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完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.advisor | 李建模(Chien-Mo Li) | |
dc.contributor.author | Fang-Min Wang | en |
dc.contributor.author | 王方珉 | zh_TW |
dc.date.accessioned | 2021-06-12T18:04:46Z | - |
dc.date.available | 2008-01-24 | |
dc.date.copyright | 2008-01-24 | |
dc.date.issued | 2008 | |
dc.date.submitted | 2008-01-15 | |
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dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/27431 | - |
dc.description.abstract | 本論文提出一個以BCH碼為基礎之測試結果壓縮器並具有診斷功能之技術。一般而言,以BCH碼為基礎之壓縮器對於實作來說有些缺點。以時間壓縮為主的方法,其所需的額外面積是非常大的,以空間壓縮為主的方法,因為隨著可修正的個數增加,其壓縮率也降低。而我們提出使用,同時將時間與空間壓縮的方法,以達到減少資料量與面積。此外,我們使用虛擬布林函數最佳化相關軟體,來輔助診斷發生錯誤的掃描鍊與位置。最後,使用離散機率等方法,來計算分析診斷錯誤之機率,可以快速求得混疊機率大小。對於五十萬個掃描單元的設計中,當t=10的實驗結果顯示,其壓縮率大於2600倍,所需的面積比以時間壓縮為主之壓縮器少60%。 | zh_TW |
dc.description.abstract | This thesis presents a test response compaction and diagnosis technique based on BCH error correction code. Traditional time domain BCH compaction is not very useful in practice because the area overhead is too large. On the other hand, space domain BCH compaction does not have sufficient compression ratio to support multiple error diagnosis. This technique shares the polynomials among scan chains to reduce the area overhead. A Boolean satisfiability optimizer is employed to diagnose the failing flop-flops. In addition, a mathematical model is proposed to analytically estimate the aliasing probability and to aid the design of compaction circuitry. Simulation results show that, for designs of 500K flip-flops, our compression ratio is more than 2,600, which is much higher than that of space domain compaction. The area overhead is less than 60% of that of time domain BCH compaction. | en |
dc.description.provenance | Made available in DSpace on 2021-06-12T18:04:46Z (GMT). No. of bitstreams: 1 ntu-97-R94943153-1.pdf: 1084198 bytes, checksum: ed16a6ef6b6d46c4bed0ca54b0f62ee7 (MD5) Previous issue date: 2008 | en |
dc.description.tableofcontents | 摘要 i
Abstract ii 目錄 iii 列圖目錄 v 表目錄 vii 第一章 序論 1 1.1 論文背景與動機 1 1.2 技術與論文貢獻 3 3.3 論文組織 5 第二章 相關背景 6 2.1 相關研究 6 2.1.1 時間壓縮器(Time Compactors) 7 2.1.2 空間壓縮器(Space Compactors) 10 2.1.3 時間空間壓縮器(Time and Space Compactors) 12 2.1.4 其他相關研究 16 2.2 BCH碼相關背景 18 2.3 MINISAT+ 20 第三章 BCH碼之壓縮器架構及診斷 27 3.1 壓縮器架構 27 3.1.1 A1壓縮器硬體架構 27 3.1.2 A2壓縮器硬體架構 28 3.1.3 A3壓縮器硬體架構 29 3.2 壓縮器原理與壓縮率計算 30 3.2.1 壓縮器原理 30 3.2.2 A3壓縮器原理 32 3.2.3 壓縮率 34 3.3 診斷流程 35 3.3.1 目標函數 36 3.3.2 Signature分析 37 3.3.3 二進位等式與PB-constraint式子轉換 38 3.3.4 診斷範例 40 3.4 A1與A2壓縮器混疊率計算 46 3.4.1 整數分割 47 3.4.2 分割機率計算SP(d, e) 49 3.4.3 混疊率計算 50 第四章 實驗數據 55 4.1 壓縮率比較 55 4.2 額外面積 56 4.3 壓縮率與面積綜和比較 58 4.4 A1、A2混疊機率PDA比較 60 4.4.1 PDAE與MINISAT+求解的PDA比較 60 4.4.2 A1、A2混疊機率PDA分析 62 第五章 討論與未來工作計畫 67 5.1 解決未知的方法 67 5.2 MINISAT+求解時間 67 5.2.1 錯誤個數e與B值關係 67 5.2.2 A1、A2、A3 三種壓縮器時間比較 69 5.3 PDAE的計算 72 5.3.1 錯誤的分佈情形 72 5.3.2 經驗法則的判斷 72 第六章 結論 73 參考文獻 74 | |
dc.language.iso | zh-TW | |
dc.title | BCH碼之測試結果壓縮診斷技術 | zh_TW |
dc.title | Test Response Compaction and Diagnosis using BCH code | en |
dc.type | Thesis | |
dc.date.schoolyear | 96-1 | |
dc.description.degree | 碩士 | |
dc.contributor.oralexamcommittee | 饒建奇(Jiann-Chyi Rau),趙家佐(Chia-Tso Chao) | |
dc.subject.keyword | BCH碼,測試,壓縮,診斷, | zh_TW |
dc.subject.keyword | Test Response,Compaction,Diagnosis,BCH code, | en |
dc.relation.page | 78 | |
dc.rights.note | 有償授權 | |
dc.date.accepted | 2008-01-16 | |
dc.contributor.author-college | 電機資訊學院 | zh_TW |
dc.contributor.author-dept | 電子工程學研究所 | zh_TW |
顯示於系所單位: | 電子工程學研究所 |
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