儀雯;林詠勝;王金勝 | zh_TW |
| dc.contributor.oralexamcommittee | Yu-An Shen;Yi-Wun Wang;Yung-Sheng Lin;Jin-Sheng Wang | en |
| dc.subject.keyword | 錫鉍,低溫銲料,介面反應,剪切強度,鋅, | zh_TW |
| dc.subject.keyword | Sn-Bi,low-temperature solder,interfacial reaction,shear strength,zinc, | en |
| dc.relation.page | 93 | - |
| dc.identifier.doi | 10.6342/NTU202502457 | - |
| dc.rights.note | 同意授權(全球公開) | - |
| dc.date.accepted | 2025-07-29 | - |
| dc.contributor.author-college | 工學院 | - |
| dc.contributor.author-dept | 材料科學與工程學系 | - |
| dc.date.embargo-lift | 2030-07-24 | - |
| Appears in Collections: | 材料科學與工程學系 | |
Files in This Item:
| File | Size | Format | |
|---|---|---|---|
| ntu-113-2.pdf Until 2030-07-24 | 7.3 MB | Adobe PDF |
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