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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 陳俊維(Chun-Wei Chen) | |
| dc.contributor.author | Pai-Chia Kuo | en |
| dc.contributor.author | 郭白嘉 | zh_TW |
| dc.date.accessioned | 2021-06-16T08:07:49Z | - |
| dc.date.available | 2015-07-22 | |
| dc.date.copyright | 2014-07-22 | |
| dc.date.issued | 2014 | |
| dc.date.submitted | 2014-06-06 | |
| dc.identifier.citation | 1.P. Vanlaeke, A. Swinnen, I. Haeldermans, G. Vanhoyland, T. Aernouts, D. Cheyns, C. Deibel, J. D'Haen, P. Heremans, and T. Poortmans et al., P3HT/PCBM Bulk Heterojunction Solar Cells: Relation Between Morphology and Electro-Optical Characteristics. Sol. Energy Mater. Sol. Cells 90, 2150-2158 (2006).
2.T. Wang, A. D. F. Dunbar, P. A. Staniec, A. J. Person, P. E. Hopkinson, J. E. MacDonald, S. Lilliu, C. Pizzey, N. J. Terrill, and A. M. Donald et al., The Development of Nanoscale Morphology in Polymer: Fullerene Photovoltaic Blends During Solvent Casting. Soft Matter 6, 4128-4134 (2010). 3.C.-Y. Chang, C.-E. Wu, S.-Y. Chen, C. Cui, Y.-J. Cheng, C.-S. Hsu, Y.-L. Wang, and Y. Li, Enhanced Performance and Stability of A Polymer Solar Cell by Incorporation of Vertically Aligned, Cross-Linked Fullerence Nanorods. Angew. Chem., Int. Ed. 50, 9386-9390 (2011). 4.P.A. Staniec, A.J. Parnell, A.D.F. Dunbar, H. Yi, A.J. Pearson, T. Wang; P.E. Hopinson, C. Kinane, R.M. Dalgliesh, and A.M. Donald et al., The Nanoscale Morphology of A PCDTBT:PCBM Photovoltaic Blend. Adv. Energy Mater. 1, 499-504 (2011). 5.T.-Y. Chu, S. Alem, S.-W. Tsang, S.-C. Tse, S. Wakim, J. Lu, G. Dennler, D. Waller, R. Gaudiana, and Y. Tao, Morphology Control in Polycarbazole Based Bulk Heterojunction Solar Cells and Its Impact on Device Performance. Appl. Phys. Lett. 98, 253301-253303 (2011). 6.I. Angert, E. Majorovits, and R.R. Schröder, Zero-loss image formation and modified contrast transfer theory in EFTEM, Ultramicroscopy 81, 203-222 (2000). 7.K. Nagayama, and R. Danev , Phase-Plate Electron Microscopy: A Novel Imaging Tool To Reveal Close-To-Life Nano-Structures. Biophys. Rev. 1, 37-42 (2009). 8.K. Nagayama, Another 60 Years in Electron Microscopy: Development of Phase-Plate Electron Microscopy and Biological Applications. J. Electron Microsc. 60, S43-S62. (2011) 9.P.N.T. Unwin, Phase Contrast and Interference Microscopy with The Electron Microscope, Philos. Trans. R. Soc., B 261, 95-104 (1971). 10.D.F. Parsons, and H.M. Johnson, Possibility of A Phase Contrast Electron Microscope, Appl. Opt. 11, 2840-2843 (1972). 11.R. Danev, and K. Nagayama, Transmission electron microscopy with Zernike phase plate, Ultramicroscopy 88, 243-252 (2001). 12.B. Barton, F. Joos, and R.R. Schroder, Improved Specimen Reconstruction by Hilbert Phase Contrast Tomography. J. Struct. Biol. 164, 210-220 (2008). 13.B. Barton, D. Rhinow, A. Walter, R. Schroder, G. Benner, E. Majorovits, M. Matijevic, H. Niebel, H. Muller, and M. Haider et al. In-Focus Electron Microscopy of Frozen-Hydrated Biological Samples with A Boersch Phase Plate. Ultramicroscopy 111, 1696-1705 (2011). 14.R. Danev, R.M. Glaeser, and K. Nagayama, Practical Factors Affecting The Performance of A Thin-Film Phase Plate for Transmission Electron Microscopy. Ultramicroscopy 109, 312-325 (2009). 15.R. Danev, and K. Nagayama, Optimizing The Phase Shift and The Cut-On Periodicity of Phase Plates for TEM. Ultramicroscopy 111, 1305-1315 (2011). 16.B. Buijsse; F. M. H. M. van Laarhoven, A. K. Schmid, R. Cambie, S. Cabrini, J. Jin, and R.M. Glaeser, Design of A Hybrid Double-Sideband/Single-Sideband (Schlieren) Objective Aperture Suitable for Electron Microscopy. Ultramicroscopy 111, 1688-1695 (2011). 