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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 馬劍清 | |
| dc.contributor.author | Ching-Yuan Chang | en |
| dc.contributor.author | 張敬源 | zh_TW |
| dc.date.accessioned | 2021-06-16T23:24:28Z | - |
| dc.date.available | 2017-08-01 | |
| dc.date.copyright | 2012-08-01 | |
| dc.date.issued | 2012 | |
| dc.date.submitted | 2012-08-01 | |
| dc.identifier.citation | [1] R. C. Gonzalez, R. E. Woods, and S. L. Eddins, Digital Image Processing Using MATLAB, 2nd ed. Gatesmark Publishing, 2009.
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| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/65091 | - |
| dc.description.abstract | 本論文應用平行計算技術於非破壞、非接觸檢測之實驗力學，結合數值計算與實驗量測，著重於提升量測訊號與干涉影像之訊噪比，並提升訊號影像後處理之計算速度。於數值計算部份，本文提出一套向量轉化運算流程，將多維度迴圈轉換為等價之二維向量運算，以提升區域性均值濾波、短時傅立葉轉換、區域性最小平方法之運算效能，並與平行運算架構與硬體相互結合，優化全域式量測系統之後處理效能；於實驗量測部份，本文使用高速、高解析之數位攝影機與量測儀器，自行建置全域式量測系統，其中包含電子斑點干涉術、數位影像相關法與光學檢測系統，並應用此架構量測物體之受力微變形與透鏡品質，並進一步應用於自動掃頻系統與自動光學檢測。
電子斑點干涉術部份，本文探討並分析壓電薄板之三維動態特性，並配合阻抗分析儀、雷射都卜勒振動儀、有限元素法，分析其面內外共振頻與共振模態，同時提出一套濾波理論，抑制空氣擾動對干涉條紋之影響，並應用於干涉術之自動掃頻系統。數位影像相關法部份，本文使用高速攝影機、拉伸試驗機、光學顯微鏡，量測物件於控制條件下之動態響應、塑性變形、奈米級變形，同時與光纖位移計相互比較，並獲得一致的量測結果。光學檢測系統部份，本文採用極化光學架構搭配影像處理技術，並提出能量中心檢測邏輯，量測鏡片之非軸對稱傾斜與偏心誤差，能夠快速並廣泛地應用於塑膠射出鏡片與玻璃模造鏡片。本研究成果結合數值計算與實驗量測，並應用影像處理及叢集電腦於電子斑點干涉術及數位影像相關法，同時開發全場分析技術，並與實驗量測、數值計算、與理論解析皆達到相當優異的一致性，該成果可實際應用於學術研究領域或工業界之跨尺度檢測，配合非接觸檢測與光測力學，俾提供即時且直觀之檢測方法。 | zh_TW |
| dc.description.abstract | This dissertation applies parallel computation technique into experimental mechanics, and mainly contributes to a) enhancing the signal-to-noise ratio of experimental signal and image, and b) improving computational speed of the denoising algorithms. This study measures an object deformation or profile using three non-contact inspection methods: electronic speckle pattern interferometry (ESPI), digital image correlation (DIC), and lens inspection system. The three methods are full-field measurement and use high-resolution image to record interference fringe, characteristic region, or intensity pattern. An embedded program controls frequency step and loading steps, and a digital camera takes sequential images at each controlled condition, storing the experimental data into a solid disk drive. Analytical programs load thousands of image and billions of pixels, and take several hours to retrieve a denoising result with excellent quality. Computer cluster of central processing unit (CPU) and graphic processing unit (GPU) are used in the computation, and we discuss the performance of denoising algorithm based on CPU and GPU architectures. This article also proposes a vectorizing process which converts for and while loops to equivalent matrix operations, and presents the speedup for different cases. The vectorizing method provides significant gain in analyzing experimental data, in which the displacement filed and strain distribution obtained using DIC method gauge a deformed object on sub-micron scale, while provides high accurate result. The frequency-sweeping curve obtained using ESPI not only indicates the resonate frequency of a vibrating piezoelectric thin plate, but also provides mode shape while approaching and leaving eigenmode, and gives a consistent result compared with those obtained using finite element method, impedance analyzer, and laser Doppler vibrometery. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-16T23:24:28Z (GMT). No. of bitstreams: 1 ntu-101-F94522502-1.pdf: 95042119 bytes, checksum: cccec238fdeee06d78556c013ac467f4 (MD5) Previous issue date: 2012 | en |
| dc.description.tableofcontents | Abstract I
