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請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/86397
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dc.contributor.advisor莊東漢(Tung-Han Chuang)
dc.contributor.authorGoh Jia Chern Jesmonden
dc.contributor.author吳家成zh_TW
dc.date.accessioned2023-03-19T23:53:26Z-
dc.date.copyright2022-08-30
dc.date.issued2022
dc.date.submitted2022-08-19
dc.identifier.citationCheng H. C., Chiang K. N., and Lee M. H., 'An Alternative Local/Global Finite Element Approach for Ball Grid Array Typed Packages', To be published at June ASME Transaction, Journal of Electronic Packaging, 1998. 薛明泰「懸臂式探針卡有限元素模擬分析」,中華大學碩士論文 黃榮堂, 賴文雄「晶圓級探針卡簡介」,台北科技大學機電整合研究所. Chien-Yi Huang, Ting-Jue Jan, Chia-Cheng Wu, “Applying TRIZ Methodology to Develop the Probe Card Tester in Semiconductor Manufacturing”, Int. J. Systematic Innovation, 3(3), 39-49 (2015) R. Iscoff, “What’s in the cards for wafer probing, ”Semi conduct. Int (June, 1994, pp. 76. Leslie, B. and Matta, F., “Membrane Probe Card Technology,” International Test Conference, pp. 601-607, 1988. 王宏杰, 黃雅如, 蔡居恕「積體化探針卡」,機械工業雜誌第257 期, pp. 185-194. Tunaboylu, B., Soydan, A. M. , 2018, 'MEMS Technologies Enabling the Future Wafer Test Systems', in S. Yellampalli (ed.), MEMS Sensors - Design and Application, IntechOpen, London. Lassner, Erik (1999). Tungsten: Properties, Chemistry, Technology of the Element, Alloys and Chemical Compounds. Springer. pp. 16-40. ISBN 978-0-306-45053-2. 林源記「半導體測試用高效能傳導元件之設計與製作」,國立交通大學碩士論文. Pelleg, Joshua (2013).“Mechanical Properties of Materials”. New York: Springer. pp. 236–239. ISBN 978-94-007-4341-0 Saitoh, S., Sasaki, K., Nezu, T., Taira, M., & Araki, Y. (2008). Hardness and composition of solution-treated Ag-Pd-Cu-Au alloy microstructures. Materials transactions, 0809010535-0809010535. W.D. Callister. Fundamentals of Materials Science and Engineering, 2nd ed. Wiley & Sons. pp. 252. Hyo-Joung Seol, Dong-Jin Noh, Sang-Hwa Lee, Yong Hoon Kwon, Hyung-Il Kim,“Age-hardening by the formation of metastable phases in an In-added Au–Ag–Cu–Pd alloy”,Materials Characterization,Volume 59, Issue 9,2008,Pages 1190-1195, Kad, B K; Heatherington, J H; McKamey, C; Wright, I; Sikka, V; Judkins, R. “Optimization of High Temperature Hoop Creep Response in ODS-Fe3Al Tubes” Conference: 17th Annual Conference on Fossil Energy Materials, Baltimore, MD (US), 04/22/2003--04/24/2003; Other Information: PBD: 22 Apr 2003 Ichikawa, Kiyoshi, and Masakazu Achikita. 'Electric conductivity and mechanical properties of carbide dispersion-strengthened copper prepared by compocasting.' Materials transactions, JIM 34.8 (1993): 718-724. Sakai, Y., K. Inoue, and H. Maeda. 'New high-strength, high-conductivity Cu-Ag alloy sheets.' Acta metallurgica et materialia 43.4 (1995): 1517-1522. Sakai, Y., and H-J. Schneider-Muntau. 