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| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 吳瑞北 | |
| dc.contributor.author | Chia-Hao Chang | en |
| dc.contributor.author | 張家豪 | zh_TW |
| dc.date.accessioned | 2021-06-15T02:22:05Z | - |
| dc.date.available | 2012-08-20 | |
| dc.date.copyright | 2009-08-20 | |
| dc.date.issued | 2009 | |
| dc.date.submitted | 2009-08-19 | |
| dc.identifier.citation | [1]. W. B. Weir, “Automatic measurement of complex dielectric constant and permeability at microwave frequencies,” Proc. IEEE, vol. 62 no. 1 pp. 33-36, Jan 1974.
[2]. R. K. Challa, D. Kajfez, J. R. Gladden and A. Z. Elsherbeni, “Permittivity measurement with a non-standard waveguide by using TRL calibration and fractional linear data fitting,” Progress In Electromagn. Research B, vol.2, pp.1-13, 2008. [3]. T. Chiu, “Dielectric constant measurement technique for a dielectric strip using a rectangular waveguide,” IEEE Trans. Instru. Meas., vol. 52, no. 5, Oct. 2003. [4]. C. H. Tseng and T. H. Chu, “Measurement of frequency-dependent equivalent width of substrate integrated waveguide,” IEEE Trans. Microwave Theory Tech., vol. 54, no.4, pp. 1431-1437, Apr. 2006. [5]. A. Namba, O. Wada, Y. Toyota, Y. Fukumoto, Z. L. Wang, R. Koga, T. Miyashita, and T. Watanabe, “A simple method for measuring the relative permittivity of printed circuit board materials,” IEEE Trans. Electromagn. Compat., vol. 43, no. 4, pp. 515-519, Nov. 2001. [6]. R. H. Vlelker, G.-T. Lei, G.-W. Pan, and B. K. Gilbert, “Determination of complex permittivity of low-loss dielectrics,” IEEE Trans. Microwave Theory Tech., vol. 45, no.10, pp. 1955-1960, Oct. 1997 [7]. J.-H. Liu, Y.-C. Lin, J.-T. Lue, and C.-J. Wu, “Resistivity measurements of layered metallic films at various microwave frequencies and temperatures using the micro-strip T-junction method,” Meas. Sci. Technol. 13, issue 7, pp.1132-1137, Apr. 2002. [8]. P. A. Bernard and J. M. Gautray, “Measurement of dielectric constant using a microstrip ring resonator,” IEEE Trans. Microwave Theory Tech., vol. 39, no. 3, pp. 592-595, Mar. 1991. [9]. K.Chang, “Microwave ring circuits and antennas,” John Wiley & Sons, Inc. United States of America, ISBN 0-47-13109-1, 1996. [10]. J.-M. Heinola, K.-P. Latti, P. Silventoinen, J.-P. Strom, M. Kettunen, “A new method to measure dielectric constant and dissipation factor of printed circuit board laminate material in function of temperature and frequency,” Proc. 9th Int. Symp. Adv. Packag. Material , pp. 235-240, 2004. [11]. A. Deutsch, G. V. Kopcsay, P. W. Coteus, C. W. Surovic, P. E. Dahlen, D. L. Heckmann, and D.-W. Duan, “Frequency dependent losses on high-performance interconnections,” IEEE Trans. Electromagn. Compat., vol. 43, no. 4, pp. 446-465, Nov. 2001. [12]. M. Q. Lee and S. Nam, “An accurate broadband measurement of substrate dielectric constant,” IEEE Microw. Guided Wave Lett., vol.6, no.4, pp.168-170, Apr. 1996. [13]. M. D. Janezic and J. A. Jargon, “Complex permittivity determination from propagation constant measurements,” IEEE Microw. Guided Wave Lett., vol. 9, no. 2, Feb. 1999. [14]. M. Cauwe and J. D. Baets, “Broadband material parameter characterization for practical high-speed interconnects on printed circuit board,” IEEE Trans. Adv. Packaging, vol. 31, no. 3, pp. 649-656, May 2008. [15]. W. J. Getsinger, “Microstrip dispersion model,” IEEE Trans. Microwave Theory Tech., vol. 21, no. 1, pp. 34-39, Jan. 1973. [16]. M.N.O. Sadiku, S.M. Musa, S.R. Nelatury, “Comparison of Dispersion Formulas for Microstrip lines,” 2004 IEEE SoutheastCon. Proc., pp. 378-382, Mar. 2004. [17]. G. F. Engen, and C. A. Hoer, “’Thru-Reflect-Line’: An improved technique for calibrating the dual six-port automatic network analyzer,“ IEEE Trans. Microwave Theory Tech. vol. 27, no. 12, pp. 987-993, Dec. 1979. [18]. “Specifying Calibration Standards for the Agilent 8510 Network Analyzer,” Agilent Product Note 8510-5B. [19]. R. B. Marks, “A multiline method of network analyzer calibration,” IEEE Trans. Microwave Theory Tech. vol. 39, no. 7, pp. 1205-1215, Jul. 