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完整後設資料紀錄
DC 欄位 | 值 | 語言 |
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dc.contributor.advisor | 陳亮嘉(Liang-Chia Chen) | |
dc.contributor.author | Chung-An Hsieh | en |
dc.contributor.author | 謝仲安 | zh_TW |
dc.date.accessioned | 2021-05-15T17:50:42Z | - |
dc.date.available | 2019-09-05 | |
dc.date.available | 2021-05-15T17:50:42Z | - |
dc.date.copyright | 2014-09-05 | |
dc.date.issued | 2014 | |
dc.date.submitted | 2014-08-18 | |
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dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/4978 | - |
dc.description.abstract | 三維形貌量測在自動光學檢測上有著不可取代的地位,而三角量測法則在是最常被使用的量測方法,不管是相移術或是灰階編碼法都是利用三角量測法之原理進行量測,以往在相移術有著相位模糊的問題,故相移術所能量測的物件有所限制,當相位模糊產生時,量測的結果有極大的誤差產生;而利用雷射光斑的數位影像辨識法在量測時會有解析度較差、量測結果的邊界容易產生錯誤的問題存在;而量測解析度與量測範圍的提升一直都是相當重要的課題,為了提升量測範圍與解析度,本研究利用一個新的量測方法,結合雷射光斑與條紋結構光投影與待測物之上,利用數位影像辨識法使用雷射光斑計算絕對相位而條紋結構光利用相移術計算相對相位,藉由此方法可以將絕對與相對相位進行結合,利用此方法可以有數位影像辨識的大範圍而有較高的解析度與精度,藉由實驗驗證,此方法可達到深度解析10μm且量測範圍達到100mm,是以往相移術較難達成的量測能力。 | zh_TW |
dc.description.abstract | Three-dimensional profilometry is an indispensable surface profile measuring technology for ensuring the quality of manufacturing process in the modern manufacturing industry, especially for automated optical inspection (AOI). Triangulation-based three-dimensional profilometry most frequently employed nowadays includes phase-shifting, gray-code and speckle-projecting profilometry. Theoretically, the measuring depth is traded off with the measuring resolution as a physical limit for 3-D optical detection. To address this measuring barrier, this article presents a new optical measuring method for one-shot three-dimensional profilometry, in which random speckles and structured fringes are simultaneously projected onto tested objects for forming a pair of deformed speckle and fringe images to be acquired concurrently. The speckle image is utilized to determine an absolute phase of each position using digital image correlation (DIC) while the fringe image is employed to determine a relative phase by using phase shifting profilometry (PSP). Each pair of absolute and relative phases corresponding to each measured position is respectively converted into an absolute and a relative depth. As a result, depth information of each position on the surface of the object is then reconstructed by synthesizing the corresponding absolute depth and the relative depth. With this, full-field surface profilometry with high measuring accuracy and large range of surface depth can be realized. Verified by some measuring experiments, the developed method can achieve a measuring depth resolution of 10 | en |
dc.description.provenance | Made available in DSpace on 2021-05-15T17:50:42Z (GMT). No. of bitstreams: 1 ntu-103-R01522732-1.pdf: 3788866 bytes, checksum: c9155445aa4f72e2a044ba5ab5c72952 (MD5) Previous issue date: 2014 | en |
dc.description.tableofcontents | 誌謝 i
中文摘要 ii ABSTRACT iii 目錄 iv 圖目錄 vii 表目錄 x Chapter 1 緒論 1 1.1 研究背景 1 1.2 研究動機與目的 2 1.3 研究目標 3 1.4 論文架構 3 Chapter 2 文獻回顧 5 2.1 相移法 5 2.1.1 相移法原理 5 2.1.2 相移法文獻 6 2.2 傅立葉轉換輪廓術 9 2.2.1 傅立葉輪廓術 9 2.2.2 傅立葉輪廓術文獻 10 2.3 光斑數位影像辨識量測法 13 2.3.1 光斑數位影像辨識量測法原理 13 2.3.2 光斑數位影像辨識量測法文獻 13 2.4 解決階高限制之量測法 16 2.4.1 解決相位模糊之量測法文獻 16 2.5 相位轉換高度校正 19 2.5.1 相位與高度轉換之文獻 19 2.6 文獻分析與總結 21 Chapter 3 系統量測原理與技術 25 3.1 研究原理之介紹 25 3.2 研究方法原理 25 3.2.1 三維表面輪廓量測原理 25 3.2.2 光斑法量測原理 27 3.2.3 傅立葉輪廓術原理 28 3.2.4 相移術原理 30 3.2.5 相位重建理論 30 3.2.6 三維資訊高度補償原理 32 3.2.7 條紋頻率校正 33 3.2.8 相機校正理論 34 Chapter 4 系統架構與演算法 39 4.1 量測系統之光學設計 39 4.2 硬體架構 41 4.2.1 影像擷取規格 41 4.2.2 近紅外線雷射二極體光源 43 4.2.3 近紅外線LED光源 43 4.2.4 位移平台規格 43 4.2.5 光學元件規格表 44 4.3 研究之演算法流程 46 4.4 演算法之驗證 47 4.5 MTF 分析 50 4.6 CCD視野校正 50 4.7 邊緣及缺失補正演算法 51 4.8 系統驗證量測標準件設計 53 Chapter 5 實驗結果與討論 56 5.1 系統重複度量測及精度分析 56 5.1.1 ISO 5436-1:2000 56 5.1.2 重複量測 57 5.1.3 自行設計之標準件量測驗證 58 5.2 量測結果 61 5.2.1 半球型物件 61 5.2.2 鎚子頭模型量測 62 5.2.3 玩偶量測 64 5.2.4 水五金量測 65 5.3 結果討論 66 Chapter 6 結論與未來展望 68 6.1 結論 68 6.2 未來展望 69 REFERENCE 70 | |
dc.language.iso | zh-TW | |
dc.title | 光斑與結構光複合式三維形貌量測研究 | zh_TW |
dc.title | Research on 3-D Surface Measurement using Synthesis of Speckle and Structured Fringe Composite Patterns | en |
dc.type | Thesis | |
dc.date.schoolyear | 102-2 | |
dc.description.degree | 碩士 | |
dc.contributor.oralexamcommittee | 范光照(Kuang-Chao Fan),林世聰(Shyh-Tsong Lin),林柏廷(Po-Ting Lin) | |
dc.subject.keyword | 自動光學檢測,三維形貌量測,相移術,相位模糊,階高限制,複合圖案, | zh_TW |
dc.subject.keyword | Automated optical inspection (AOI),three-dimensional profilometry,digital image correlation (DIC),Phase shifting profilometry, | en |
dc.relation.page | 71 | |
dc.rights.note | 同意授權(全球公開) | |
dc.date.accepted | 2014-08-19 | |
dc.contributor.author-college | 工學院 | zh_TW |
dc.contributor.author-dept | 機械工程學研究所 | zh_TW |
顯示於系所單位: | 機械工程學系 |
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