'Ultra-high strength, high conductivity Cu-Ag alloy wires.' Acta materialia 45.3 (1997): 1017-1023. Tian, Y. Z., Wu, S. D., Zhang, Z. F., Figueiredo, R. B., Gao, N., & Langdon, T. G. (2011). Microstructural evolution and mechanical properties of a two-phase Cu–Ag alloy processed by high-pressure torsion to ultrahigh strains. Acta Materialia, 59(7), 2783-2796. Maurice M. Karnowsky“Ageing of a Pd-35 at% Ag-25 at% Cu solid solution alloy” JOURNAL OF MATERIALS SCIENCE 13 (1978) 2339-2346 Iwamoto, C., Adachi, N., Watanabe, F., & Koitabashi, R. (2018). Microstructure Evolution in Cu-Pd-Ag Alloy Wires During Heat Treatment. Metallurgical and Materials Transactions A, 49(10), 4947-4955. Volkov, A. Yu. 'Improvements to the microstructure and physical properties of Pd-Cu-Ag alloys.' Platinum Metals Review 48.1 (2004): 3-11. Tian, Y. Z., and Z. F. Zhang. 'Microstructures and tensile deformation behavior of Cu–16 wt.% Ag binary alloy.' Materials Science and Engineering: A 508.1-2 (2009): 209-213. Han, K., Vasquez, A. A., Xin, Y., & Kalu, P. N. (2003). Microstructure and tensile properties of nanostructured Cu-25wt% Ag. Acta Materialia, 51(3), 767-780. An, B., Xin, Y., Niu, R., Xiang, Z., Wang, E., & Han, K. (2022). Nucleation and growth of discontinuous precipitates in Cu–Ag alloys. Materials Research Express, 9(2), 026530. Liu, Z., Qiu, D., Wang, F., Taylor, J. A., & Zhang, M. (2014). The grain refining mechanism of cast zinc through silver inoculation. Acta materialia, 79, 315-326. Mukundan V, Yin J, Joseph P, Luo J, Shan S, Zakharov DN, Zhong CJ, Malis O. Nanoalloying and phase transformations during thermal treatment of physical mixtures of Pd and Cu nanoparticles. Sci Technol Adv Mater. 2014 Mar 26;15(2):025002. doi: 10.1088/1468-6996/15/2/025002. PMID: 27877663; PMCID: PMC5090414. Greenberg, B. A., et al. 'Ordering and recrystallization of CuAu alloy after cold deformation.' Intermetallics 5.4 (1997): 297-309. Akins, P.; Jones, L. Chemical Principles “The Guest for Insight, 4th edition”; W. H. Freeman and Company: New York, 2008; p. 202. Cahn, John W. 'Spinodal decomposition.' Trans. Metal. Soc. AIME. 242 (1968): 166-180. Ceresara, S., A. Giarda, and A. Sanchez. 'Annealing of vacancies and ageing in Al-Li alloys.' Philosophical Magazine 35.1 (1977): 97-110. Singleton, M., and P. Nash. 'The Ag− Ni (Silver-Nickel) system.' Journal of Phase Equilibria 8.2 (1987): 119-121. Okamoto, H. Supplemental Literature Review of Binary Phase Diagrams: Ag-Ni, Al-Cu, Al-Sc, C-Cr, Cr-Ir, Cu-Sc, Eu-Pb, H-V, Hf-Sn, Lu-Pb, Sb-Yb, and Sn-Y. J. Phase Equilib. Diffus. 34, 493–505 (2013). https://doi.org/10.1007/s11669-013-0256-8 Taylor, Shannon. (2013). An investigation of the mechanical and physical properties of copper-silver alloys and the use of these alloys in Pre-Columbian America. MIT thesis. Popov, A. A., Shubin, Y. V., Plyusnin, P. E., Sharafutdinov, M. R., & Korenev, S. V. (2019). Experimental redetermination of the Cu–Pd phase diagram. Journal of Alloys and Compounds, 777, 204-212. Abe, T., Sundman, B. & Onodera, H. Thermodynamic assessment of the Cu−Pt system. JPED 27, 5–13 (2006). https://doi.org/10.1361/105497196X92736 Richard C. Ezike, “Bimetallic Silver Catalysts for the Reformate-Assisted Selective Catalytic