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http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/32444完整後設資料紀錄
| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 陳中平(Charlie Chung Ping Chen) | |
| dc.contributor.author | Chih-Yu Wang | en |
| dc.contributor.author | 王芝宇 | zh_TW |
| dc.date.accessioned | 2021-06-13T03:49:41Z | - |
| dc.date.available | 2006-07-27 | |
| dc.date.copyright | 2006-07-27 | |
| dc.date.issued | 2006 | |
| dc.date.submitted | 2006-07-25 | |
| dc.identifier.citation | [1] K. Nabors and J. White, “Fastcap: a multipole accelerated 3-d capacitance
extraction program,” IEEE Trans. on CAD, pp. 1447–1459, 1991. [2] W. Shi, J. Liu, N. Kakani, and T. Yu, “A fast hierarchical algorithm for 3-d capacitance extraction,” IEEE Trans. on CAD, pp. 330–336, 2002. [3] S. Yan, V. Sarin, andW. Shi, “Sparse transformations and preconditioners for hierarchical 3-d capacitance extraction with multiple dielectrics,” Proc. DAC, pp. 788–793, 2004. [4] R. Jiang, Y.-H. Chang, and C. C.-P. Chen, “Iccap: A linear time sparse transformation and reordering algorithm for 3d bem capacitance extraction,” Proc. DAC, pp. 163–166, 2005. [5] S. Kapur and D. E. Long, “Ies3: A fast integral equation solver for efficient 3-dimensional extraction,” Proc. ICCAD, pp. 448–455, 1997. [6] J. R. Phillips and J. White, “A precorrected fft method for capacitance extraction of complicated 3-d structures,” IEEE Trans. CAD, pp. 1059–1072, 1997. [7] M. Beattie and L. Pileggi, “Electromagnetic parasitic extraction via a multipole method with hierarchical refinement,” Proc. ICCAD, pp. 437–444, 1999. [8] B. Krauter, X. Yu, A. Dengi, and L. Pileggi, “A sparse image method for bem capacitance extraction,” Proc. DAC, pp. 357–362, June 1996. [9] T. Sometani, “Image method for a dielectric plate and a point charge,” IOP, 2000. [10] D. K. Cheng, Field and Wave Electromagnetics. Addison Wesley, 1989. [11] E. Weber, Electromagnetic Fields. John Wiley & Sons, 1950. [12] S. M. RAO, T. K. Sarkar, and R. F. Harrington, “The electrostatic field of conducting bodies in multiple dielectric media,” IEEE Trans. on MTT, vol. 32, pp. 1441–1448, 1984. [13] A. Balanis, Advanced Engineering Electromagnetics. JohnWiley & Sons, 1989. | |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/32444 | - |
| dc.description.abstract | The ever-increasing complexity of nano-scale ULSI design has made
parasitic capacitance extraction more and more challenging. Efficient and accurate capacitance calculation is needed urgently for delay evaluation especially for deep sub-micron designs. With the wide-spread application of multiple-layer interconnect structure, the BEM based discretization of dielectric-dielectric interfaces not only significantly increases the execution time and memory consumption, but also gives rise to instability and inaccuracy during the surface charge density calculation. In this thesis, we propose a fast multiple-dielectric capacitance extraction algorithm, MimCap, by integrating the truncated image method (TIM) into a hierarchical sparse capacitance extraction approach. The truncated image method approximates the dielectric-dielectric interface by a finite series of image charges and hence avoids the undesirable dielectric-dielectric interface process. Extensive experimental results demonstrate that MimCap is not only fast but also accurate. By preserving only the first 1~3 orders of image charges, MimCap exhibits over 100X speedup compared with FastCap while maintaining percentage error around 2%. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-13T03:49:41Z (GMT). No. of bitstreams: 1 ntu-95-R93943118-1.pdf: 1757481 bytes, checksum: 7c6021943c40d7ebb775708fd3b18fcf (MD5) Previous issue date: 2006 | en |
