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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 范光照 | |
| dc.contributor.author | Chia-Wei Chen | en |
| dc.contributor.author | 陳家葦 | zh_TW |
| dc.date.accessioned | 2021-06-15T06:47:03Z | - |
| dc.date.available | 2016-07-06 | |
| dc.date.copyright | 2011-07-06 | |
| dc.date.issued | 2011 | |
| dc.date.submitted | 2011-06-14 | |
| dc.identifier.citation | 1. Taniguchi, N., Current Status in, and Future Trends of, Ultraprecision Machining and Ultrafine Materials Processing. CIRP Annals - Manufacturing Technology, 1983. 32(2): p. 573-582.
2. Hansen, H.N., et al., Dimensional micro and nano metrology. Cirp Annals-Manufacturing Technology, 2006. 55(2): p. 721-743. 3. Whitehouse, D.J., Comparison Between Stylus and Optical Methods for Measuring Surfaces. CIRP Annals - Manufacturing Technology, 1988. 37(2): p. 649-653. 4. Kim, S.-W., Y.-B. Choi, and J.-T. Oh, Reverse engineering: high speed digitization of free-form surfaces by phase-shifting grating projection moiré topography. International Journal of Machine Tools and Manufacture, 1999. 39(3): p. 389-401. 5. 張培恩, 以dlp發展光纖立體顯微量測系統之研究, in 機械工程學研究所. 2005, 臺灣大學. p. 119. 6. 林勤喻, 超精密雷射聚焦探頭之研製, in 機械工程學系研究所. 1993, 國立台灣大學. p. 100. 7. Quan, C., S.H. Wang, and C.J. Tay, Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry. Precision Engineering, 2006. 30(1): p. 23-31. 8. 黃順洋, 多波長共焦顯微鏡之探頭研製, in 機械工程學研究所. 2009, 臺灣大學. p. 70. 9. Cuche, E., P. Marquet, and C. Depeursinge, Spatial Filtering for Zero-Order and Twin-Image Elimination in Digital Off-Axis Holography. Appl. Opt., 2000. 39(23): p. 4070-4075. 10. 范光照, 張., 精密量測. 四版修訂 ed. 2005, 台北縣五股[鄉]: 高立. [14],527面. 11. Manske, E., et al., New applications of the nanopositioning and nanomeasuring machine by using advanced tactile and non-tactile probes. Measurement Science & Technology, 2007. 18(2): p. 520-527. 12. Ehret, G., et al., A new high-aperture 193 nm microscope for the traceable dimensional characterization of micro- and nanostructures. Measurement Science & Technology, 2009. 20(8): p. -. 13. Benschop, J. and G. van Rosmalen, Confocal compact scanning optical microscope based on compact disc technology. Appl. Opt., 1991. 30(10): p. 1179-1184. 14. Zhang, J.H. and L.L. Cai, An autofocusing measurement system with a piezoelectric translator. Ieee-Asme Transactions on Mechatronics, 1997. 2(3): p. 213-216. 15. 林威自, 超精密雷射自動聚焦探頭及系統之研製, in 機械工程學研究所. 1998, 國立臺灣大學. p. 125. 16. Quercioli, F., et al., Monitoring of an atomic force microscope cantilever with a compact disk pickup. Review of Scientific Instruments, 1999. 70(9): p. 3620-3624. 17. Chu, C.L., C.H. Lin, and K.C. Fan, Two-dimensional optical accelerometer based on commercial DVD pick-up head. Measurement Science & Technology, 2007. 18(1): p. 265-274. 18. Liu, Y.C., et al., Development of an optical accelerometer for low-frequency vibration using the voice coil on a DVD pickup head. Measurement Science & Technology, 2008. 19(8): p. -. 19. 李佶峰, 創新長行程雙雷射聚焦讀取頭光學尺系統之研製, in 機械工程系. 2006, 南台科技大學. p. 63. 20. 葉憲昌, 應用雙DVD讀取頭於透明基板厚度量測, in 光電與材料科技研究所. 2006, 國立虎尾科技大學. p. 71. 21. Chen, D., et al. System design for double-layer Blu-ray Disc recorders. 2005. Beijing, China: SPIE. 22. 林家佑, 具影像觀察功能之微奈米級三次元接觸式量測探頭分析與研製, in 機械工程學研究所. 2007, 臺灣大學. p. 147. 23. Cohen, D.K., et al., Automatic Focus Control - the Astigmatic Lens Approach. Applied Optics, 1984. 23(4): p. 565-570. 24. Mansuripur, M., Analysis of Astigmatic Focusing and Push-Pull Tracking Error Signals in Magnetooptical Disk Systems. Applied Optics, 1987. 26(18): p. 3981-3986. 25. Hnilicka, B., A. Voda, and H.J. Schroder, Modelling the characteristics of a photodetector in a DVD player. Sensors and Actuators a-Physical, 2005. 120(2): p. 494-506. 26. 周欣怡, 整合原子力顯微鏡式和光學式微小形變量測系統之設計開發與性能測試分析, in 機械工程學研究所. 2006, 臺灣大學. p. 108. 27. Hsu, W.Y., et al., Development of the fast astigmatic auto-focus microscope system. Measurement Science & Technology, 2009. 20(4): p. -. 