Reduction of NOx” University of Michigan Doctoral Thesis Gus L.W. Hart, Lance J. Nelson, Richard R. Vanfleet, Branton J. Campbell, Marcel H.F. Sluiter, Jan H. Neethling, Ezra J. Olivier, Soraya Allies, Candace I. Lang, Bryce Meredig, Christopher Wolverton,Revisiting the revised Ag-Pt phase diagram,Acta Materialia,Volume 124,2017,Pages 325-332, R.L. Smith & G.E. Sandland, 'An Accurate Method of Determining the Hardness of Metals, with Particular Reference to Those of a High Degree of Hardness,' Proceedings of the Institution of Mechanical Engineers, Vol. I, 1922, p 623–641. Kumar, Sam Zhang, Lin Li, Ashok (2009). Materials characterization techniques. Boca Raton: CRC Press. ISBN 978-1420042948. ASTM-B563-01(2017) Standard Specification for Palladium-Silver-Copper Electrical Contact Alloy. M. HANSEN and K. ANDERKO, 'Constitution of Binary Alloys' (McGraw-Hill, New York, 1958)
dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/86397-
dc.description.abstract探針材料在半導體和綠色能源產業扮演著舉足輕重的角色,在測試環節探針會針對積體電路晶片、印刷電路板、光電封裝品等不同的半導體產品進行測試。在五花八門的金屬合金探針中,Pd-30Ag-30Cu具有高強度、高硬度、良好的導電性等優點。高性能的Pd-30Ag-30Cu 需要通過在真空中熔化並使用連續鑄造法製備成6 mm的合金棒,接著在室溫下進行抽線製程,並在直徑2.83 mm、1.51 mm、0.5 mm 設置檢查點。合金經過800oC固溶熱處理一小時後,硬度從376 Hv下降到252 Hv。金相觀察顯示微觀結構內有等軸的富銀相,其組成為 Ag: Pd: Cu = 52.5: 26.9: 20.6,嵌入在富銅相基體中,組成為 Cu: Pd: Ag = 38.0:32.2:29.8。直徑為 0.5 mm 的細線在 350 °C 下進一步進行時效 1 小時,以達到 425 Hv 的高硬度。同時,近年來隨著Pd價格的飛漲,將合金中的Pd取代成其他元素作為探針的需求也在增長,成為半導體行業的必然趨勢。因此,在本研究中,我們建議 Pt 是替代 Pd 的優選元素,從合金相圖中我們得知 Pt-Cu 與 Pd-Cu 形成相似的顯微結構,Pt 和 Pd 都來自第 8 族,因此它們都擁有相似的化學性質。在整個研究過程中,我們發現組成比為 46.5: 46.5: 7 的 Pt-Cu-Ag 的最高硬度達到了 350 Hv。同時,我們還發現其他成分比可能具有更好的性能,例如 Pt-42.5Cu-15Ag 具有符合需求的 18 μΩcm 電阻率和 272 Hv 鑄態硬度。在本研究中,我們發現當Ag含量超過10%時,合金對抽線過程造成困難,只有進行高溫熱處理後才能繼續抽線過程。由於高溫熱處理導致合金不能發揮其優異的機械性能。同時,高溫熱處理還可以引起合金中的偏析和合金施加塑性變形時的晶粒細化作用。zh_TW
dc.description.abstractProbe materials are employed in the semiconductor and sustainable energy industries for the testing of integrated circuit chips, printed circuit boards, and optoelectronic packages. Among the numerous metallic probe alloys, Pd-Ag-Cu has the advantages of high strength, high hardness, and satisfactory electrical conductivity. To produce a high performance Pd-30Ag-30Cu probe, the alloy was vacuum melted and continuously cast into a rod of 6 mm diameter. The as-cast alloy rod was then sequentially cold drawn into coarse wires with diameters of 2.83, 1.51, and 0.5 mm. After solid solution treatment at 800 °C for 1 hr, the hardness decreased from 376 Hv to 252 Hv. Metallographic observations showed a microstructure of equiaxial clusters of Ag-rich phase with a composition of Ag : Pd : Cu = 52.5 : 26.9 : 20.6, embedded in a matrix of Cu-rich phase with a composition of Cu : Pd : Ag = 38.0 : 32.2 : 29.8. The 0.5 mm diameter fine wire was further aged at 350 °C for 1 hr to achieve a high hardness of 425 Hv. Meanwhile, in recent years as the price of Pd ballooned, so the demand of replacing Pd into other element growed as the probe is a must in semiconductor industry. As a result, in this research, we propose Pt is the fine element to