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完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.advisor | 王暉(Huei Wang) | |
dc.contributor.author | Ping-Han Ho | en |
dc.contributor.author | 何柄翰 | zh_TW |
dc.date.accessioned | 2021-06-16T08:39:38Z | - |
dc.date.available | 2013-11-05 | |
dc.date.copyright | 2013-11-05 | |
dc.date.issued | 2013 | |
dc.date.submitted | 2013-10-01 | |
dc.identifier.citation | [1] Website of NRAO Telescopes available: https://science.nrao.edu/.
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[34] Bo Zhang, et al., “130-GHz Gain-Enhanced SiGe Low Noise Amplifier,” Solid State Circuits Conference (A-SSCC), IEEE Asian, Nov. 2010. [35] Po-Han Chen, et al., “A 110-180 GHz Broadband Amplifier in 65-nm CMOS Process,” IEEE MTT-S Int. Microw. Symp., Jun. 2013. [36] 蕭諦賸,毫米波60-GHz關鍵元件與190-GHz放大器之研製,國立臺灣大學碩士論文,2013年。 [37] Guillermo Gonzalez, Microwave Transistor Amplifier - Analysis and Design, 2nd, Pearson Prentice Hall, 1996. [38] WIN Semiconductors, GaAs 0.1-μm pHEMT Model Handbook, WIN Inc., Taipei, Taiwan, Oct. 2011. [39] Gilles Dambrine, et al., “A New Method for Determining the FET Small-Signal Equivalent Circuit,” IEEE Trans. On Microwave Theory Tech., vol. 36, no. 7, Jul. 1988. [40] K.H.G. Duh, et al., “High performance Q-band 0.15 μm InGaAs HEMT MMIC LNA,” Microwave and Millimeter-Wave Monolithic Circuits Symposium Digest of Papers, IEEE, pp. 99-102, Jun. 1993. [41] Ping-Han Ho, et al., “An Ultra Low-power Q-band LNA with 50% Bandwidth in WIN GaAs 0.1-μm pHEMT Process,” IEEE Asian-Pacific Microwave Conference, Nov. 2013. [42] N. I. Cameron, et al., “Pseudomorphic HEMT small signal equivalent circuit model scaling,” Modelling, Design and Application of MMIC's, IEE Colloquium on, pp. 3/1-3/6, Jun. 1994. [43] R. A. Pucel, H. A. Haus, and H. Statz, “Signal and noise properties of GaAs microwave FET,” Advances in Electronics & Electron Physics, New York: Academic Press, vol. 38, pp. 195-265, 1975. [44] M. W. Pospieszalski, “Extremely low-noise amplification with cryogenic FET’s and HFET’s: 1970-2004,” National Radio Astronomy Observatory, Charlottesville, VA 22903, May 2005. [45] 林文奕,pHEMTs小訊號和雜訊模型與其元件尺寸關係,國立中央大學碩士論文,2008年。 [46] N. Shiramizu, “A 3-10 GHz bandwidth low-noise and low-power amplifier for full-band UWB communications in 0.25-µm SiGe BiCMOS technology,” IEEE Radio Frequency Integrated Circuits Symposium Dig., pp. 39-42, 12-14 Jun. 2005. [47] Kuo-Liang Deng, et al., “Design and analysis of novel high-gain and broad-band GaAs pHEMT MMIC distributed amplifiers with traveling-wave gain stages,” IEEE Trans. On Microwave Theory Tech., vol.51, pp. 2188-2196, Nov. 2003. [48] Website of Sonnet software available: http://www.sonnetsoftware.com/. [49] Carl Pobanz, “A high gain, low power MMIC LNA for Ka-band using InP HEMTs,” IEEE Radio Frequency Integrated Circuits Symposium, pp. 149-152, Jun. 1999. [50] Behzad Razavi, RF Microelectronics, 2nd, Pearson Prentice Hall, 2011. [51] Chi-Chang Lin, et al., “Single-sleeve waveguide-to-microstrip transition probe for full waveguide bandwidth,” IEEE 42nd European Microwave Conference, pp. 934-937, Oct. 2011. [52] J. E. 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Jaeger, Introduction to Microelectronic Fabrication, 2nd, Prentice Hall, 2002. [59] A. Y. Cho and J. R. Arthur, “Molecular beam epitaxy,” Progress in Solid-State Chemistry, vol. 10, pp. 157-191, 1975. [60] Private communication with Dr. W. K. Wang of WIN Semiconductors. | |
dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/58934 | - |
dc.description.abstract | 在本論文中,使用穩懋半導體的0.15微米砷化鎵高速電子遷移率電晶體製程設計一個於20至48 GHz的低雜訊放大器,這個低雜訊放大器的量測結果與穩懋半導體提供的元件模型模擬符合。
為了設計於穩懋半導體的0.1微米砷化鎵高速電子遷移率電晶體製程的放大器,完成穩懋半導體的0.1微米砷化鎵高速電子遷移率電晶體製程的Angelov模型,這個模型可以用於電晶體的小訊號及大訊號參數模擬。 此外,用穩懋半導體的0.1微米砷化鎵製程設計了一個於27至45 GHz的低雜訊放大器,而其量測的結果與利用該模型所模擬的結果近似。因此此模型可以在未來的設計中被採用。另外,為了減低熱雜訊的影響,此低雜訊放大器也在約20K的低溫下量測,結果顯示了較常溫大幅降低的雜訊溫度。電晶體的測試元件同樣也在低溫下量測,並淬取小訊號模型與常溫模型做比較。發現0.1微米砷化鎵在低溫下的增益並沒有提高,但雜訊溫度明顯降低。 因應日益成長的高頻寬頻放大器,利用0.13微米矽鍺異質接面雙極電晶體製程,實現一個75至140 GHz的寬頻放大器,此放大器使用疊接式架構獲得較大的增益,並利用電流鏡偏壓來精準控制流入基極的電流,而量測出的小訊號參數也與模擬結果大致上相似。 | zh_TW |
dc.description.abstract | In this thesis, an LNA from 20 to 48 GHz in WIN 0.15-μm pHEMT process is designed and measured. The measurement results agree well with the simulation by the models provided by WIN.