28. Saleh, B.E.A. and M.C. Teich, Fundamentals of photonics. Wiley series in pure and applied optics. 1991, New York: Wiley. xviii, 966 p. 29. Fischer, R.E., et al., Optical system design. 2008, McGraw-Hill: New York, NY. p. xv, 809 p. 30. 李佰堃, 簡易型高對位公差之雷射繞射式光學尺之硏製 Development of simple configuration of laser diffraction encoder system with high alignment tolerance. 2007. 75面. 31. 劉奇惠, 以可程式邏輯運算晶片發展雷射光學尺訊號解析系統, in 機械工程學研究所. 2007, 臺灣大學. p. 77. 32. Ash, E.A. and G. Nicholls, Super-Resolution Aperture Scanning Microscope. Nature, 1972. 237(5357): p. 510-&. 33. Nyyssonen, D. and R.D. Larrabee, Submicrometer Linewidth Metrology in the Optical Microscope. Journal of Research of the National Bureau of Standards, 1987. 92(3): p. 187-204. 34. Topfer, S.C., et al. Model-based edge detection in height map images with nanometer resolution. 2004. Ottawa, Canada: SPIE. 35. Aghajan, H.K., C.D. Schaper, and T. Kailath. Pattern recognition algorithms for linewidth measurement. 1992. San Jose, CA, USA: SPIE. 36. Nyyssonen, D. and C.P. Kirk, Optical Microscope Imaging of Lines Patterned in Thick Layers with Variable Edge-Geometry - Theory. Journal of the Optical Society of America a-Optics Image Science and Vision, 1988. 5(8): p. 1270-1280. 37. 傅源興, 聚焦光點的近場光學研究, in 物理學研究所. 2002, 國立臺灣大學. p. 63. | |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/48135 | - |
| dc.description.abstract | 本研究發展出一套高精度的藍光雷射聚焦探頭系統,包括非接觸式探頭和精密定位平台。探頭部份以市售的藍光光碟機內之光學讀取頭為光路基礎,其聚焦之方式為像散法,利用聚焦曲線之線性區域與位置進行對應,來判斷待測物與讀寫頭之相對距離,此探頭系統具有22nm的準確度。
精密定位平台採用超音波馬達直接驅動平台,搭配高精度之雷射繞射式光學尺,50倍細分電路,此精密定位平台精度可達到60 nm。 | zh_TW |
| dc.description.abstract | In this research, a high-precision blue laser focus probe system was developed. The system includes non-contact measurement probe and precision positioning stage. The measurement probe is based on the optical pick-up head of blu-ray player. Because the focus principle of optical-pickup head is astigmatic method, the linear region of the focus range could correspond the position of workpiece and OPU. The precision positioning stage is actuated by the ultrasonic motor and with laser diffraction grating interferometer and the 50x interpolator circuit. The accuracy of blue laser focus probe is 22 nm and the accuracy of precision positioning stage is 60 nm. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-15T06:47:03Z (GMT). No. of bitstreams: 1 ntu-100-R97522716-1.pdf: 3972813 bytes, checksum: 73aba7d51fe31b01c36b7194ad765eb3 (MD5) Previous issue date: 2011 | en |
| dc.description.tableofcontents | 誌謝 i
中文摘要 ii Abstract iii 目錄 iv 圖目錄 vi 表目錄 x 第一章 緒論 1 1-1 研究動機 1 1-2 文獻回顧 2 1-3 研究方法與內容概要 10 第二章 光學讀取頭的感測原理與應用 12 2-1 光學讀取頭相關文獻回顧 12 2-2 光學讀取頭之結構與元件介紹 15 2-3 光學讀取頭量測原理和應用 22 第三章 藍光雷射聚焦探頭系統 36 3-1 藍光雷射聚焦探頭系統簡介 36 3-2 雷射聚焦探頭奈米定位系統簡介 40 3-3 雷射聚焦探頭性能測試 48 第四章 雷射聚焦探頭應用於邊緣觸發 54 4-1 邊緣量測相關文獻 54 4-2 雷射聚焦探頭於邊緣處發之理論推導 59 4-3 實驗結果 64 第五章 結論與未來展望 71 5-1 結論 71 5-2 未來展望 71 參考文獻 73 附錄A SIOS雷射干涉儀規格 77 附錄B SUNNYTEC PZT規格 79 附錄C NI-DAQ 6229規格 81 附錄D AISYS Camera U130C 82 附錄E NANOMOTION AB2 Driver 83 | |
| dc.language.iso | zh-TW | |
| dc.subject | 像散法 | zh_TW |
| dc.subject | 藍光光學讀取頭 | zh_TW |
| dc.subject | 雷射聚焦探頭 | zh_TW |
| dc.subject | 邊緣觸發 | zh_TW |
| dc.subject | Blue compatible optical head | en |
| dc.subject | Astigmatic method | en |
| dc.subject | Edge detection | en |
| dc.subject | Laser focus probe | en |
| dc.title | 藍光雷射聚焦探頭於邊緣觸發超解析度之研究 | zh_TW |
| dc.title | Research of Blue Laser Focus Probe on Super Resolution Edge Detection | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 99-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 覺文郁,朱志良 | |
| dc.subject.keyword | 藍光光學讀取頭,雷射聚焦探頭,邊緣觸發,像散法, | zh_TW |
| dc.subject.keyword | Blue compatible optical head,Laser focus probe,Edge detection,Astigmatic method, | en |
| dc.relation.page | 84 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2011-06-15 | |
| dc.contributor.author-college | 工學院 | zh_TW |
| dc.contributor.author-dept | 機械工程學研究所 | zh_TW |
| 顯示於系所單位: | 機械工程學系 | |
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