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  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 電子工程學研究所
請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/93842
完整後設資料紀錄
DC 欄位值語言
dc.contributor.advisor李建模zh_TW
dc.contributor.advisorJames Chien-Mo Lien
dc.contributor.author李詠珍zh_TW
dc.contributor.authorYung-Jen Leeen
dc.date.accessioned2024-08-08T16:30:35Z-
dc.date.available2024-08-09-
dc.date.copyright2024-08-08-
dc.date.issued2024-
dc.date.submitted2024-08-02-
dc.identifier.citationK. Neshatpour, W. Burleson, A. Khajeh, and H. Homayoun, “Enhancing power, per formance, and energy efficiency in chip multiprocessors exploiting inverse thermal dependence,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 26, no. 4, pp. 778–791, 2018.
Y.-C. Fang, H.-Y. Lin, M.-Y. Sui, C.-M. Li, and E. J.-W. Fang, “Machine-learning -based dynamic ir drop prediction for eco,” in 2018 IEEE/ACM International Con ference on Computer-Aided Design (ICCAD), pp. 1–7, 2018.
Z. Xie, H. Ren, B. Khailany, Y. Sheng, S. Santosh, J. Hu, and Y. Chen, “Pow ernet: Transferable dynamic ir drop estimation via maximum convolutional neural network,” in 2020 25th Asia and South Pacific Design Automation Conference (ASP DAC), pp. 13–18, 2020.
V. A. Chhabria, Y. Zhang, H. Ren, B. Keller, B. Khailany, and S. S. Sapatnekar, “Mavirec: Ml-aided vectored ir-drop estimation and classification,” in 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), pp. 1825–1828, 2021.
Y.-T. Wu, Z.-J. Liang, C.-H. Hsieh, Y.-F. Yang, Y.-J. Lee, J. C.-M. Li, N. Chang, Y.-S. Li, and L. Lin, “Dynamic ir-drop prediction of at-speed two-vector tests using machine learning,” in 2024 International Symposium on VLSI Technology, Systems and Applications (VLSI TSA), 2024.
Y. Zhang, H. Ren, and B. Khailany, “Grannite: Graph neural network inference for transferable power estimation,” in 2020 57th ACM/IEEE Design Automation Con ference (DAC), pp. 1–6, 2020.
V. Vashishtha, M. Vangala, and L. T. Clark, “Asap7 predictive design kit develop ment and cell design technology co-optimization: Invited paper,” in 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), pp. 992–998, 2017.
S. Lin and N. Chang, “Challenges in power-ground integrity,” in Proceedings of the 2001 IEEE/ACM International Conference on Computer-Aided Design, ICCAD ’01, p. 651–654, IEEE Press, 2001.
X.-X. Huang, H.-C. Chen, S.-W. Wang, I. H.-R. Jiang, Y.-C. Chou, and C.-H. Tsai, “Dynamic ir-drop eco optimization by cell movement with current waveform staggering and machine learning guidance,” in 2020 IEEE/ACM International Confer ence On Computer Aided Design (ICCAD), pp. 1–9, 2020.
S. Kundu, M. Prasad, S. Nishad, S. Nachireddy, and H. K, “Mlir: Machine learning based ir drop prediction on eco revised design for faster convergence,” in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID), pp.68–73, 2022.
N. V. Chawla, K. W. Bowyer, L. O. Hall, and W. P. Kegelmeyer, “Smote: synthetic minority over-sampling technique,” J. Artif. Int. Res., vol. 16, p. 321–357, jun 2002.
J.-X. Chen, S.-T. Liu, Y.-T. Wu, M.-T. Wu, C.-M. Li, N. Chang, Y.-S. Li, and W.-T. Chuang, “Vector-based dynamic ir-drop prediction using machine learning,” in 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 202–207, 2022.
N. Chang, W. Chuang, G. K. Tsavatanalli, J. Geada, H. Zhuang, S. Ramachandran, R. Raian, Y.-S. Li, Y. Jia, M. Kaipanatu, S. K. Mantena, M.-C. Shih, A. Yang, and R. Jang, “Applying machine learning to design for reliability coverage,” in 2019 IEEE International Reliability Physics Symposium (IRPS), pp. 1–7, 2019.
C. Ding and H. Peng, “Minimum redundancy feature selection from microarray gene expression data,” in Computational Systems Bioinformatics. CSB2003. Proceedings of the 2003 IEEE Bioinformatics Conference. CSB2003, pp. 523–528, 2003.
R. A. Fisher, “Statistical methods for research workers,” in Breakthroughs in statis tics: Methodology and distribution, pp. 66–70, Springer, 1970.
A. Gaisler, Gaisler home page, 2010. Available at https://www.gaisler.com/index.php.
RedHawk-SC User Manual. Ansys Inc., 2021.
