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完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.advisor | 郭斯彥 | |
dc.contributor.author | Hung-Wen Chen | en |
dc.contributor.author | 陳宏文 | zh_TW |
dc.date.accessioned | 2021-06-13T16:48:41Z | - |
dc.date.available | 2006-07-15 | |
dc.date.copyright | 2005-07-15 | |
dc.date.issued | 2005 | |
dc.date.submitted | 2005-06-27 | |
dc.identifier.citation | [1] Shivakumar Chonnad, Balachander Needamangalam, “A Layered Approach to Behavioral Modeling of Bus Protocol”, IEEE 2003 page 170-173
[2] LoBue, M.T, “Surveying today's most popular storage interfaces” Computer Volume 35, Issue 12, Dec. 2002 Page(s):48 – 55 [3] M. El Shobaki, L. Lindh, “A hardware and software monitor for high-level system-on-chip verification” Quality Electronic Design, 2001 International Symposium on 26-28 March 2001 Page(s):56 – 61 [4] F. Sforza, L. Battu, M. Brunelli, A. Castelnuovo, M. Magnaghi,“A ‘design for verification’ methodology”, Quality Electronic Design, International Symposium on, pp. 50-55, 2001 [5] C-N Liu, I-Ling Chen, Jing-Yang. Jou, “An efficient design-for-verification technique for HDLs” Design Automation Conference, 2001, Asia and South Pacific 30 Jan.-2 Feb. 2001 Page(s):103 – 108 [6] Zhu. Yunshan, R. Prasad, “Compositional verification: an industrial case study” ASIC, 2003. Proceedings. 5th International Conference on Volume 1, 21-24 Oct. 2003 Page(s):282 - 285 Vol.1 [7] Adrain Evans, Allen Siburt, Gary Vrckovnik, Thane Brown, Mario Dufresne, Geoffery Hall, Tung Ho, Ying Liu, 'Functional Verification of Large ASICs' [8] Lukai Cai and Daniel Gajski, “Transaction level modeling: an overview”, Hardware/Software Codesign and System Synthesis, 2003 [9] Mohammed El Shobaki, Lennart Lindh, “A Hardware and softeare for High-Level System-on-chip Verification”, IEEE 2001 [10] Eugene Zhang and Einat Yogev, “Functional verification with completely self-checking tests”, IEEE International VerilogHDL Conference, April 1997, pp. 2-9 [11] Murail Kudlugi, Soha Hassoun, Charles Selvidgr, Duaine Pryor, “A Transaction-Based Unified Simulation/Emulation Architecture for Functional Verification”, DAC Las Vegas Nevada, USA 2001, June page 18-22 [12] Matthias Bauer, Wolfgang Ecker, “Hardware/Software Co-Simulation in a VHDL-based Test Bench Approach”, DAC 1997 [13] Kuang-Chien Chen, “Assertion-based verification for SoC designs”, ASIC, 2003.Proceedings. 5th International Conference on Volume 1, 21-24 Oct. 2003 Page(s):12 - 15 Vol.1 [14] 蘇有吉, “Integrating C and Verilog into a Simulation–Based Verification Environment for PCI-X 2.0 Bus” 2003 [15] 尤建智, “System Level Assertion-Based Verification Environment for PCI/PCI-X and PCI-Express” 2004 [16] 鍾智能, “Implementations of Bus Functional Model for the PCI Express System” 2004 [17] 黃鼎鈞, “A Functional Verification Environment for Advanced Switching Architecture” 2004 [18] PCI-SIG PCI-Express Base Specification 1.0a [19] PCI-SIG PCI Express Base Specification Revision 1.0a Errata [20] Serial ATA: High Speed Serialized AT Attachment Revision 1.0a [21] Serial ATA: High Speed Serialized AT Attachment Revision 1.0a Errata [22] AT Attachment with Packet Interface - 6 Specification [23] AT Attachment with Packet Interface - 6 Errata [24] PCI-Xactor for PCI-Express user guide version 1.1 Avery Design System 2004 [25] Serial ATA Web Site. http://www.serialata.org/ [26] Introduce of ATA history. http://www.scsiterminator.com/ | |
dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/38841 | - |
dc.description.abstract | 隨著單晶片系統的設計複雜度增高,驗證成為整個設計流程的瓶頸。現今的驗證還是依據硬體模擬。但當系統的複雜度增加,模擬時間的增高將使得模擬的效率大為降低;正確性是晶片設計者的主要目標,在特殊用途積體電路(ASIC)的設計中,功能性涵蓋率可以代表系統的正確性。如何有效減少模擬時間和增加系統的功能性涵蓋\率,成為今日積體電路設計和驗證工程師所面臨的最大難題。
為了解決上述的問題,本篇論文提出了一套SATA的匯流排功能性模組(BFM)。在行為層級方面,匯流排功能性模組制定的標準相同。藉著測試電路的行為模式,模擬時間可以被有效的控制。本文所設計的功能性模組皆是可以被控制多項參數,以及可程式化的。所以我們可應用這些模組來建構SATA的驗證環境。獨立的分層實現,簡明的設計介面和簡單的傳送/接收方法增加了這個模組的實用性。我們可以利用這個模組當成範本:藉著傳送封包給欲測試的模組,接收測試模組的回應封包來檢查欲測試模組的正確性。隨著測試檔案的增加,功能性涵蓋率可以簡單的被計算出來。論文最後提出了個驗證的環境,期望對於SATA晶片設計者,有更多的幫助。 | zh_TW |
dc.description.abstract | Due to the increasing complexity of modern SoC designs, verification has become one of the bottlenecks of the entire IC design process. Current verification strategy, based on traditional hardware simulation, is not able to fulfill designer’s need efficiently because of the escalating simulation time. Functional correctness is the most fundamental requirement for all hardware design. How to reduce the simulation time and increase the functional coverage are the primary issues that designers and researchers need to solve right away.