replace Pd, from the phase diagram we learn that Pt-Cu form a similar structure with Pd-Cu, Pt and Pd are from group 8 so both of them shows similar chemical properties. Throughout the research, we found that Pt-Cu-Ag with the composition ratio of 46.5:46.5:7 have reached the highest hardness of 350 Hv. At the same time, we also found other composition ratio might have better performance such as Pt-42.5Cu-15Ag have a follow convention resistivity of 18 μΩcm and 272 Hv hardness as-casted. In this research, we found that when the Ag content is over 10%, the alloy cause suffocate to the drawing process, the drawing process can continue only after a high temperature heat treatment is implemented. Due to the high temperature heat treatment cause the alloys do not perform its excellent mechanical properties. At the same time, high temperature heat treatment also can cause phase separation in the alloy and a grain refinement effect when plastic deformation is applied to the alloy.en
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dc.description.tableofcontents目錄 章節 1 前言 1 1.1 研究背景 1 1.2 研究動機與目的 3 2 文獻回顧 4 2.1 電子構裝製程概述 4 2.2 晶圓針測 5 2.3 探針種類 7 2.3.1 懸臂式探針卡 9 2.3.2 刀片式探針卡 10 2.3.3 垂直式探針卡 10 2.3.4 薄膜式探針卡 11 2.3.5 微彈簧式探針卡 12 2.3.6 微機電式探針卡 13 2.4 探針材料 14 2.4.1 半導體探針材料 14 2.5 探針合金之強化 15 2.5.1 固溶強化 16 2.5.2 時效強化 17 2.5.3 散佈強化 18 2.5.4 加工硬化 19 2.6 鈀合金之強化 20 2.6.1 鈀銅合金加入銀元素之強化效果 21 2.7 相變態 22 2.7.1 共晶反應 23 2.7.2 包晶反應 23 2.7.3 Spinodal Decomposition 24 3 實驗方法與步驟 26 3.1 實驗流程 26 3.1.1 合金組成設計 26 3.1.2 材料熱處理 28 3.2 熱處理設備 28 3.3 機械性質測試 29 3.3.1 微硬度測試 29 3.4 材料性質分析 30 3.4.1 X-射線繞射分析 30 3.4.2 掃描式電子顯微鏡與能量分散光譜儀 31 3.4.3 聚焦離子束顯微鏡 31 3.4.4 電子背向散射繞射技術 31 4 結果與討論 33 4.1 Pd-31.08Cu-28.92Ag(PW11) 33 4.2 Pt-31.08Cu-28.92Ag(PP31) 37 4.3 Pt-45Cu-10Ag(PP32)和Pt-48.98Cu-2.04Ag(PP33) 41 4.4 Pt-40Cu-20Ag(PP34) 43 4.5 Pt-46.5Cu-7Ag(PP35)和Pt-42.5Cu-15Ag(PP36) 45 4.6 XRD分析與鑒相 50 4.7 EBSD 51 4.8 討論 55 5 結論 58 5.1 發現的現象 58 5.2 解決的方案 58 參考文獻 59
dc.language.isozh-TW
dc.subject材料開發zh_TW
dc.subject三元合金zh_TW
dc.subject顯微結構工程zh_TW
dc.subject材料開發zh_TW
dc.subject高性能探針zh_TW
dc.subject高性能探針zh_TW
dc.subject三元合金zh_TW
dc.subject顯微結構工程zh_TW
dc.subjecttertiary alloyen
dc.subjectmicrostructure engineeringen
dc.subjectmaterial developmenten
dc.subjecttertiary alloyen
dc.subjecthigh performance probeen
dc.subjectmicrostructure engineeringen
dc.subjectmaterial developmenten
dc.subjecthigh performance probeen
dc.title半導體晶圓檢測Pt-Cu-Ag探針材料開發zh_TW
dc.titleDevelopment of Pt-Cu-Ag Probeen
dc.typeThesis
dc.date.schoolyear110-2
dc.description.degree碩士
dc.contributor.oralexamcommittee林修任(Hsiu-Jen Lin), 林惠娟(Huey-Jiuan Lin),蔡幸樺(Hsing-Hua Tsai)
dc.subject.keyword高性能探針,三元合金,材料開發,顯微結構工程,zh_TW
dc.subject.keywordhigh performance probe,tertiary alloy,material development,microstructure engineering,en
dc.relation.page62
dc.identifier.doi10.6342/NTU202202484
dc.rights.note同意授權(全球公開)
dc.date.accepted2022-08-22
dc.contributor.author-college工學院zh_TW
dc.contributor.author-dept材料科學與工程學研究所zh_TW
dc.date.embargo-lift2022-08-30-
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