請用此 Handle URI 來引用此文件:
http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/78838
標題: | 使用不匹配增強技術之寬操作範圍與高穩定度之物理不可被複製函數設計 A Wide-Range and High-Stability Physically Unclonable Function Design with Mismatch Enhancement Techniques |
作者: | 梁震宇 Zhen-Yu Liang |
指導教授: | 劉宗德 |
關鍵字: | 物理不可被複製函數,硬體安全,金鑰儲存,物聯網,穩定性,校正技術,製程變異,環形震盪器, Physical unclonable function (PUF),hardware security,secret key storage,Internet of Things (IoT),resiliency,stabilization technique,process variation,ring oscillator (RO), |
出版年 : | 2019 |
學位: | 碩士 |
摘要: | 本篇論文提出了一個操作在大範圍且變異性具有彈性的物理不可被複製函數來提供一個可靠的安全元件,所提出基於環形震盪器的物理不可被複製函數採用多種穩定技術來保持對環境變異的穩定性,此物理不可被複製函數使用可調整訊號斜率的延遲單元來放大元件的變異性對延遲不匹配的影響。此外使用校正系統提取物理不可複製函數內延遲資訊並將重新配置內部結構來放大頻率的不匹配及增加穩定性。採用28nm CMOS 技術製作之晶片的測試結果顯示,所提出的物理不可被複製函數在廣泛的工作條件上實現了高度穩定的性能,在0.4 到1.3 V 和-40 到125°C 下,最差的位元錯誤率為0.55 %。對於電源電壓的位元錯誤率敏感性為(0.0546%/0.1 V) 和溫度位元錯誤率敏感性為(0.0052%/10°C) 與當前最先進的結果相比分別增進了2.38 倍和28.84 倍。 This thesis presents a wide-range, variation-resilient physically unclonable function (PUF) to provide a reliable security primitive solution. The proposed ring oscillator-based PUF employs several stabilization techniques to maintain robustness under environmental variations. The proposed PUF design uses a delay cell topology with adjusted signal slope to amplify the impact of device variability on delay mismatch. Moreover, an online calibration system that extracts in-situ PUF delay information and re-configures stage interconnects is employed to further enlarge frequency mismatch and improve stability. Measurement results from a prototype fabricated in 28 nm CMOS technology show that the proposed PUF design achieves a highly stable performance over a wide range of operating conditions, with a worst case BER of 0.55% across 0.4 to 1.3 V and -40 to 125°C. The measured BER sensitivities to supply voltage (0.0546%/0.1V) and temperature (0.0052%/10°C) demonstrate stability improvements of 2.38 and 28.84 times, respectively, when compared to current state-of-the-art results. |
URI: | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/78838 |
DOI: | 10.6342/NTU201900324 |
全文授權: | 未授權 |
電子全文公開日期: | 2024-01-31 |
顯示於系所單位: | 電子工程學研究所 |
文件中的檔案:
檔案 | 大小 | 格式 | |
---|---|---|---|
ntu-107-1.pdf 目前未授權公開取用 | 3.58 MB | Adobe PDF |
系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。