| dc.description.tableofcontents | 1 Introduction . . . . . . . . . . . . . . . . . .1
1.1 Motivation . .. . . . . . . . . . . . . . . . 1 1.2 Capacitance Extraction . . . . . . . . . . . 2 2 Capacitance Extraction . . . . . . . . . . . . .4 2.1 Background . . . . . . . . . . . . . . . . . 4 2.1.1 CapacitanceMatrix . . . . . . . . . . . . . 5 2.1.2 Potential CoefficientMatrix . . . . . . . . 6 2.1.3 Some Solving Algorithms . . . . . . . . . . 9 2.2 Multiple Dielectrics Condition . . . . .. . . 10 2.2.1 Potential in DielectricMedium . . . . . . . 10 2.2.2 Boundary Condition . . . . . . . . . . . . 11 2.2.3 Larger Linear System . . . . . . . . . . . 12 2.3 BasicMethod of Image . . . .. . . . . . . . . 13 2.3.1 Potential without Image Charge . . . . . . 13 2.3.2 Potential with Image Charge . . . . . . . . 14 3 Algorithms . . . . . . . . . . . . . . . . . . .16 3.1 Method Applied review . . . . . . .. . . . . 16 3.2 ImageMethod for Single Interface . . . . . . 17 3.2.1 Free Charge in Dielectric . . . . . . . . . 17 3.2.2 Electric Field Intensity at Interface . . . 19 3.2.3 Induced Polarization Charge at Interface .. 20 3.2.4 Image Charge . . . . . . . . . . .. . . . . 21 3.2.5 Potential Evaluation with Image Charge . .. 22 3.2.6 Perspective of Wave Propagation . . . . . . 23 3.3 ImageMethod forMultiple Interfaces . . . . .. 24 3.3.1 Infinite Series of Image Charges . . . . . 24 3.3.2 Geometry of Dielectrics . . . . . . . . . ..28 3.3.3 The First Order Image . . .. . . . . . . . .29 3.3.4 The Second Order Image . . . . . . . . . . .30 3.3.5 The High Order image . . . . . . . . . . . .32 3.3.6 Truncation of Image Charges . . . . . . . . 32 3.4 Integration with Implicit CongruenceMethod .. 33 3.4.1 Hierarchical Partitioning . . . . . . . ... 33 3.4.2 Panel Bases . . . . . .. . . .. . . . . . . 34 3.4.3 Exchange of Panel Bases . . .. . . . . . . .35 3.4.4 Modified Potential Coefficient with Image charges .. . . . . . . . . . . . . . .. . . . . . 35 4 Experimental Results . . . . . . . . . . . . .. 38 4.1 Environment . . . .. . . . . . . . . . . . .. 38 4.2 ImageMethod Testing . . . . . ... . . . . . . 39 4.2.1 Geometry of Test Case . . . . . . . . . . .39 4.2.2 Result of Test . . . . . . . . . . . . . . .39 4.3 Bus Cases Testing . . . . . . . . . . . . . .40 4.3.1 Bus Case Geometry . . . . . . . . . . . . .40 4.3.2 Result of Test . . . . . . . . . . . . . . .41 4.4 Timing andMemory Usage . . . . . . . . . . . .42 5 Conclusion . . . . .. . . . . . . . . . . . . . 46 | |
| dc.language.iso | en | |
| dc.subject | 多層介質 | zh_TW |
| dc.subject | 電容萃取 | zh_TW |
| dc.subject | capacitance extraction | en |
| dc.subject | multiple dielectrics | en |
| dc.subject | image method | en |
| dc.title | 快速多層介質電容萃取 | zh_TW |
| dc.title | Fast Multiple Dielectric Capacitance Extraction with Image Method | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 94-2 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 吳瑞北(Ruey-Beei Wu),張宏鈞(Hung-Chun Chang),林本堅(Burn-Jeng Lin) | |
| dc.subject.keyword | 電容萃取,多層介質, | zh_TW |
| dc.subject.keyword | capacitance extraction,multiple dielectrics,image method, | en |
| dc.relation.page | 47 | |
| dc.rights.note | 有償授權 | |
| dc.date.accepted | 2006-07-26 | |
| dc.contributor.author-college | 電機資訊學院 | zh_TW |
| dc.contributor.author-dept | 電子工程學研究所 | zh_TW |
| 顯示於系所單位： | 電子工程學研究所 | |
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| 檔案 | 大小 | 格式 | |
|---|---|---|---|
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