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完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.advisor | 郭光宇(Guang-Yu Guo) | |
dc.contributor.author | I-Ching Lin | en |
dc.contributor.author | 林翊晴 | zh_TW |
dc.date.accessioned | 2021-06-17T07:01:58Z | - |
dc.date.available | 2019-08-05 | |
dc.date.copyright | 2019-08-05 | |
dc.date.issued | 2019 | |
dc.date.submitted | 2019-07-31 | |
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dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/72615 | - |
dc.description.abstract | 隨著奈米分析的需求增加,掃描穿透式電子顯微鏡 (Scanning Transmission Electron Microscope,STEM) 在奈米材料的研究中扮演重要地位。而電子能量損失能譜(Electron Energy-loss Spectroscopy,EELS)反映了未被佔用的狀態密度(density of states)的電子特徵。結合 STEM-EELS 技術,我們得以在原子級尺度下同時處理結構訊息與電子特徵。本論文將應用搭配球面像差修正器(Cs-Corrector) 的 STEM 與EELS,揭示RNiO3 / SrTiO3 異質界面的微觀物理學(R=La,Pr,Nd),其中三組RNiO3 異質結構的厚度皆為 10 單位晶胞。鎳酸鹽(Nickelates) 本身存在金屬-絕緣體轉變(Metal-to-insulator transition) 現象,三組樣品在塊材(bulk)時在室溫皆為金屬相。雖然 LaNiO3 / SrTiO3 在室溫下保留了原本的金屬性,但 PrNiO3 / SrTiO3 和 NdNiO3 /
SrTiO3 在室溫下卻呈現絕緣性。在結構分析中顯示 PrNiO3 和 NdNiO3 薄膜的結構變形相較於塊材時更大。有趣的是在本實驗中,所有三個異質界面都表現出正電荷密度(~1014 cm-2),這與傳統觀點不一致,即絕緣性界面不應顯示電荷密度。在這項研究中,我們討論了電荷密度與對應的結構性質的相關性。 | zh_TW |
dc.description.abstract | With the increasing demand in structural and electronic characterizations at high spatial resolution, atomically-resolved scanning transmission electron microscope (STEM) has become an indispensable tool in modern materials research. When used in combination with electron energy-loss spectroscopy (EELS) that reflects the electronic features of unoccupied density of states, a simultaneous tackling of the structural and electronic characters at atomic resolution had been proven possible and this conjunct STEM-EELS technique is most suitable for addressing the physics at a reduced dimension. In this thesis, we report on such a STEM-EELS application in unveiling the microscopic physics across the RNiO3/SrTiO3 heterointerfaces (R = La, Pr, and Nd; RNiO3 thickness, 10 unit cells for all three heterostructural systems). The nickelates are well-known to display a metal-to-insulator transition, with the characteristic transition temperature being an intricate function of the given structural distortion, and all the three materials are metallic at room temperature in the bulk state. While the LaNiO3/SrTiO3 preserves the signature metallicity at room temperature, the PrNiO3/SrTiO3 and NdNiO3/SrTiO3 unexpectedly turn out to be insulating. A thorough structural characterization revealed that the structural distortion in the PrNiO3 and NdNiO3 films are noticeably large compared to the characteristic magnitude in the respective bulks. More surprisingly, all three heterointerfaces manifest a positive charge density (~1014/cm2), at odds with the conventional wisdom that an insulating interface is not supposed to display a residual charge density. The corresponding structure-property correlations were discussed in this work. | en |
