程序監控於液晶顯示器上的瑕疵檢測 使用線掃描攝影機

Abstract

本論文的目的在於發展一個程序偵測的演算法來快速偵測運行於液晶顯示器瑕疵檢測系統上的程序是否有異常或者是不尋常忙碌的情況發生並且加以矯正。我們針對搭載線掃描相機的液晶顯示器瑕疵檢測系統來進行實作，因為目前的檢測系統包含許多電荷耦合裝置的相機並且藉由相機連結(Camera Link)傳輸到工業電腦進行後續處理，演算法本身必須簡單、快速以及低計算複雜度以符合即時運算的環境。另外一個重要議題是在程序狀態的決定上如何將我們所設計的準則使得錯誤判斷警示機率最小化。

In this thesis, we develop a process monitoring algorithm to detect whether the processes running on the LCD defect inspection system fail or are unusually busy and thereafter correct them. We aim to implement this method on the LCD (Liquid Crystal Display) defect inspection system with line-scan cameras. Because current LCD defect inspection systems comprise many CCD (Charge-Coupled Device) cameras and transferring image data to industrial computers with Camera Link for further processing, the algorithm must be simple, fast, and with low computational complexity to fit in with real-time environment. Another important issue in process status determination is how to minimize false alarm rate of the criteria we design.