In this thesis I provide a set of Serial ATA (SATA) Bus Function Models (BFM), congruent to SATA specification. By testing design under verification (DUV) in the behavior level, simulation time can be reduced. The BFM are configurable and programmable. We could construct all topologies of the SATA system using the BFM. Clearly layered implementation, concisely programming interface and easily command sending and receiving methodologies make SATA BFM powerful in verifying a SATA DUV. SATA BFM can become a golden model, send packets to DUV, and receive packets from DUV to check if it’s functional correctly. With the self-checked test-cases provided, functional coverage increases significantly. Finally we will provide a SATA simulation environment using SATA BFM for designers to be a reference in chip or ip design. | en |
dc.description.provenance | Made available in DSpace on 2021-06-13T16:48:41Z (GMT). No. of bitstreams: 1 ntu-94-R92943091-1.pdf: 575567 bytes, checksum: 7f4c1c9bc54f784d337fb6c5c1c3012c (MD5) Previous issue date: 2005 | en |
dc.description.tableofcontents | CHAPTER 1. Introduction 19
1.1. Concept of Bus Functional Model 19 1.2. SATA Bus Functional Models 20 1.3. TestWizard Toolkit 21 1.4. Organization of this Thesis 22 CHAPTER 2. Overview of SATA System 23 2.1. General Overview 23 2.1.1. Parallel ATA Interface 23 2.1.2. Limitations of Parallel ATA 24 2.1.3. Serial ATA Interface 24 2.1.4. Benefits of Serial ATA 24 2.1.5. Connectivity difference between Parallel ATA and Serial ATA 25 2.2. Layered Functionality 27 2.2.1. Physical Layer 27 2.2.2. Link Layer 28 2.2.3. Transport Layer 31 2.2.4. Application Layer 37 2.3. Error Handling 39 CHAPTER 3. SATA BFM Architecture 41 3.1. Overview 41 3.1.1. Compare with PCI-Xactor Implementation 41 3.1.2. SATA BFM Architecture Overview 43 3.1.3. Basic Transmit/Receive data flow of SATA BFM 43 3.2. Layered Implementation 46 3.2.1. Physical Layer 46 3.2.2. Link Layer 49 3.2.3. Transport Layer 52 3.2.4. Application Layer 54 3.2.5. Shadow Register/Device Register 56 3.3. Device Programming Interface 59 3.3.1. Error Insertion 59 3.3.2. Checklist Item Coverage 62 CHAPTER 4. Enhancement of SATA BFM 65 4.1. SATA BFM with Link Monitor 65 4.2. Purposed SATA Verification Environment 68 CHAPTER 5. Conclusion and Future works 71 5.1. Conclusion 71 5.2. Future Works 72 Reference 73 | |
dc.language.iso | zh-TW | |
dc.title | Serial ATA 系統之匯流排功能性模組實作 | zh_TW |
dc.title | Implementations of Bus Functional Models for the Serial ATA System | en |
dc.type | Thesis | |
dc.date.schoolyear | 93-2 | |
dc.description.degree | 碩士 | |
dc.contributor.oralexamcommittee | 張耀文,黃俊郎,陳科宏,呂學坤 | |
dc.subject.keyword | 匯流排,驗證, | zh_TW |
dc.subject.keyword | Bus Functional Model,BFM,Serial ATA,Verification, | en |
dc.relation.page | 80 | |
dc.rights.note | 有償授權 | |
dc.date.accepted | 2005-06-27 | |
dc.contributor.author-college | 電機資訊學院 | zh_TW |
dc.contributor.author-dept | 電子工程學研究所 | zh_TW |
顯示於系所單位: | 電子工程學研究所 |
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