17.A. Walter, H. Muzik, H. Vieker, A. Turchanin, A. Beyer, A. Golzhauser, M. Lacher, S. Steltenkamp, S. Schmitz, P. Holik, et al., Practical Aspects of Boersch Phase Contrast Electron Microscopy of Biological Specimens. Ultramicroscopy 116, 6272 (2012). 18.Y. Fukuda, Y. Fukazawa, R. Danev, R. Shigemoto, and K. Nagayama, Tuning of The Zernike Phase-Plate for Visualization of Detailed Ultrastructure in Complex Biological Specimens. J. Struct. Biol. 168, 476-484 (2009). 19.K. Murata, X. Liu, R. Danev, J. Jakana, M.F. Schmid, J. King, K. Nagayama, and W. Chiu, Zernike Phase Contrast Cryo-Electron Microscopy and Tomography for Structure Determination at Nanometer and Subnanometer Resolutions. Structure 18, 903-912 (2010). 20.P. Egelberg, Phase Contrast Microscopy http://www.phiab.se/technology/phase-contrast-microscopy 21.D. B. Murphy, R. Oldfield, S. Schwartz, and M. W. Davidson, Microscopy http://www.microscopyu.com/index.html 22.Kōichi Kanaya, Hisazo Kawakatsu, Kazuo Itō, and Haruo Yotsumoto, Experiment on the Electron Phase Microscope, J. Appl. Phys. 29, 1046-1049 (1958). 23.P.N.T. Unwin, An electrostatic phase plate for the electron microsope, Ber. Bunsenges. Phys. Chem. 74, 1137-1141 (1970). 24.R. Danev, and K. Nagayama, Complex Observation in Electron Microscopy. II. Direct Visualization of Phases and Amplitudes of Exit Wave Functions, J. Phys. Soc. Jpn. 70, 696-702 (2001) 25.K. Danov, R. Danev, and K. Nagayama, Electric charging of thin films measured using the contrast transfer function, Ultramicroscopy 87, 45-54 (2001). 26.K. Danov, R. Danev, and K. Nagayama, Reconstruction of the electric charge density in thin films from the contrast transfer function measurements, Ultramicroscopy 90, 85-95 (2002). 27.H. Boersch, Z. Naturforsch. A 2A, 615 (1947). 28.T. Matsumoto and A. Tonomura., The phase constancy of electron waves traveling through Boersch’s electrostatic phase plate, Ultramicroscopy 63, 5-10 (1996). 29.E. Majorovits, B. Barton, K. Schultheiß, F. Pérez-Willard, D. Gerthsen, R.R. Schröder, Ultramicroscopy 107, 213-226 (1997). 30.Rossana Cambie, Kenneth H. Downing, Dieter Typke, Robert M. Glaeser, Jian Jin, 107, 329-339 (1997). 31.Jessie Shiue, Chia-Seng Chang, Sen-Hui Huang, Chih-Hao Hsu, Jin-Sheng Tsai, Wei-Hau Chang, Yi-Min Wu, Yen-Chen Lin, Pai-Chia Kuo, Yang-Shan Huang, Yeukuang Hwu, Ji-Jung Kai, Fan-Gang Tseng, and Fu-Rong Chen, Phase TEM of Biological imaging utilizing a Boersch electrostatic phase plate : theory and practice, J. Electro. Microsc. 58, 137-145 (2009). 32.R. Danev, H. Okawara, N. Usuda, K. Kametani, and K. Nagayama, A Novel Phase-contrast Transmission Electron Microscopy Producing High-contrast Topographic Images of Weak Objects, J. Biol. Phys. 28, 627-635 (2002). 33.K. Nagayama, Development of phase plates for electron microscopes and their biological application, Eur. Biophys. J. 37, 345-358 (2008). 34.Akira Tonomura, Nobuyuki Osakabe, Tsuyoshi Matsuda, Takeshi Kawasaki, Junji Endo, Shinichiro Yano, and Hiroji Yamada, Evidence for Aharonov-Bohm effect with magnetic field completely shielded from electron wave, Phys. Rev. Lett. 56, 792-801 (1986). 35.Katrin Schultheiss, Joachim Zach, Bjoern Gamm, Manuel Dries, Nicole Frindt, Rasmus R. Schröder and Dagmar Gerthsen, New Electrostatic Phase Plate for Phase-Contrast Transmission Electron Microscopy and Its Application for Wave-Function Reconstruction, Microsc. Microanal. 16, 785-794 (2010). 36.R. Schröder, B Barton, HH Rose and G Benner, Contrast Enhancement by Anamorphotic Phase Plates in an Aberration-corrected TEM, Microsc. Microanal. 