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  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 光電工程學研究所
Please use this identifier to cite or link to this item: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/29436
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???org.dspace.app.webui.jsptag.ItemTag.dcfield???ValueLanguage
dc.contributor.advisor黃建璋(JianJang Huang)
dc.contributor.authorYun-Wei Chengen
dc.contributor.author鄭允瑋zh_TW
dc.date.accessioned2021-06-13T01:07:01Z-
dc.date.available2012-07-26
dc.date.copyright2007-07-26
dc.date.issued2007
dc.date.submitted2007-07-20
dc.identifier.citation謝志豪,結合多孔之二氧化矽與氮化鎵發光二極體合成近白光之研究,國立台灣大學光電工程學研究所,2006
劉宇桓,發光二極體激發之氧氮化合物螢光粉合成與其特性研究,國立台灣大學化學研究所2006
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Jung-Tang Chu, Hung-Wen Huang, Chih-Chiang Kao, Wen-Deng Liang, Fang-I Lai, Chen-Fu Chu, Hao-Chung Kuo and Shing-Chung Wang, “Fabrication of large-area GaN-based light-emitting diodes on Cu substrate,” Japanese Journal of Applied Physics, vol. 44, no. 4B, pp. 2509-2511, Apr. 2005.
C. Huh, J. M. Lee, D. J. Kim, and S. J. Park, “Improvement in light-output efficiency of InGaN/GaN multiple-quantum well light-emitting diodes by current blocking layer,” Journal of Applied Physics, vol. 92, pp.2248-2250 (2002).
C. C. Liu, Y. H. Chen, M. P. Houng, Y. H. Wang, Y. K. Su, W. B. Chen, and S. M. Chen, “Improved Light-Output Power of GaN LEDs by Selective Region Activation,” IEEE Photonics Technology Letters, vol. 16, pp.1444-1446 (2004).
Hong Xiao, “Introduction to Semiconductor Manufacturing Technology”, international edition, 2001, Prentice Hall, p 263-271.
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E. Woelk, G. Strauch, D. Schmitz, M. Deschler, H. Juergensen, “III-nitride multiwafer MOCVD systems for blue-green LED material,” Materials Science & Engineering B: Solid-State Materials for Advanced Technology, v B44, no. 1-3, p 419-422, Feb. 1997.
Hong Xiao, “Introduction to Semiconductor Manufacturing Technology”, international edition, 2001, Prentice Hall, p 328-329.
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Chia-Sheng Chang, Shoou-Jinn Chang, Yan-Kuin Su, Yu-Zung Chiou, Yi-Chao Lin, Yu-Pin Hsu, Shih-Chang Shei, Hsin-Ming Lo, Jung-Chin Ke, Shih-Chih Chen and Chun-Hsing Liu, “InGaN/GaN light-emitting diodes with rapidly thermal-annealed Ni/ITO p-contacts,” Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, vol. 42, no. 6 A, p 3324-3327, June 2003.
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C. C. Liu, Y. H. Chen, M. P. Houng, Y. H. Wang, Y. K. Su, W. B. Chen, and S. M. Chen, “Improved Light-Output Power of GaN LEDs by Selective Region Activation,” IEEE Photonics Technology Letters, vol. 16, pp.1444-1446 (2004).
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dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/29436-
dc.description.abstract本研究中,我們使用離子佈植技術來製作電流導向結構。透過此電流導向結構來改變電流的流向,改善元件的電流擴散並降低電流群聚效應。藉由減少由量子井所放出的光被金屬電極所吸收或反射,我們可以提高光汲出效率以及光輸出的強度。離子佈植技術具有能夠改變材料摻雜濃度的特性,因此我們在傳統的製程步驟中加入一個佈植的程序,將欲製作電流導向結構之P型氮化鎵的材料區域有效摻雜濃度降低。因此其有效濃度將低於周遭區域而形成一個相對阻抗值較大的區域。再利用電流傾向於流經阻抗值較低的區域而強制提高金屬電極所覆蓋區域以外的電流密度。由實驗結果我們發現在20mA的輸入電流下,最高可以將光輸出功率提高達到30.3%。zh_TW
dc.description.abstractIn this research, we fabricate the current diverting structure by using ion implantation technology. With this structure, we can change the current flowing path to improve current spreading of the device and reduce current crowding effect. By reducing the light absorption and reflection by metal electrodes, we can increase the light extraction efficiency and light output power. Ion implantation technology has the property of changing the doping concentration of the material. Therefore we add a step of implantation in the conventional process steps to reduce the doping concentration of the p-type GaN where we want to fabricate the current diverting structure. By this, we have an area with lower concentration compared with the surrounding area and as a result, the higher resistance. As we know that the current tends to flow through a path with lower resistance, we can increase the current density of the area outside of the metal electrode. The experimental results show that at 20mA current injection, the maximum of output power enhancement is 30.3%.en