For designing amplifiers in WIN 0.1-μm pHEMT, the Angelov model of WIN 0.1-μm pHEMT process is generated, and this model can be used in small signal and large signal simulation. An LNA from 27 to 45 GHz in WIN 0.1-μm pHEMT is designed. The measurement results of the LNA agree with the simulated results using the model. Besides, to eliminate the thermal noise, the devices are operated in cryogenic temperature. The small signal model in cryogenic temperature is established. The noise temperature of the LNA in cryogenic operation is much lower than that at room temperature. The test transistor is also measured at cryogenic temperature, and the small-signal model is extracted to compare with that at room temperature. It is observed that the gain of the LNA in WIN 0.1-μm pHEMT does not increase at cryogenic operation, but the noise performance is enhanced substantially. For D-band applications, the 0.13-μm silicon-germanium heterojunction bipolar transistor is used to design a broadband amplifier from 75 to 140 GHz. The cascoded structure is implemented to achieve high gain, and the bias is realized by the current mirror to accurately control the base current. | en |
dc.description.provenance | Made available in DSpace on 2021-06-16T08:39:38Z (GMT). No. of bitstreams: 1 ntu-102-R00942005-1.pdf: 12628327 bytes, checksum: a41496d23429a7ce3606667adc391afc (MD5) Previous issue date: 2013 | en |
dc.description.tableofcontents | 誌謝 i
中文摘要 ii ABSTRACT iii CONTENTS iv LIST OF FIGURES vii LIST OF TABLES xiv Chapter 1 Introduction 1 1.1 Background and Motivation 1 1.2 Literature Survey 2 1.2.1 Modeling at Room Temperature and Cryogenic Temperature 2 1.2.2 LNAs at Room Temperature and Cryogenic Temperature 3 1.2.3 The Broadband Amplifiers around D-band 5 1.3 Contributions 6 1.4 Thesis Organization 8 Chapter 2 Design of a Q-band LNA in WIN 0.15-μm Low Noise pHEMT Process 9 2.1 Design Procedure of the Q-band LNA 9 2.1.1 Device Size Selection [50] 9 2.1.2 The Source Degeneration of the First Stage 12 2.1.3 The Interstage Matching 16 2.1.4 Layout & EM simulation 20 2.1.5 Experimental Results 24 2.2 Summary 26 Chapter 3 Device Modeling of WIN 0.1-μm GaAs pHEMT Process and the LNAs at Room and Cryogenic Temperatures 28 3.1 Modeling of 0.1-μm Power pHEMT 28 3.1.1 Extraction of the Small-signal Model [39] 29 3.1.2 Scaling to Transistors of Different Gate Widths [42] 35 3.1.3 Nonlinear Angelov Model [9]-[10] 39 3.1.4 Noise Model [27], [43] 47 3.2 Design of a Q-band LNA [41] 54 3.2.1 Design Procedure 54 3.2.2 Measurement 64 3.2.3 Discussion 66 3.3 Design of a W-band LNA 69 3.3.1 The Simulation Results and the Measurement 69 3.3.2 Trouble Shooting 73 3.3.3 Re-design 78 3.4 Q-band LNA at Cryogenic Temperature 80 3.4.1 The Setup of Cryogenic Measurement 80 3.4.2 Q-band Low Noise Amplifier at Cryogenic Temperature 84 3.4.3 Transistor dc-IV Measurement at Cryogenic Temperature 91 3.4.4 Small-signal Model at Cryogenic Temperature [39] 93 3.4.5 Summary 100 Chapter 4 A Broadband 75-140 GHz Amplifier in SiGe 0.13-μm Process with Current Mirror Bias 101 4.1 Circuit Structure 101 4.1.1 The Current Mirror 101 4.1.2 The Cascoded Structure [50] 104 4.2 Simulation Results 106 4.3 Experiment Results 109 4.3.1 Measurement Results 109 4.3.2 Discussion 111 4.3.3 Re-design 115 4.3.4 Comparison of the Previously Reported Amplifiers 118 Chapter 5 Conclusion 120 References 121 | |
dc.language.iso | zh-TW | |
dc.title | 應用於毫米波波段之砷化鎵與矽鍺放大器之設計與砷化鎵微波元件常溫與低溫模型之研究 | zh_TW |
dc.title | Design of GaAs and SiGe Amplifiers at Millimeter Wave and Research of GaAs pHEMT Modeling at Room Temperature and Cryogenic Temperature | en |
dc.type | Thesis | |
dc.date.schoolyear | 102-1 | |
dc.description.degree | 碩士 | |
dc.contributor.oralexamcommittee | 王文凱,章朝盛,林坤佑,蔡政翰 | |
dc.subject.keyword | 低雜訊放大器,高速電子遷移率電晶體,元件模型,低溫量測,矽鍺異質接面雙極電晶體, | zh_TW |
dc.subject.keyword | low noise amplifier (LNA),high electron mobility transistor (HEMT),device modeling,cryogenic measurement,silicon-germanium heterojunction bipolar transistor (SiGe HBT), | en |
dc.relation.page | 127 | |
dc.rights.note | 有償授權 | |
dc.date.accepted | 2013-10-01 | |
dc.contributor.author-college | 電機資訊學院 | zh_TW |
dc.contributor.author-dept | 電信工程學研究所 | zh_TW |
顯示於系所單位: | 電信工程學研究所 |
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