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完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.advisor | 吳文方 | |
dc.contributor.author | Peng-An Chan | en |
dc.contributor.author | 詹鵬安 | zh_TW |
dc.date.accessioned | 2021-06-15T03:57:50Z | - |
dc.date.available | 2010-06-08 | |
dc.date.copyright | 2010-06-08 | |
dc.date.issued | 2010 | |
dc.date.submitted | 2010-06-07 | |
dc.identifier.citation | 1. Ciaran J. B., Ronald D. P. and Duane E. L., “Temperature Dependent Fatigue Rates in Thin-Film Ferroelectric Capacitors,” Ferroelectrics, Vol. 151, pp.33-38, 1994.
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dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/44902 | - |
dc.description.abstract | 為因應產業競爭與技術發展,產品、尤其是電子產品或其組件的加速測試或增壓試驗有其重要性,透過此類測試,我們可獲得產品或組件的失效數據,再透過適當的物理分析模型,估算產品或組件在正常環境下的壽命與可靠度。以常見電子構件增壓測試為例,此物理分析模型稱作加速模型,該模型應用到「化學反應速率」的概念,但為簡化分析,通常假設該反應速率為不隨著時間變動的定值,其與事實並不盡相符,因此本研究沿用可靠度工程中非穩態失效率的觀念,將反應速率視為一隨失效率變化的非定值參數,並在適當的假設下,推導出具非穩態失效觀點的壽命估算公式,再將其應用於連接器加速測試所得數據的分析,期能評估連接器在正常環境下的壽命。分析結果顯示,此非穩態失效觀點的壽命分析模式確能降低評估結果的不確定性,並增進分析結果的可信度。 | zh_TW |
dc.description.abstract | Nowadays, due to the growing industrial competition and technological developments, accelerated tests and compressed-stress tests are essential to evaluate lives and reliabilities of electronic products. By using these tests, researchers can obtain data to evaluate through certain physical models the lifetimes and reliabilities of products and components when they are used in normal condition. Taking the compressed-stress test of electronic components for instance, a frequently used physical model is called the acceleration model. It adopts the concept of “reaction rate” originated from chemistry studies. To simplify the computational process, it is common to assume the reaction rate is a constant although the assumption may not be reasonable enough. To remedy it, a non-constant chemical reaction rate is proposed in the present study. The rate is considered a function of the non-steady-state failure rate used in reliability engineering and it thus becomes a function of time. Based on this concept, formulas are derived for us to evaluate a component’s lifetime when it is used in normal condition. The proposed method is then applied to the accelerated test result of a certain type of electronic connector in order to evaluate its lifetime when it is used in a normal condition. The result indicates the proposed method does reduce the uncertainty of evaluation and enhance reliability of the output. | en |
dc.description.provenance | Made available in DSpace on 2021-06-15T03:57:50Z (GMT). No. of bitstreams: 1 ntu-99-R98522507-1.pdf: 1224837 bytes, checksum: 2ab9cafbc9682b093af67d941ac51187 (MD5) Previous issue date: 2010 | en |
dc.description.tableofcontents | 誌謝 I
摘要 II Abstract III 目錄 IV 表目錄 VI 圖目錄 VIII 符號說明 X 第一章 緒論 1 1-1 研究背景 1 1-2 文獻回顧 2 1-3 研究流程 3 1-4 論文架構 3 第二章 非穩態失效反推方法推導 5 2-1 傳統反推方法 5 2-2 非穩態失效觀點反推方式 7 2-3 非穩態失效反推方法之假設 9 2-4 反應速率與失效速率特例關係 9 第三章 加速測試對象簡介 13 3-1 功能原理 13 3-2 失效準則 16 3-3 失效緣由 16 3-4 導致失效之環境變因 17 第四章 加速測試 24 4-1 測試目的 24 4-2 測試內容 24 4-2-1 樣本 24 4-2-2 設備 25 4-2-3 條件與流程 26 4-3 數據處理與篩選 26 第五章 數據分析與結果 33 5-1 分析流程與結構 33 5-2 傳統方式反推 33 5-3 失效率對反應速率影響性求取 35 5-4 考慮參數不確定性之影響 36 5-5 分析結果 36 5-5-1 僅非穩態失效觀點 37 5-5-2 考慮參數不確定非穩態處理 37 5-5-3 考慮較高自由度兩速率關係式非穩態處理 37 5-5-4 完整結果 38 第六章 結論與未來展望 65 6-1 結論 65 6-1-1 傳統反推成果 65 6-1-2 速率關係式之自由度 65 6-1-3 參數不確定性 66 6-1-4 整體成效 66 6-2 未來展望 66 參考文獻 68 | |
dc.language.iso | zh-TW | |
dc.title | 以加速測試評估電子構件壽命─揉合失效率與反應速率之非穩態分析模式 | zh_TW |
dc.title | Life Assessment of Electronic Components based on Acceleration Life Test and in Consideration of both Failure Rate and Reaction Rate | en |
dc.type | Thesis | |
dc.date.schoolyear | 98-2 | |
dc.description.degree | 碩士 | |
dc.contributor.oralexamcommittee | 許芳勳,胡沛華,徐堯 | |
dc.subject.keyword | 增壓測試,加速模型,反應速率,失效率,非穩態失效, | zh_TW |
dc.subject.keyword | compressed-stress test,acceleration model,reaction rate,failure rate,non-steady-state failure, | en |
dc.relation.page | 71 | |
dc.rights.note | 有償授權 | |
dc.date.accepted | 2010-06-07 | |
dc.contributor.author-college | 工學院 | zh_TW |
dc.contributor.author-dept | 機械工程學研究所 | zh_TW |
顯示於系所單位: | 機械工程學系 |
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