T. Chen and C. Guestrin, “Xgboost: A scalable tree boosting system,” in Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD'16, ACM, Aug. 2016.
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dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/93842-
dc.description.abstract在關鍵時序路徑上過大的電路壓降會導致時序違規,因此電路壓降簽核至關重要。現有的機器學習方法在預測向量的動態電路壓降時,對於關鍵時序路徑上的壓降熱點表現出較大的預測誤差。本文提出了一種精確預測向量的動態電路壓降的方法,並且專注於預測關鍵時序路徑上的壓降熱點。我們的方法包括提取關鍵時序元件、創建電阻加權特徵,以及引入系統性的特徵選擇流程以提高預測準確度。實驗結果顯示,與以往的研究相比,我們的方法在關鍵時序路徑上的壓降熱點的平均絕對誤差減少了45.7%,最大誤差則減少了40.2%。我們的研究為關鍵時序路徑上的壓降熱點提供精確的動態電路壓降預測,以進一步輔助時序簽核過程。zh_TW
dc.description.abstractIR-drop sign-off is very important since excessive IR-drop on critical timing paths can lead to timing violations. Existing machine learning methods to predict vector-based dynamic IR-drop exhibit large prediction errors for IR-hotspots on critical timing paths. This paper presents an approach for accurate vector-based dynamic IR-drop prediction focusing on IR-hotspots on critical timing paths. Our method includes the extraction of critical timing cells, creation of resistance-weighted features, and introduction of a systematic feature selection flow to enhance prediction accuracy. Experimental results show an average reduction of 45.7% in mean absolute error (MAE) and 40.2% in maximum error (MaxE) for IR-hotspots on critical timing paths compared to previous works. This research aids the timing sign-off process by offering accurate dynamic IR-drop prediction for IR-hotspots on critical timing paths.en
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dc.description.tableofcontents致謝 (i)
摘要 (ii)
Abstract (iii)
Contents (iv)
List of Figures (vi)
List of Tables (vii)
Chapter 1 Introduction (1)
1.1 Motivation (1)
1.2 Proposed Technique (4)
1.3 Contributions (6)
1.4 Organization (6)
Chapter 2 Background (8)
2.1 Background of IR-drop (8)
2.2 Traditional IR-drop Analysis (9)
2.3 Dynamic IR-drop Predictors for ECO-revised Circuit (10)
2.4 Dynamic IR-drop Predictors for Different Vectors (13)
Chapter 3 Proposed Techniques (17)
3.1 Proposed Flow (17)
3.2 Critical Timing Cell Extraction (18)
3.3 Feature Extraction (20)
3.4 Feature Creation (23)
3.4.1 Resistance-weighted Features (23)
3.4.2 Space-windowed and Time-sliced Features (24)
3.5 Feature Selection (27)
3.6 Machine Learning (32)
Chapter 4 Experimental Results (35)
4.1 Experimental Setup (35)
4.2 Evaluation Metrics (38)
4.3 Proposed Techniques Effectiveness (40)
4.4 Comparison with Previous Work (42)
Chapter 5 Discussion (45)
5.1 Machine Learning Model Candidates (45)
5.2 Memory Issue (47)
5.3 Future Work (49)
Chapter 6 Conclusion (53)
References (55)
Appendix A - Selected Features (59)
A.1 Selected Features in Feature Selection Flow (59)
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dc.language.isoen-
dc.subject特徵選擇zh_TW
dc.subject動態電路壓降zh_TW
dc.subject機器學習zh_TW
dc.subject關鍵時序路徑zh_TW
dc.subjectDynamic IR-dropen
dc.subjectCritical Timing Pathsen
dc.subjectFeature Selectionen
dc.subjectMachine Learningen
dc.title對於關鍵時序路徑上壓降熱點之準確向量動態壓降預測zh_TW
dc.titleAccurate Vector-based Dynamic IR-drop Prediction for IR-hotspots on Critical Timing Pathsen
dc.typeThesis-
dc.date.schoolyear112-2-
dc.description.degree碩士-
dc.contributor.oralexamcommittee江蕙如;張鴻嘉zh_TW
dc.contributor.oralexamcommitteeIris Hui-Ru Jiang;Norman Changen
dc.subject.keyword動態電路壓降; 關鍵時序路徑; 特徵選擇; 機器學習zh_TW
dc.subject.keywordDynamic IR-drop; Critical Timing Paths; Feature Selection; Machine Learningen
dc.relation.page61-
dc.identifier.doi10.6342/NTU202402564-
dc.rights.note同意授權(限校園內公開)-
dc.date.accepted2024-08-06-
dc.contributor.author-college電機資訊學院-
dc.contributor.author-dept電子工程學研究所-
dc.date.embargo-lift2029-07-29-
顯示於系所單位:電子工程學研究所

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