Contents III List of Tables X List of Figures XI List of Symbols XVI 1 Introduction 1 1.1 Motivation 1 1.2 Literature review 2 1.3 Organization 6 2 Vectorization 9 2.1 Introduction 9 2.2 PQ transformation 11 2.3 Case I: short time Fourier transform 13 2.4 Case II: pointwise least square 18 2.5 Case III: morphological operations 22 2.6 Computer cluster used in this study 25 2.7 Summary 32 3 Speckle Pattern Interferometry : Piezoelectric Thin Plate 33 3.1 Introduction 33 3.2 Theoretical background 35 3.2.1 Time-averaged interference fringe 35 3.2.2 Experimental setup of ESPI 40 3.2.3 Subtractive and mean methods 43 3.2.4 Standard deviation method 44 3.2.5 Frequency-sweeping function 48 3.3 Out-of-plane of PZT thin plate 50 3.3.1 Experimental measurement using STD-ESPI 50 3.3.2 Finite element method 53 3.3.3 Laser Doppler vibrometer 54 3.3.4 Fringe analysis 57 3.3.5 Phase reconstruction 61 3.3.6 Frequency-sweeping function 63 3.4 In-plane measurement of PZT thin plate 66 3.4.1 Experimental measurement using STD-ESPI 66 3.4.2 Finite element method 71 3.4.3 Impedance analyzer 72 3.4.4 Fringe analysis 74 3.4.5 Phase reconstruction 79 3.4.6 Frequency-sweeping function 80 3.5 Summary 84 4 Digital Image Correlation : Dynamic, Nano, and Plastic Cases 85 4.1 Introduction 85 4.2 DIC and PLS criterion 87 4.3 Case I: dynamic response 91 4.4 Case II: nano deformation 101 4.5 Case III: plastic strain 108 4.6 Summary 113 5 Automatic Optical Inspection : Lens inspection 115 5.1 Introduction 115 5.2 Theoretical analysis 117 5.2.1 Plano-convex lens 117 5.2.2 Concave-convex lens 120 5.2.3 Definition of tilt and decentration 122 5.2.4 Geometric and optical centroid of a lens 124 5.3 Inspection function for a singlet lens 126 5.3.1 Formation of inspection function 126 5.3.2 Tilt of a plano-convex singlet 128 5.3.3 Decentration of a concave-convex singlet 131 5.4 Experimental Measurement 134 5.4.1 System setup of automatic optical inspection 134 5.4.2 Decentration of a concave-convex singlet 138 5.5 Summary 140 6 Conclusion and Future Work 141 References 143 Appendix A: Theoretical Analysis of Piezoelectric Crystal Plate 159 Appendix B: 2D PQ Transformation 165 Appendix C: Instruments 169 | |
| dc.language.iso | en | |
| dc.subject | 共振模態 | zh_TW |
| dc.subject | 非接觸檢測 | zh_TW |
| dc.subject | 共振頻 | zh_TW |
| dc.subject | 壓電陶瓷薄版 | zh_TW |
| dc.subject | 向量化平行運算 | zh_TW |
| dc.subject | 電子斑點干涉術 | zh_TW |
| dc.subject | 數位影像相關法 | zh_TW |
| dc.subject | resonant frequency | en |
| dc.subject | piezoelectric plate | en |
| dc.subject | vectorization | en |
| dc.subject | mode shape | en |
| dc.subject | digital image correlation | en |
| dc.subject | electronic speckle pattern interferometry | en |
| dc.subject | resonant vibration | en |
| dc.subject | parallel computing | en |
| dc.subject | non-contact inspection | en |
| dc.title | 應用影像處理及叢集電腦於電子斑點干涉術及數位影像相關法全場分析技術之開發 | zh_TW |
| dc.title | Application of Image Processing and Computer Cluster in the Development of Full-Field Measurement for Electronic Speckle Pattern Interferometry and Digital Image Correlation | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 100-2 | |
| dc.description.degree | 博士 | |
| dc.contributor.oralexamcommittee | 黃錦煌,章明,尹慶中,楊哲化,黃敏睿 | |
| dc.subject.keyword | 電子斑點干涉術,數位影像相關法,向量化平行運算,壓電陶瓷薄版,共振頻,共振模態,非接觸檢測, | zh_TW |
| dc.subject.keyword | electronic speckle pattern interferometry,digital image correlation,vectorization,piezoelectric plate,resonant frequency,resonant vibration,mode shape,non-contact inspection,parallel computing, | en |
| dc.relation.page | 176 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2012-08-01 | |
| dc.contributor.author-college | 工學院 | zh_TW |
| dc.contributor.author-dept | 機械工程學研究所 | zh_TW |
| 顯示於系所單位： | 機械工程學系 | |
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