dc.description.provenance | Made available in DSpace on 2021-06-17T07:01:58Z (GMT). No. of bitstreams: 1 ntu-108-R06222003-1.pdf: 20450154 bytes, checksum: 33a9a987d1de3d01e223079439e41fc9 (MD5) Previous issue date: 2019 | en |
dc.description.tableofcontents | 口試委員會審定書 ii
中文摘要 iii ABSTRACT iv 目錄 v 圖目錄 viii 表目錄 xii Chapter 1 序論與文獻回顧 1 1.1 鈣鈦礦結構 ABO3 1 1.1.1 結構 1 1.1.2 過渡金屬的 d 軌域 2 1.1.3 金屬-絕緣體轉換:Mott 絕緣體與電荷轉移絕緣體 5 1.2 稀土鎳酸鹽 Rare-earth Nickelates 6 1.2.1 電子組態 6 1.2.2 RNiO3 的金屬-絕緣體轉換與相圖 7 1.3 複雜氧化物異質介面 12 1.3.1 外延應變與氧化物介面的關係 13 1.3.2 介面擴散(interdiffusion) 13 1.4 RNiO3/SrTiO3 (R=La,Pr,Nd)異質介面 15 1.4.1 外延應變對於相圖的影響 15 1.4.2 外延應變對於軌域的影響 19 1.4.3 極化不連續 21 1.4.4 電荷轉移 22 1.4.5 應變誘導自參雜(self-doping)現象 24 Chapter 2 儀器原理介紹 26 2.1 掃描穿透式電子顯微鏡 26 2.1.1 傳統穿透式電子顯微鏡與掃描穿透式電子顯微鏡的互易性 26 2.1.2 成像:Coherent and Incoherence Image 29 2.1.3 高角度環形暗場(HAADF) 31 2.1.4 球面像差修正器 (Cs-corrector) 36 2.2 電子能量損失能譜 38 2.2.1 電子能量損失能譜儀(electron energy loss spectrometer) 38 2.2.2 電子能量損失能譜 (electron energy loss spectrum) 40 2.2.3 Dual EELS 41 2.2.4 原子級能譜影像 42 2.2.5 單光器(Monochromator) 43 Chapter 3 RNiO3/SrTiO3 (R=La,Pr,Nd)異質介面 45 3.1 異質結構簡介與實驗條件 45 3.1.1 RNiO3/SrTiO3 (R=La,Pr,Nd)異質介面結構及參數 45 3.1.2 樣品成長條件 47 3.1.3 STEM-EELS 實驗參數 48 3.2 應變與結構 49 3.3 化學組成與擴散現象 52 3.3.1 化學組成比例 53 3.3.2 介面擴散 55 3.4 一維掃描能譜(line scan)與原子價數 56 3.5 電荷分佈 61 Chapter 4 總結與未來期望 66 參考文獻 67 | |
dc.language.iso | zh-TW | |
dc.title | "利用掃描穿透式電子顯微鏡結合電子能量損失能譜於RNiO3/SrTiO3(R=La,Pr,Nd)氧化物異質介面之研究" | zh_TW |
dc.title | Study of RNiO3/SrTiO3 (R=La,Pr,Nd)Oxide Heterointerface by Scanning Transmission Electron Microscopy Combined with Electron Energy-Loss Spectroscopy | en |
dc.type | Thesis | |
dc.date.schoolyear | 107-2 | |
dc.description.degree | 碩士 | |
dc.contributor.coadvisor | 朱明文(Ming-Wen Chu) | |
dc.contributor.oralexamcommittee | 朱英豪,陳永芳(Yang-Fang Chen) | |
dc.subject.keyword | 掃描穿透式電子顯微鏡,電子能量損失能譜,氧化物異質結構,鎳酸鹽,金屬-絕緣體轉變, | zh_TW |
dc.subject.keyword | Scanning transmission electron microscope (STEM),electron energy-loss spectroscopy (EELS),oxide heterostructures,metal-to-insulator transition,nickelates, | en |
dc.relation.page | 76 | |
dc.identifier.doi | 10.6342/NTU201902104 | |
dc.rights.note | 有償授權 | |
dc.date.accepted | 2019-07-31 | |
dc.contributor.author-college | 理學院 | zh_TW |
dc.contributor.author-dept | 物理學研究所 | zh_TW |
顯示於系所單位: | 物理學系 |
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