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  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 資訊工程學系
請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/54381
完整後設資料紀錄
DC 欄位值語言
dc.contributor.advisor郭大維(Tei-Wei Kuo)
dc.contributor.authorHsin-Yu Changen
dc.contributor.author張信瑜zh_TW
dc.date.accessioned2021-06-16T02:53:39Z-
dc.date.available2016-07-20
dc.date.copyright2015-07-20
dc.date.issued2015
dc.date.submitted2015-07-12
dc.identifier.citationBibliography
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dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/54381-
dc.description.abstract隨著儲存裝置容量的快速成長,三維快閃記憶體已經成為市場主流趨勢。不同於以往二維快閃記憶體的管理,部分區塊抹除指令(稱為 sub-block erase operation)可以在三維快閃記憶體架構下減少額外的效能減損,但為了此指令解決伴隨而來的問題,我們提出了一個軟體控制部分區塊抹除的設計(稱為 sub-block erase with software isolation),這個機制不僅能不花額外的硬體成本就解決部分區塊抹除干擾的問題,更顯著地提升整體系統的效能及耐用度,最後,藉由一系列之實驗,我們驗證了所提出方法之有效性,並得到了令人振奮的結果。zh_TW
dc.description.abstractThe rapid growth of page number imposes the huge overhead on 3D flash-based storage devices since it will result in the large number of page copies once the garbage collection (GC) is invoked to reclaim free blocks. To reduce the GC overhead, a novel erase operation, called as “sub-block erase”, is proposed to enable the block erase operation to be divided into several sub-block erase operations and thus to reduce the number of copying live pages. However, the sub-block erase operation leads us to the new challenges since it might result in the serious interference and inner-block wear leveling problems. It becomes very important to resolve the negative impacts, such as serious interference, caused by adopting the sub-block erase technique without harming the performance of the sub-block erase operation. Such an observation motivates this work in the proposing of software isolation design to simultaneously resolve the reliability issue as well as exploit the characteristics of the sub-block erase for 3D flash memory. The proposed scheme was evaluated by a series of experiments with encouraging results.en
dc.description.provenanceMade available in DSpace on 2021-06-16T02:53:39Z (GMT). No. of bitstreams: 1
ntu-104-R02922078-1.pdf: 851309 bytes, checksum: 1b2f5cb48c70ca50532eaace6be7fbed (MD5)
Previous issue date: 2015
en
dc.description.tableofcontentsContents
Abstract in Chinese iv
Abstract v
Acknowledgment vi
Contents vii
List of Figures x
List of Tables xi
1 Introduction 1
2 System Architecture and Motivation 7
3 Sub-block Erase with Software Isolation Design 12
3.1 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.2 R.B. and Best R.B. Scanning . . . . . . . . . . . . . . . . . . . . . . . 15
3.3 Marching-based R.B. Scanning . . . . . . . . . . . . . . . . . . . . . . 17
4 Evaluations 19
4.1 Metrics and Experiment Setup . . . . . . . . . . . . . . . . . . . . . . . 19
4.2 Experimental Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
viii
CONTENTS ix
4.2.1 Capacity Loss . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
4.2.2 Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
4.2.3 Reliability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
5 Conclusion 23
Bibliography 24
Curriculum Vitae 30
dc.language.isoen
dc.subject耐用度zh_TW
dc.subject三維快閃記憶體zh_TW
dc.subject部分區塊抹除zh_TW
dc.subject空間回收zh_TW
dc.subject回收效益zh_TW
dc.subject軟體隔離層zh_TW
dc.subject平均區塊抹除zh_TW
dc.subject儲存系統zh_TW
dc.subject效能zh_TW
dc.subject三維快閃記憶體zh_TW
dc.subject部分區塊抹除zh_TW
dc.subject空間回收zh_TW
dc.subject回收效益zh_TW
dc.subject軟體隔離層zh_TW
dc.subject平均區塊抹除zh_TW
dc.subject儲存系統zh_TW
dc.subject效能zh_TW
dc.subject耐用度zh_TW
dc.subject3D flash memoryen
dc.subjectStorage systemen
dc.subjectReliabilityen
dc.subjectPerformanceen
dc.subject3D flash memoryen
dc.subjectSub-block eraseen
dc.subjectGarbage collectionen
dc.subjectRecycle benefiten
dc.subjectSoftware isolationen
dc.subjectWear levelingen
dc.subjectStorage systemen
dc.subjectReliabilityen
dc.subjectPerformanceen
dc.subjectSub-block eraseen
dc.subjectGarbage collectionen
dc.subjectRecycle benefiten
dc.subjectSoftware isolationen
dc.subjectWear levelingen
dc.title基於三維快閃記憶體之軟體控制部分區塊抹除設計zh_TW
dc.titleEnabling Sub-block Erase with Software Isolation for 3D Flash Memoryen
dc.typeThesis
dc.date.schoolyear103-2
dc.description.degree碩士
dc.contributor.coadvisor張原豪(Yuan-Hoa Chang)
dc.contributor.oralexamcommittee楊佳玲,王成淵,張哲維
dc.subject.keyword三維快閃記憶體,部分區塊抹除,空間回收,回收效益,軟體隔離層,平均區塊抹除,儲存系統,效能,耐用度,zh_TW
dc.subject.keyword3D flash memory,Sub-block erase,Garbage collection,Recycle benefit,Software isolation,Wear leveling,Storage system,Reliability,Performance,en
dc.relation.page30
dc.rights.note有償授權
dc.date.accepted2015-07-13
dc.contributor.author-college電機資訊學院zh_TW
dc.contributor.author-dept資訊工程學研究所zh_TW
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