dc.description.provenanceMade available in DSpace on 2021-06-13T01:07:01Z (GMT). No. of bitstreams: 1
ntu-96-R94941023-1.pdf: 1738799 bytes, checksum: b09daee4e90cece69e79c8827815deac (MD5)
Previous issue date: 2007
en
dc.description.tableofcontents口試委員會審定書………………………………………………………………………I
誌謝……………………………………………………………………………………...II
中文摘要……………………………………………………………………………….III
英文摘要……………………………………………………………………………….IV
第一章 簡介……………………………………………………………………….......1
1-1 論文架構………………………………………………………………………1
1-2 白光發光二極體簡介…………………………………………………………2
1-3 氮化鎵之P型區域電流擴散簡介……………………………………………3
1-4 文獻探討………….………………………………………...…………………3
1-5 研究動機………………………………………………………………………4
參考文獻…………………………………………………………………………...9
第二章 離子佈植…………………………………………………………………….11
2-1 簡介…………………………………………………………..………………11
2-2 離子佈植的機制…………………………………………………………......11
2-2-1 阻滯機制………………………………………………………….......11
2-2-2 離子射程……………………………………………………………..12
2-2-3 通道效應……………………………………..………………………12
2-2-4 損壞與熱退火………………………………………………………..13
2-3 離子佈植的硬體……………………………………………………………..13
2-3-1 氣體系統…………………………………………..…………………14
2-3-2 真空系統……………………………………………………………..14
2-3-3 電機系統……………………………………………………………..14
2-3-4 控制系統……………………………………………………………..14
2-3-5 射束線系統………………………………………..…………………14
2-4 佈植參數的選擇……………………………………………………………..15
參考文獻………………………………………………………………………….20
第三章 發光二極體晶片製作……………………………………………………….21
3-1 簡介…………………………………………………………………………..21
3-2 儀器介紹……………………………………………………………………..21
3-2-1 有機金屬化學氣相沉積法…………………………………………...22
3-2-2 電感耦合電漿離子蝕刻機…………………………………………...22
3-2-3 電漿輔助化學氣相沉積系統………………………………………...22
3-2-4 離子佈植機…………………………………………………………...22
3-2-5 電子槍蒸鍍機………………………………………………………...23
3-2-6 濺鍍機………………………………………………………………...23
3-2-7 快速熱退火及爐管…………………………………………………...23
3-2-8 掃瞄式電子顯微鏡…………………………………………………...23
3-3 晶片結構……………………………………………………………………..24
3-4 晶片製作流程………………………………………………………………..24
參考文獻………………………………………………………………………….31
第四章 研究結果…………………………………………………………………….33
4-1 簡介…………………………………………………………………………..33
4-2 各樣品基本參數……………………………………………………………..34
4-3 實驗數據分析………………………………………………………………..35
4-3-1 樣品一實驗數據分析………………………………………………...35
4-3-2 樣品二實驗數據分析………………………………………………...36
4-3-3 樣品三實驗數據分析………………………………………………...37
4-3-4 樣品四實驗數據分析………………………………………………...37
4-4 實驗結果小結………………………………………………………………..38
參考文獻……………………………………………….........................................50
第五章 結論………………………………………………………………………….51
dc.language.isozh-TW
dc.subject電流擴散zh_TW
dc.subject選擇性高阻抗區zh_TW
dc.subject離子佈植zh_TW
dc.subject電流群聚效應zh_TW
dc.subject電流導向結構zh_TW
dc.subjectcurrent crowding effecten
dc.subjectcurrent spreadingen
dc.subjectselectively high resistance areaen
dc.subjectcurrent diverting structureen
dc.subjection implantationen
dc.title電流導向結構對氮化銦鎵�氮化鎵發光二極體發光效率改善之研究zh_TW
dc.titleImprovement of the Light Output Power of InGaN/GaN Based Light Emitting Diodes by Using Current Diverting Structureen
dc.typeThesis
dc.date.schoolyear95-2
dc.description.degree碩士
dc.contributor.oralexamcommittee楊志忠(Chih-Chung Yang),彭隆瀚(Lung-Han Peng)
dc.subject.keyword離子佈植,電流導向結構,選擇性高阻抗區,電流擴散,電流群聚效應,zh_TW
dc.subject.keywordion implantation,current diverting structure,selectively high resistance area,current spreading,current crowding effect,en
dc.relation.page52
dc.rights.note有償授權
dc.date.accepted2007-07-23
dc.contributor.author-college電機資訊學院zh_TW
dc.contributor.author-dept光電工程學研究所zh_TW
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