13, 136-137 (2007). 37.N Frindt, K Schultheiss, B Gamm, M Dries, J Zach, D Gerthsen and R Schröder, The Way to an Ideal Matter-free Zernike and Hilbert TEM Phase Plate: Anamorphotic Design and First Experimental Verification in Isotropic Optics, Microsc. Microanal. 16, 518-519 (2010). 38.H. Rose, Design of an Obstruction-Free Phase-Shifter Yielding Maximum Contrast Over a Large Range of Spatial Frequencies, Microsc. Microanal. 16, 548-549 (2010). 39.H. Müller, J. Jin, R. Danev, J. Spence, H. Padmore, and R. Glaeser, Design of an electron microscope phase plate using a focused continuous-wave laser, New J. Phys. 12, 073011 (2010). 40.D. B. Williams and C. B. Carter, Transmission Electron Microscopy, Plenum Press, New York (1996). 41.P. R. Buseck, J. M. Cowley, and L. Eyring, High-Resolution Transmission Electron Microscopy and Associated Techniques, Oxford University Press, New York (1992). 42.J. M. Cowley, Diffraction Physics. (North Holland Press, Amsterdam.) (1995) 43.L. Reimer, Transmission Electron Microsocpy, Physics of Image Formation and Microanalysis, 4th Edition, Springer, New York (1997). 44.D. Willasch, High Resolution Electron Microscopy With Profiled Phase Plates, Optik 44, 17-36 (1975). 45.J. Shiue, and S.-K. Hung, A TEM phase plate loading system with loading monitoring and nano-positioning functions, Ultramicroscopy 110, 1238-1242 (2010) 46.Scherzer, O. The Theoretical Resolution Limit of the Electron Microscope, J. Appl. Phys. 20, 20 (1949). 47.S.S. van Bavel, E. Sourty, G. de With, and J. Loos, Three-dimensional nanoscale organization of bulk heterojunction polymer solar cells. Nano Lett. 9, 507-513 (2009). 48.T. Agostinelli, S. Lilliu, J.G. Labram, M. Campoy-Quiles, M. Hampton, E. Pires, J. Rawle, O. Bikondoa, D.D.C. Brandley, and T.D. Anthopoulos, Real-time investigation of crystallization and phase-segregation dynamics in P3HT:PCBM solar cells during thermal annealing, Adv. Functional Mater. 21, 1701-1708 (2011). 49.G. Li, Y. Yao, H. Yang, V. Shrotriya, G. Yang, and Y. Yang, Solvent annealing effect in polymer solar cells based on poly(3-hexylthiophnen) and methanofullerences, Adv. Functional Mater. 17, 1636-1644 (2007). | |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/58188 | - |
| dc.description.abstract | 穿透式電子顯微鏡﹙Transmission Electron Microscopy, TEM﹚顯像術，於材料科學領域中已是被廣泛應用於奈米結構觀測及分析的工具。然而，其於觀測軟物質材料之應用，卻因為此類材料於穿透式電子顯微鏡影像中的低對比特性，而受到限制。配合穿透式電子顯微鏡之相位板技術已經發展了數十年，但由於影像品質相較未使用相位板時劣化過多，使用者無法以其取得影像品質穩定的準焦﹙in-focus﹚影像，因而此技術仍然無法被實際應用於材料科學研究上。
在本論文的研究中，實現了晶片式相位版的設計，有效地提高電荷傳導效率，解決了電荷累積效應﹙charging effect﹚，並將其實際應用於軟物質材料的研究上，提高此類材料之穿透式電子顯微鏡影像對比，且能穩定取得準焦影像。 本研究以此穩定的晶片式相位板搭配穿透式電子顯微鏡技術，於不同製程條件的有機太陽能電池元件中，首次觀察並驗證了奈米顆粒相的存在。 在本研究中，也利用此系統取得未染色之大腸桿菌﹙E. coli﹚樣品之穿透式電子顯微鏡影像，於影像中解析樣品細部結構並驗證影像對比提升之作用。 本論文的研究成功將晶片式相位板結合穿透式電子顯微鏡系統，發展提升影像對比之準焦穿透式電子顯微術，對於軟物質材料的研究領域將有極大的助益。 | zh_TW |
| dc.description.abstract | Transmission electron microscopy (TEM) is a powerful tool in imaging nanostructures, yet its capability is limited with respect to the imaging of soft materials, because of the intrinsic low contrast problem. TEM phase plates have been in development for decades, yet a reliable phase plate technique has not been available because the performance of TEM phase plates deteriorates too quickly. Such an obstacle prohibits in-focus TEM phase imaging to be routinely achievable, thus limits the technique being used in practical applications. Here we present an on-chip thin film Zernike phase plate which can effectively release charging, and allow reliable in-focus TEM images of soft materials with enhanced contrast to be routinely obtained. With this stable system, we were able to characterize many polymer solar cell specimens, and consequently identified and verified the existence of an unexpected nanoparticle-phase. Furthermore, we were also able to observe the fine structures of an E. coli specimen, without staining, using this on-chip thin film phase plate. Our system, which can be installed on a commercial TEM, opens up exciting possibilities for TEM to characterize soft materials. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-16T08:07:49Z (GMT). No. of bitstreams: 1 ntu-103-D96527025-1.pdf: 3594739 bytes, checksum: ded1e7d3154c240e75ed004d3e2c0c42 (MD5) Previous issue date: 2014 | en |
| dc.description.tableofcontents | 致謝...……………………………………..................................……………………... Ⅰ
摘要…………………………………………………………………………………….Ⅱ ABSTRACT…………………………………………………………………………...Ⅲ CONTENTS…………………………………………………………………………...Ⅳ LIST OF FIGURES…………………………………………………………………...Ⅵ CHAPTER 1 Introduction………………………………………………………………………….....1 1.1 Zernike phase plate in the optical microscope……………………………….3 1.2 The phase plate in TEM……………………………………………………...5 1.3 The thin film phase plate…………………………………………………......5 1.4 Other kinds of phase plate……………………………………………………7 CHAPTER 2 Theory………………………………………………………………………………….16 2.1 Phase Object Approximation and Weak Phase Object Approximation..........16 2.2 Relativistic correction to Weak Phase Object Approximation (WPOA)……19 2.3 The image of Weak Phase Objects………………………………………….21 2.4 The Zernike phase contrast………………………………………….………23 2.5 The thin film Zernike phase plate…………………………………………...24 CHAPTER 3 Experiment…………………………………………………………………………….27 3.1 Fabrication of an on-chip thin film Zernike phase plate……………………27 3.2 TEM and the phase plate system……………………………………………29 3.3 Operation of the on-chip Zernike thin film phase plate……………………..30 3.4 TEM sample preparation……………………………………………………31 3.4.1 TEM specimens of P3HT/PCBM photoactive layers retrieved from polymer solar cells…………………………………………………...31 3.4.2 Preparation of unstained E. coli specimen for TEM imaging……….31 CHAPTER 4 Results and Discussion………………...……………………………………………...36 4.1 Contrast transfer function (CTF) in various TEM conditions………………36 4.2 Advantages of on-chip phase plate….………………………………………37 4.3 Stability of the on-chip Zernike phase plate………………………………...40 4.4 Charge releasing…………………………………………………………….41 4.5 Phase contrast enhancement in organic materials…………………………..42 4.6 Imaging biological materials with phase plate……………………………...45 CHAPTER 5 Conclusion………………...…………………………………………………………...58 Reference..…………………………………………….……………………………….59 List of Publications……………………………………………………………………65 | |
| dc.language.iso | en | |
| dc.subject | 軟物質 | zh_TW |
| dc.subject | 穿透式電子顯微鏡 | zh_TW |
| dc.subject | 相位板 | zh_TW |
| dc.subject | phase plate | en |
| dc.subject | soft materials | en |
| dc.subject | TEM | en |
| dc.title | 晶片式相位板搭配穿透式電子顯微鏡技術應用於軟物質材料之觀測 | zh_TW |
| dc.title | On-chip Zernike thin film phase plate for in-focus transmission microscopy imaging of soft materials | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 102-2 | |
| dc.description.degree | 博士 | |
| dc.contributor.coadvisor | 王玉麟(Yuh-Lin Wang),薛韻馨(Jessie Shiue) | |
| dc.contributor.oralexamcommittee | 薛景中(Jing-Jong Shyue),溫政彥(Cheng-Yen Wen) | |
| dc.subject.keyword | 穿透式電子顯微鏡,相位板,軟物質, | zh_TW |
| dc.subject.keyword | TEM,phase plate,soft materials, | en |
| dc.relation.page | 66 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2014-06-06 | |
| dc.contributor.author-college | 工學院 | zh_TW |
| dc.contributor.author-dept | 材料科學與工程學研究所 | zh_TW |
| 顯示於系所單位： | 材料科學與工程學系 | |
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