1991. [20]. S. H. Hall, G. W. Hall, and J. A. McCall, High-Speed Digital System Design, New York: Wiley, 2000. [21]. B. Curran, I. Ndip, S. Guttovsky and H. Reichl, “Novel Multimodal High-Speed Structures Using Substrate Integrated Waveguideswith Shielding Walls in Thin Film Technology,” 2008 IEEE Electrical Design Adv. Packag. Sys. Symp., pp.206-209, Dec. 2008. [22]. H. Uchimura, T. Takenoshita and M. Fujii, “Development of a “laminated waveguide” IEEE Trans. Microwave Theory Tech, vol. 46, no. 12, pp.2438-2443, Dec. 1998. [23]. K. J. Boris, B. Kirk, M. Tsuk and D. Quint, “Simple and accurate determination of complex permittivity and skin effect of FR4 material in gigahertz region”, Proc. 53rd Electron. Comp. Technol. Conf., pp. 1277–1282, 2003. [24]. A. Deutsch, C. W. Surovic, R. S. Krabbenhoft, G. V. Kopcsay, and B. J. Chamberlin, “Prediction of losses caused by roughness of metallization in printed-circuit boards,” IEEE Trans. Adv. Packaging, vol. 30, no. 2, pp. 279-287, May 2007 | |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/43468 | - |
| dc.description.abstract | 本論文利用網路分析儀的TRL校準函數取得理想傳輸線散射參數，並透過解傳輸線傳輸矩陣特徵值的方式求得傳播常數，據此量測決定FR4 (環氧樹脂) 基板的介電常數及損耗。使用的傳輸線量測結構為一個具有接地連通柱屏障的帶線結構，可避免過去使用微帶線結構的輻射損耗與參數轉換中誤差的不確定性。另外並利用接地連通柱以克服平板共振對帶線產生的影響。藉由對帶線介質參數的研究，可擴展至多層板時所遇到不同板材壓合後之材質量測應用，並藉由對基板材質的了解，達到精確控制傳輸線特性阻抗之目的。文中會說明此架構設計上的考量，展示模擬與實驗結果，並與其他測量方法包括平板共振法與環形共振法所做的結果做對照比較。 | zh_TW |
| dc.description.abstract | This thesis aims to extract the dielectric constant and loss tangent of FR4 (epoxy resin) substrate. The network analyzer’s TRL calibration is used to measure scattering parameters of an ideal transmission line, thereby deriving the propagation constant by solving the transmission matrix eigenvalue. The transmission line is constructed as a stripline with surrounded ground via fence. It avoids radiation loss in microstrip lines of past approaches; also minimizes the uncontained error during conversion between effective and actual parameters. The ground via fence benefits in suppressing plate resonant effect. The exploration of the stripline material property can apply in characterization in multi-layer boards, and achieve accurate characteristic impedance. The design concerns are introduced and compared with plate resonance method, ring resonator method by showing simulation and experiment result. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-15T02:22:05Z (GMT). No. of bitstreams: 1 ntu-98-J96921033-1.pdf: 2526908 bytes, checksum: 3e96abc3344078430e28a717f64c1b4b (MD5) Previous issue date: 2009 | en |
| dc.description.tableofcontents | 致謝 i
中文摘要 iii ABSTRACT v 目 錄 vii 圖片目錄 ix 表格目錄 xiii 第一章 簡介 1 1.1 研究動機 1 1.2 文獻探討 3 1.3 研究貢獻 11 1.4 章節概要 11 第二章 介質參數萃取 13 2.1校準與測量 13 2.2求取傳播常數 16 2.3介質參數計算 19 2.4模擬結果 22 第三章 具接地連通柱屏障之帶線結構 35 3.1接地連通柱屏障設計 35 3.2金屬內電感效應 44 3.3介質損耗計算 53 3.4實驗結果 58 第四章 結論 65 參考文獻 67 | |
| dc.language.iso | zh-TW | |
| dc.subject | 傳輸線法 | zh_TW |
| dc.subject | 介電常數 | zh_TW |
| dc.subject | 損耗正切 | zh_TW |
| dc.subject | 帶線 | zh_TW |
| dc.subject | 介質參數萃取 | zh_TW |
| dc.subject | 短路連通柱屏障 | zh_TW |
| dc.subject | stripline | en |
| dc.subject | transmission line method | en |
| dc.subject | shorting via fence | en |
| dc.subject | dielectric parameter extraction | en |
| dc.subject | Dielectric constant | en |
| dc.subject | loss tangent | en |
| dc.title | 利用具有接地連通柱屏障之帶線進行寬頻材料特性萃取方法 | zh_TW |
| dc.title | A Wideband Material Characterization Method Using Stripline with Ground Via Fence | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 97-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 吳宗霖,鄭士康,洪子聖,洪志斌 | |
| dc.subject.keyword | 介電常數,損耗正切,帶線,介質參數萃取,短路連通柱屏障,傳輸線法, | zh_TW |
| dc.subject.keyword | Dielectric constant,loss tangent,stripline,dielectric parameter extraction,shorting via fence,transmission line method, | en |
| dc.relation.page | 69 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2009-08-19 | |
| dc.contributor.author-college | 電機資訊學院 | zh_TW |
| dc.contributor.author-dept | 電機工程學研究所 | zh_TW |
| 顯示於系所單位： | 電機工程學系 | |
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